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    • 1. 发明申请
    • PROBE CARD
    • 探针卡
    • US20130321019A1
    • 2013-12-05
    • US13783081
    • 2013-03-01
    • Akira OKADAHajime AKIYAMAKinya YAMASHITA
    • Akira OKADAHajime AKIYAMAKinya YAMASHITA
    • G01R1/073
    • G01R1/073G01R1/06716G01R1/06733G01R1/07342
    • It is an object of the present invention to provide a probe card capable of controlling generation of a scratch or an indentation in a connection pad and capable of controlling generation of heat in a connection pad and its vicinity having contacted a contact probe at low cost and in a simple way. A probe card includes a probe substrate, at least one contact probe electrically connected to a signal line provided to an insulating base of the probe substrate and fixed to the insulating base, and at least one engagement member installed on the contact probe at a position near a tip end portion of the contact probe. The engagement member has at least one engagement portion that makes abutting contact with another predetermined member during operation to restrain the operation of the contact probe.
    • 本发明的目的是提供一种探针卡,其能够控制在连接焊盘中产生划痕或凹陷,并能够以低成本接触接触探针的连接焊盘及其附近的热量产生, 以简单的方式。 探针卡包括探针基板,至少一个接触探针,电连接到提供到探针基板的绝缘基底并固定到绝缘基底的信号线,以及至少一个接合构件,安装在接触探针上的位置附近 接触探针的末端部分。 接合构件具有在操作期间与另一个预定构件邻接接触的至少一个接合部分,以限制接触探针的操作。