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1. 发明申请

US20130077754A1 ANALYSIS METHOD FOR X-RAY DIFFRACTION MEASUREMENT DATA 有权
标题翻译： X射线衍射测量数据分析方法
公开(公告)号：US20130077754A1
公开(公告)日：2013-03-28
申请号：US13600740
申请日：2012-08-31
申请人： Akito SASAKI , Keiichi MORIKAWA , Akihiro HIMEDA , Hiroki YOSHIDA
发明人： Akito SASAKI , Keiichi MORIKAWA , Akihiro HIMEDA , Hiroki YOSHIDA
IPC分类号： G01N23/20
CPC分类号： G01N23/207 , G01J3/28 , G01N23/20
摘要： Peak positions and integrated intensities of diffraction X-ray are determined on the basis of X-ray diffraction measurement data output from an X-ray diffractometer, the number of determined peaks of the diffraction X-ray is counted, and analysis processing is started when the counted number of peaks reaches a preset peak number. The analysis processing is repetitively executed on the basis of X-ray diffraction measurement data. The peak positions and the integrated intensities of the diffraction X-ray are determined from the X-ray diffraction measurement data obtained from the start of the measurement till the analysis processing concerned, and qualitative analysis of collating the determined peak positions and integrated intensities with standard peak card data whose data base is made in advance and searching materials contained in a measurement sample, and quantitative analysis of determining the quantities of the materials contained in the measurement sample are executed.
摘要翻译：基于从X射线衍射仪输出的X射线衍射测定数据求出衍射X射线的峰值位置和积分强度，对衍射X射线的确定峰值的数量进行计数，开始分析处理计数的峰值达到预设的峰值。基于X射线衍射测量数据重复执行分析处理。衍射X射线的峰值位置和积分强度由从开始测量直到相关分析处理得到的X射线衍射测量数据确定，并且将所确定的峰值位置和积分强度与标准对照提前提供数据库的峰值卡数据和测量样本中包含的搜索材料，以及确定测量样本中包含的材料的量的定量分析。

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