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1. 发明申请

US20120198292A1 TEST APPARATUS AND TEST METHOD 审中-公开
标题翻译：测试装置和测试方法
公开(公告)号：US20120198292A1
公开(公告)日：2012-08-02
申请号：US13365272
申请日：2012-02-03
申请人： Akimasa YUZURIHARA , Daisuke MAKITA , Tsuneaki KANAZAWA , Hidekazu NAKAI , Shinichiro YUKAWA , Daisuke SAKAMAKI , Toshihiko ARAI
发明人： Akimasa YUZURIHARA , Daisuke MAKITA , Tsuneaki KANAZAWA , Hidekazu NAKAI , Shinichiro YUKAWA , Daisuke SAKAMAKI , Toshihiko ARAI
IPC分类号： G11C29/00 , G06F11/26
CPC分类号： G11C29/56 , G11C2029/5602 , G11C2029/5606
摘要： Provided is a test apparatus that tests a memory under test, comprising a testing integrated circuit device that tests the memory under test and includes an internal memory storing test information including at least one of a test result and test data for a partial memory region of the memory under test; an external memory that stores the test information for an entire memory region of the memory under test; and a memory controller that is connected to the external memory and transmits test information for a memory region of a test target between the external memory and the internal memory. Also provided is a test method.
摘要翻译：提供了一种测试被测存储器的测试装置，包括测试被测存储器的测试集成电路装置，并且包括存储测试信息的内部存储器，该测试信息包括测试结果和测试数据中的至少一个，用于部分存储器区域测试记忆; 外部存储器，用于存储被测存储器的整个存储器区域的测试信息; 以及存储器控制器，其连接到所述外部存储器，并且在所述外部存储器和所述内部存储器之间传送测试对象的存储器区域的测试信息。还提供了一种测试方法。

2. 发明申请

US20120187973A1 TEST APPARATUS 有权
标题翻译：测试仪器
公开(公告)号：US20120187973A1
公开(公告)日：2012-07-26
申请号：US13355573
申请日：2012-01-23
申请人： Daisuke MAKITA , Mitsuru FUKUDA , Daisuke SAKAMAKI
发明人： Daisuke MAKITA , Mitsuru FUKUDA , Daisuke SAKAMAKI
IPC分类号： G01R31/00
CPC分类号： G01R31/2889 , G01R31/2886
摘要： An existing test head is made best use of and a capital investment is reduced. A test apparatus for testing a plurality of devices under test includes: a plurality of test heads for retaining therein at least one test board to test devices under test; a connecting section mounted on upper surfaces of the plurality of test heads and is independently fixed to each of the plurality of test heads; and a DUT board on which the plurality of devices under test are mounted, the DUT board being mounted to the connecting section, where the at least one test board is mountable and removable through a side surface of each of the plurality of test heads while the connecting section is mounted to the test head.
摘要翻译：现有的测试头是最好的使用，资本投资减少。用于测试多个待测器件的测试装置包括：多个测试头，用于在其中保持至少一个测试板以测试被测设备; 连接部，其安装在所述多个测试头的上表面上，并独立地固定到所述多个测试头中的每一个; 以及其上安装有所述多个被测设备的DUT板，所述DUT板被安装到所述连接部分，其中所述至少一个测试板可通过所述多个测试头中的每一个的侧表面安装和移除，同时连接部分安装在测试头上。

3. 发明申请

US20120280705A1 TEST HEAD, TEST BOARD AND TEST APPARATUS 有权
标题翻译：测试头，测试板和测试仪器
公开(公告)号：US20120280705A1
公开(公告)日：2012-11-08
申请号：US13368339
申请日：2012-02-08
申请人： Daisuke MAKITA , Mitsuru FUKUDA , Toru HONOBE
发明人： Daisuke MAKITA , Mitsuru FUKUDA , Toru HONOBE
IPC分类号： G01R31/00
CPC分类号： G01R31/2886 , H05K7/1409
摘要： A test board can be inserted to a test head and removed from the test head while the connecting section for mounting thereon devices under test is mounted on the upper portion of the test head. A test head for retaining therein at least one test board for testing devices under test, includes: a casing provided with, on one side surface thereof, an opening through which the at least one test board is inserted and removed, the casing retaining therein the at least one test board with an upper side thereof oriented towards an upper surface of the casing; and a mounting member that guides a lower side of the at least one test board through the opening to a pre-set position, imposes an upward force to the lower side of the at least one test board, thereby mounting the at least one test board to the casing.
摘要翻译：测试板可以插入测试头并从测试头移除，而用于安装其上的被测设备的连接部分安装在测试头的上部。用于在其中保持至少一个用于测试被测设备的测试板的测试头包括：在其一个侧表面上设置有一个开口，所述至少一个测试板通过该开口被插入和移除，所述壳体保持在其中至少一个测试板，其上侧朝向壳体的上表面定向; 以及安装构件，其将所述至少一个测试板的下侧通过所述开口引导到预定位置，向所述至少一个测试板的下侧施加向上的力，由此安装所述至少一个测试板到套管

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