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    • 7. 发明授权
    • Semiconductor memory device having a prolonged data holding time
    • 半导体存储器件具有延长的数据保持时间
    • US5426601A
    • 1995-06-20
    • US184933
    • 1994-01-24
    • Masashi AgataHironori AkamatsuHirohito KikukawaAkihiro SawadaShunichi Iwanari
    • Masashi AgataHironori AkamatsuHirohito KikukawaAkihiro SawadaShunichi Iwanari
    • G11C5/14
    • G11C5/147G11C5/143
    • An external power supply voltage V.sub.CC is applied to a peripheral circuit as a first internal power supply voltage V.sub.PERI. A power supply voltage control circuit outputs a voltage control signal V.sub.SIG of a high logic level if V.sub.CC is not greater than a low limit voltage V.sub.0L in a voltage range specified by VCC recommended operating conditions, otherwise it outputs V.sub.SIG of a low logic level. A power supply circuit applies a second internal power supply voltage V.sub.W and a third internal power supply voltage V.sub.WORD to a memory cell section. V.sub.W is equal to V.sub.PERI if V.sub.SIG is HIGH, while on the other hand V.sub.W is a voltage as a result of boosting V.sub.PERI. V.sub.WORD is a voltage as a result of boosting VW to a further extent. A row decoder sends out V.sub.W onto an enable signal line of a row of sense amplifiers, and V.sub.WORD onto a word line of a memory cell array so that V.sub.W becomes a high-logic-level data write voltage to a memory cell. This adequately prolongs the data-holding time with no sacrifice in memory cell voltage resistance.
    • 外部电源电压VCC作为第一内部电源电压VPERI施加到外围电路。 如果VCC在VCC推荐工作条件下规定的电压范围内VCC不大于下限电压V0L,则电源电压控制电路输出高逻辑电平的电压控制信号VSIG,否则输出低逻辑电平的VSIG。 电源电路将第二内部电源电压VW和第三内部电源电压VWORD施加到存储单元部分。 如果VSIG为高电平,则VW等于VPERI,而另一方面,VW是VPERI升压的电压。 VWORD是由于将VW进一步升高而产生的电压。 行解码器将VW发送到一行读出放大器的使能信号线上,并将VWORD发送到存储单元阵列的字线上,以使VW成为存储单元的高逻辑电平数据写入电压。 这样就可以在不牺牲存储单元耐压的情况下充分延长数据保持时间。
    • 8. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US5546346A
    • 1996-08-13
    • US354124
    • 1994-12-06
    • Masashi AgataKazuhiro MatsuyamaHironori AkamatsuHirohito KikukawaAkihiro SawadaShunichi Iwanari
    • Masashi AgataKazuhiro MatsuyamaHironori AkamatsuHirohito KikukawaAkihiro SawadaShunichi Iwanari
    • G11C11/409G11C7/10G11C11/407G11C7/00
    • G11C7/1072
    • In a synchronous DRAM required to be capable of performing high-speed consecutive operations in synchronism with a clock signal, a DBI-line pair is connected between a DQ-line pair and an RDB-line pair, and pipeline operation whose single cycle time is divided into four periods is employed. This S-DRAM has following: a first precharge circuit for precharging or voltage-equalizing the DQ-line pair to a power supply voltage level in the first and forth periods only; a second precharge circuit for voltage-equalizing the DBI-line pair to a ground voltage level in the first and second periods only; a third precharge circuit for voltage-equalizing the RDB-line pair to the power supply voltage level in the first and second periods only; first and second differential amplifiers for transmitting data on the DQ lines onto the DBI lines in the third period and for holding the data on the DBI lines in the fourth period; and a third differential amplifier which transmits the data on the DBI lines onto the RDB lines in the third period and which holds the data on the RDB lines in the fourth period.
    • 在需要与时钟信号同步执行高速连续操作的同步DRAM中,DBI线对连接在DQ线对和RDB线对之间,其流水线操作的单周期时间为 分为四个阶段。 该S-DRAM具有以下:第一预充电电路,用于仅在第一和第四周期中将DQ线对预充电或电压均衡至电源电压电平; 第二预充电电路,用于仅在第一和第二周期中将DBI线对对电压均衡至接地电压电平; 第三预充电电路,用于仅在第一和第二周期中将RDB线对对电压均衡至电源电压电平; 第一和第二差分放大器,用于在第三周期中将DQ线上的数据发送到DBI线上,并且用于在第四周期中将数据保存在DBI线上; 以及第三差分放大器,其在第三周期中将DBI线上的数据发送到RDB线上,并且在第四周期中将数据保存在RDB线上。
    • 9. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US5841727A
    • 1998-11-24
    • US867855
    • 1997-06-03
    • Shunichi IwanariHirohito Kikukawa
    • Shunichi IwanariHirohito Kikukawa
    • G11C11/408G11C8/12G11C11/401G11C11/406G11C8/00
    • G11C8/12G11C11/406
    • To restrain an increase in power consumption and a reduction in access speed, the following structure is adopted: An address is input to a row address input circuit and in correspondence with a row address output from the row address input circuit, a predecode signal is output from a row predecode circuit. An address is input to a block-select-signal generating circuit from which first and second block select signals are output for selecting either one of the first and second memory cell array blocks. First and second predecode-signal hold circuits provided in correspondence with the first and second memory cell array blocks hold predecode signals. First and second predecode signals held by the first and second predecode signal hold circuits are supplied to first and second row decode circuits, respectively, and the first and second predecode-signal hold circuits corresponding to the first and second block select signals update the contents being held.
    • 为了抑制功耗的增加和存取速度的降低,采用以下结构:将地址输入到行地址输入电路,并且与从行地址输入电路输出的行地址对应地输出预解码信号 来自一行预先解码电路。 地址被输入到块选择信号发生电路,从其输出第一和第二块选择信号以选择第一和第二存储单元阵列块中的任一个。 与第一和第二存储单元阵列块对应地设置的第一和第二预解码信号保持电路保持预解码信号。 由第一和第二预解码信号保持电路保持的第一和第二预解码信号分别被提供给第一和第二行解码电路,并且对应于第一和第二块选择信号的第一和第二预解码信号保持电路更新内容为 保持。