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    • 6. 发明授权
    • Techniques for reducing offsets in an analog to digital converter
    • 减少模数转换器偏移的技术
    • US09553599B1
    • 2017-01-24
    • US15017995
    • 2016-02-08
    • Analog Devices, Inc.
    • Baozhen ChenLalinda D. Fernando
    • H03M1/06H03M1/46H03M1/20H03M1/42
    • H03M1/1061H03M1/069H03M1/1033H03M1/14H03M1/468
    • In an example, a successive approximation register analog-to-digital converter includes a switched capacitor digital-to-analog converter (DAC) first array to sample an input signal and to convert a sample of the input signal to a digital value represented by a plurality of bits, the first array including a first group of capacitors representing at least some of the plurality of bits, a switched capacitor DAC second array including a second group of capacitors representing at least some of the plurality of bits, wherein at least one bit of the plurality of bits represented by the second group of capacitors is represented by at least two capacitors, and wherein each of the two capacitors is configured to be selectively connected to a selected one of at least two reference potentials such that the at least one bit represented by the second group of capacitors is switchable between at least three states.
    • 在一个示例中,逐次逼近寄存器模数转换器包括开关电容器数模转换器(DAC)第一阵列以对输入信号进行采样并将输入信号的采样转换为由 多个位,所述第一阵列包括表示所述多个位中的至少一些位的第一组电容器;开关电容器DAC第二阵列,包括表示所述多个位中的至少一些位的第二组电容器,其中至少一个位 由第二组电容器表示的多个位表示为至少两个电容器,并且其中两个电容器中的每一个被配置为选择性地连接到至少两个参考电位中的所选择的一个,使得至少一个位 由第二组电容器表示,可在至少三种状态之间切换。