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1. 发明授权

US06995336B2 Method for forming nanoscale features 失效
公开(公告)号：US06995336B2
公开(公告)日：2006-02-07
申请号：US10765656
申请日：2004-01-26
申请人： Alan J. Hunt , Gerard Mourou , Ajit P. Joglekar , Edgar Meyhofer , John A. Nees , Greg Spooner
发明人： Alan J. Hunt , Gerard Mourou , Ajit P. Joglekar , Edgar Meyhofer , John A. Nees , Greg Spooner
IPC分类号： B23K26/36
CPC分类号： B23K26/06 , B23K26/0624 , B23K26/0665 , B23K26/073 , B23K26/361
摘要： Here is presented a versatile technique for machining of nanometer-scale features using tightly-focused ultrashort laser pulses. By the invention, the size of features can be reduced far below the wavelength of light, thus enabling nanomachining of a wide range of materials. The features may be extremely small (

2. 发明授权

US07560658B2 Method for forming nanoscale features 失效
标题翻译：形成纳米尺度特征的方法
公开(公告)号：US07560658B2
公开(公告)日：2009-07-14
申请号：US11167463
申请日：2005-06-27
申请人： Alan J. Hunt , Gerald Mourou , Ajit P. Joglekar , Edgar Meyhofer , John A. Nees , Greg Spooner
发明人： Alan J. Hunt , Gerald Mourou , Ajit P. Joglekar , Edgar Meyhofer , John A. Nees , Greg Spooner
IPC分类号： B23K26/16 , B23K26/40
CPC分类号： B23K26/06 , B23K26/0624 , B23K26/0665 , B23K26/073 , B23K26/361
摘要： Here is presented a versatile technique for machining of nanometer-scale features using tightly-focused ultrashort laser pulses. By the invention, the size of features can be reduced far below the wavelength of light, thus enabling nanomachining of a wide range of materials. The features may be extremely small (
摘要翻译：这里介绍了一种用于使用紧密聚焦的超短激光脉冲加工纳米级特征的多功能技术。通过本发明，特征的尺寸可以降低到远低于光的波长，从而使得能够对宽范围的材料进行纳米加工。特征可能非常小（<20nm），并且是高度可重复的。

3. 发明授权

US5442300A Ultrafast electrical scanning force microscope probe 失效
标题翻译：超快电扫描力显微镜探头
公开(公告)号：US5442300A
公开(公告)日：1995-08-15
申请号：US236525
申请日：1994-04-29
申请人： John A. Nees , Shin-ichi Wakana
发明人： John A. Nees , Shin-ichi Wakana
IPC分类号： G01R31/26 , G01N37/00 , G01Q20/02 , G01Q60/30 , G01R29/12 , G01R31/02 , G01R31/28 , G01R31/302 , G01R31/305
CPC分类号： G01Q20/02 , B82Y35/00 , G01Q60/30 , Y10S977/87
摘要： An ultrafast scanning probe with 2.5-picosecond response time and 10-nanometer spatial resolution. In one embodiment, a single probe tip is formed on an input electrode layer which is at least partially formed on a cantilever portion of the probe. The cantilever portion is formed by at least one layer including a film of AlGaAs which has a reflective top surface to reflect a laser beam therefrom. A photoresponsive planar switch is formed by a portion of the input electrode layer, a semiconductor portion of the at least one layer and a portion of an output electrode layer. In another embodiment, the switch is a non-planar photoresponsive switch. The single probe tip of the probe is utilized to both acquire an image of an electronic device and measure electrical signals of the device. An optical fiber may be used for support and to supply a pulsed switching beam to the photoresponsive switch.
摘要翻译：超快扫描探针，具有2.5微秒的响应时间和10纳米的空间分辨率。在一个实施例中，单个探针尖端形成在至少部分地形成在探针的悬臂部分上的输入电极层上。悬臂部分由至少一层包括具有反射顶表面以反射激光束的AlGaAs薄膜的层形成。光响应平面开关由输入电极层的一部分，至少一层的半导体部分和输出电极层的一部分形成。在另一个实施例中，开关是非平面光响应开关。探头的单个探针尖端用于获取电子设备的图像并测量设备的电信号。光纤可以用于支持并将脉冲切换光束提供给光响应开关。

4. 发明授权

US4928076A Ultrafast optical modulator 失效
标题翻译：超快光调制器
公开(公告)号：US4928076A
公开(公告)日：1990-05-22
申请号：US425457
申请日：1989-10-23
申请人： Gerard A. Mourou , John A. Nees , Steven L. Williamson
发明人： Gerard A. Mourou , John A. Nees , Steven L. Williamson
IPC分类号： G02F1/015 , G02F1/025 , G02F1/035
CPC分类号： G02F1/0356 , G02F1/025 , G02F2001/0154
摘要： An ultrafast traveling wave optical modulator capable of functioning at frequencies greater than 100 GHz having an optical waveguide parallel to a transmission line. The optical waveguide is in a substrate of electro-optic material (GaAs with GaAlAs layers forming the optical waveguide). The transmission line is a pair of coplanar electrodes on the substrate. A superstrate having an effective dielectric constant substantially equal to the square of the index of refraction of the substrate (a GaAs body in which the electric field on the line is substantially confined) eliminates the mismatch in velocity of propagation of the traveling electrical and optical signals thereby increasing the response time of the modulator so that it can function when the electrical modulating signal on the line exceeds 100 GHz in bandwidth.
摘要翻译：一种超快行波光调制器，其能够在大于100GHz的频率下起作用，其具有平行于传输线的光波导。光波导在电光材料的衬底（具有形成光波导的GaAlAs层的GaAs）中。传输线是衬底上的一对共面电极。具有基本上等于衬底的折射率的平方的有效介电常数的衬底（其中线路上的电场基本上被限制的GaAs体）消除了行进的电和光信号的传播速度的失配从而增加调制器的响应时间，使得当线路上的电调制信号在带宽上超过100GHz时，该响应时间可以起作用。

5. 发明授权

US5541947A Selectively triggered, high contrast laser 失效
标题翻译：选择性触发，高对比度激光
公开(公告)号：US5541947A
公开(公告)日：1996-07-30
申请号：US438395
申请日：1995-05-10
申请人： Geard A. Mourou , John A. Nees
发明人： Geard A. Mourou , John A. Nees
IPC分类号： G02F1/35 , H01S3/00 , H01S3/067 , H01S3/094 , H01S3/16 , H01S3/17 , H01S3/23 , H01S3/10
CPC分类号： H01S3/2375 , H01S3/0057 , H01S3/06754 , G02F1/3515 , H01S3/094061 , H01S3/094092 , H01S3/1616 , H01S3/173 , H01S3/2316 , H01S3/2383
摘要： The invention provides a method and apparatus for generating high pulse energy, short optical pulses having relatively high contrast. The system comprises a diode laser to seed a compact diode pumped amplifier, and comprises pulse shaping and cleaning elements to achieve relatively high energies and high contrast. The system is not locked to a fixed repetition rate as it is controlled by an electronic trigger. The system of the invention comprises a selectively triggered pulse source (asynchronous) which is coupled to pulse amplifying/pulse shaping means, which is coupled to pulse cleaning means, which is further coupled to a chirped pulse amplification (CPA) system. The method of the invention comprises the general steps of: (1) selectively triggering a pulse source; (2) amplifying the pulse and shaping it; (3) increasing contrast of the pulse utilizing a preferred, passive, nonlinear pulse cleaner; and (4) increasing the energy of the pulse and decreasing its pulse width by chirped pulse amplification (CPA) means. In the method of the invention, steps (2) and (3) may be repeated in order to achieve a desired energy intensity and contrast.
摘要翻译：本发明提供一种用于产生高脉冲能量的方法和装置，具有较高对比度的短光脉冲。该系统包括二极管激光器，用于种子紧凑二极管泵浦放大器，并且包括脉冲整形和清洁元件以实现相对高的能量和高对比度。该系统由电子触发器控制而不被锁定到固定的重复频率。本发明的系统包括耦合到脉冲清除装置的脉冲放大/脉冲整形装置的有选择地触发的脉冲源（异步），其进一步耦合到啁啾脉冲放大（CPA）系统。本发明的方法包括以下步骤：（1）有选择地触发脉冲源; （2）放大脉冲并成形; （3）使用优选的被动非线性脉冲清洁器增加脉冲的对比度; （4）通过啁啾脉冲放大（CPA）手段增加脉冲的能量和减小脉冲宽度。在本发明的方法中，可以重复步骤（2）和（3），以获得期望的能量强度和对比度。

6. 发明授权

US4745361A Electro-optic measurement (network analysis) system 失效
标题翻译：电光测量（网络分析）系统
公开(公告)号：US4745361A
公开(公告)日：1988-05-17
申请号：US21089
申请日：1987-03-03
申请人： John A. Nees , Gerard A. Mourou , Todd A. Jackson
发明人： John A. Nees , Gerard A. Mourou , Todd A. Jackson
IPC分类号： G01R31/26 , G01R19/00 , G01R23/17 , G01R27/28 , G01R27/00
CPC分类号： G01R23/17
摘要： A measurement system using electro-optic sampling and operative in the time domain characterizes devices over a bandwidth extending to upper microwave frequencies (e.g., 100 GHz). The device under test is mounted to or integrated on a substrate of electro-optic semiconductor material and is connected to transmisison and lines on the substrate. Sampling signals are electro-optically generated and propagate along the lines toward and away from the device under test, using a laser pulse beam incident on the substrate. The signals are electrically sampled by a laser pulse sampling beam which is responsive to the change in refractive index due to the signal at locations equidistant from the generation position. The waveform resulting from electro-optic sampling near the device under test corresponds to the sum of the signal incident upon the device and the signal reflected therefrom. The waveform resulting from electro-optic sampling at the location away from the device corresponds to the incident waveform. The waveforms are processed by subtracting the waveform corresponding to the incident signal from the waveform corresponding to the sum of the incident and reflected signal and Fourier transformed to derive the scattering parameters. The laser pulses are very short (in the picosecond or sub-picosecond range) and the transmission lines are uniform in their attenuation and dispersion characteristics, thereby enabling measurements to be made to extremely high microwave frequencies in the time domain and converted by Fourier transform to the frequency domain to determine the scattering parameters characterizing devices operative at such high frequencies.
摘要翻译：使用电光采样并且在时域中操作的测量系统通过延伸到上微波频率（例如，100GHz）的带宽来表征设备。被测器件被安装到或集成在电光半导体材料的衬底上，并连接到衬底上的透射和线路。使用入射到基板上的激光脉冲光，采样电信号被电光产生并沿着线路传播并且远离被测器件。这些信号由激光脉冲采样光束进行电采样，该激光脉冲采样光束由于在与发生位置等距的位置处的信号而响应于折射率的变化。由被测器件附近的电光采样产生的波形对应于入射到器件上的信号和从其反射的信号之和。在远离设备的位置进行电光采样产生的波形对应于入射波形。通过从与入射和反射信号的和相对应的波形中减去与入射信号相对应的波形来处理波形，并进行傅立叶变换以导出散射参数。激光脉冲非常短（在皮秒或亚皮秒范围内），并且传输线在其衰减和色散特性方面是均匀的，从而使得能够在时域中对极高的微波频率进行测量，并通过傅里叶变换转换为以确定表征在这样高频率下操作的装置的散射参数的频域。

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