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    • 1. 发明授权
    • Optical detector for echelle spectrometer
    • 光电探测器
    • US5596407A
    • 1997-01-21
    • US477169
    • 1995-06-07
    • Andrew T. ZanderCharles B. Cooper, IIIRing-Ling Chien
    • Andrew T. ZanderCharles B. Cooper, IIIRing-Ling Chien
    • G01J3/18G01J3/28G01J3/36
    • G01J3/2803
    • A solid-state detector for use in an atomic spectrometer comprises a plurality of arrays of sensing elements, or pixels, each of the arrays being positioned along and on the locations of spectral signals on a focal plane of an echelle grating spectrometer. The sensing elements are positioned along the many diffraction orders presented on a two-dimensional echelle grating focal plane so that at least one element is located at each and every resolution element regardless of global x-y coordinate positioning of the elements or with reference to each other. The result is a series of skewed lines of sensing elements, those lines being in the same shape as the series of diffraction order lines which comprise an echelle spectrum. The solid-state detector is particularly useful in an atomic spectrometer wherein an echelle grating is used to diffract incident radiation such that the various components of the radiation may be observed.
    • 用于原子光谱仪的固态检测器包括多个感测元件或像素阵列,每个阵列沿着光谱信号的位置定位在梯形光栅光谱仪的焦平面上。 感测元件沿着呈现在二维光栅焦平面上的许多衍射级定位,使得至少一个元件位于每个分辨率元素处,而不管元件的全局x-y坐标定位或彼此参考。 结果是传感元件的一系列偏斜线,那些线与包括梯形图的一系列衍射级线具有相同的形状。 固态检测器在原子光谱仪中特别有用,其中使用梯形光栅衍射入射辐射,使得可观察到辐射的各种成分。