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1. 发明申请

US20130305410A1 RHG1 MEDIATED RESISTANCE TO SOYBEAN CYST NEMATODE 审中-公开
标题翻译： RHG1对大豆CYST NEMATODE的耐药性
公开(公告)号：US20130305410A1
公开(公告)日：2013-11-14
申请号：US13843447
申请日：2013-03-15
申请人： Andrew Farmer Bent , Matthew Hudson , Brian Diers , Sara Melito , David Edward Cook , Teresa Hughes , Adam Bayless , Jianping Wang , Tong Geon Lee , Xiaoli Guo
发明人： Andrew Farmer Bent , Matthew Hudson , Brian Diers , Sara Melito , David Edward Cook , Teresa Hughes , Adam Bayless , Jianping Wang , Tong Geon Lee , Xiaoli Guo
IPC分类号： C12N15/82
CPC分类号： C12N15/8285 , A01H5/10 , C07K14/415 , Y02A40/164
摘要： Methods of increasing the resistance of plants, in particular soybeans, to nematodes, in particular soybean cyst nematodes, are provided herein. The methods include increasing the expression of Glyma18g02580, Glyma18g02590 and/or Glyma18g2610 in cells of a plant and in particular in root cells of a plant to increase the resistance of the plant and plant cells to nematodes. The methods include increasing the expression using constitutive promoters or by increasing the copy number of the polynucleotides. Constructs for expressing these polypeptides, transgenic cells, transgenic plants and methods of generating the same are also provided. Methods of screening plant cells for resistance or susceptibility to nematodes are also provided.
摘要翻译：本文提供了将植物，特别是大豆，特别是大豆孢囊线虫的抗性增加的方法。所述方法包括增加植物细胞中Glyma18g02580，Glyma18g02590和/或Glyma18g2610的表达，特别是在植物的根细胞中增加植物和植物细胞对线虫的抗性。所述方法包括使用组成型启动子增加表达或增加多核苷酸的拷贝数。还提供了用于表达这些多肽，转基因细胞，转基因植物和产生其的方法的构建体。还提供了筛选植物细胞对线虫抗性或易感性的方法。

2. 发明授权

US07960697B2 Electron beam apparatus 有权
标题翻译：电子束装置
公开(公告)号：US07960697B2
公开(公告)日：2011-06-14
申请号：US12257304
申请日：2008-10-23
申请人： Zhongwei Chen , Weiming Ren , Joe Wang , Xuedong Liu , Juying Dou , Fumin He , Feng Cao , Yan Ren , Xiaoli Guo , Wei He , Qingpo Xi
发明人： Zhongwei Chen , Weiming Ren , Joe Wang , Xuedong Liu , Juying Dou , Fumin He , Feng Cao , Yan Ren , Xiaoli Guo , Wei He , Qingpo Xi
IPC分类号： H01J49/44
CPC分类号： H01J37/073 , H01J37/244 , H01J37/28 , H01J2237/06341 , H01J2237/24592
摘要： The present invention relates to a charged particle beam apparatus which employs a scanning electron microscope for sample inspection and defect review.The present invent provides solution of improving imaging resolution by utilizing a field emission cathode tip with a large tip radius, applying a large accelerating voltage across ground potential between the cathode and anode, positioning the beam limit aperture before condenser lens, utilizing condenser lens excitation current to optimize image resolution, applying a high tube bias to shorten electron travel time, adopting and modifying SORIL objective lens to ameliorate aberration at large field of view and under electric drifting and reduce the urgency of water cooling objective lens while operating material analysis.The present invent provides solution of improving throughput by utilizing fast scanning ability of SORIL and providing a large voltage difference between sample and detectors.
摘要翻译：本发明涉及采用扫描电子显微镜进行样品检查和缺陷检查的带电粒子束装置。本发明提供了通过利用具有大的尖端半径的场致发射阴极尖端来提高成像分辨率的解决方案，在阴极和阳极之间的地电位上施加大的加速电压，将光束极限孔定位在聚光透镜之前，利用聚光透镜激发电流优化图像分辨率，应用高管偏压缩短电子行进时间，采用和修正SORIL物镜，以改善大视野和电漂移下的像差，并减少水冷物镜在操作材料分析时的紧迫性。本发明提供了通过利用SORIL的快速扫描能力并在样品和检测器之间提供大的电压差来提高产量的解决方案。

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