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    • 2. 发明授权
    • Delay element calibration
    • 延迟元件校准
    • US07024324B2
    • 2006-04-04
    • US10856907
    • 2004-05-27
    • Michael C. RifaniKeng L. WongChristopher Pan
    • Michael C. RifaniKeng L. WongChristopher Pan
    • G06F19/00
    • G01R29/0273
    • A method for calibrating a delay element is described herein. In some embodiments, the method may include generating a clock signal with a clock edge, generating a reference signal with a reference edge using an adjustable delay line to delay the clock signal, and delaying a selected one of the clock signal and the reference signal through an array delay line having an array delay element with an array delay. In some embodiments, the method may further include adjusting the adjustable delay line to obtain a first adjustable delay so that the clock and reference edges are aligned on one side of the array delay element, adjusting the adjustable delay line to obtain a second adjustable delay so that the clock and reference edges are aligned on the other side of the array delay element, and ascertaining a delay difference between the first and the second adjustable delays to determine a value of the array delay provided by the array delay element. Other embodiments of the present invention may include, but are not limited to, apparatuses and systems adapted to facilitate practice of the above-described method.
    • 本文描述了用于校准延迟元件的方法。 在一些实施例中,该方法可以包括用时钟沿生成时钟信号,使用可调延迟线产生具有参考边沿的参考信号以延迟时钟信号,以及延迟选定的一个时钟信号和参考信号通过 具有阵列延迟的阵列延迟元件的阵列延迟线。 在一些实施例中,该方法还可以包括调整可调延迟线以获得第一可调延迟,使得时钟和参考边沿在阵列延迟元件的一侧对准,调节可调延迟线以获得第二可调延迟 时钟和参考边沿在阵列延迟元件的另一侧对准,并且确定第一和第二可调延迟之间的延迟差以确定由阵列延迟元件提供的阵列延迟的值。 本发明的其它实施例可以包括但不限于适于促进实施上述方法的装置和系统。