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    • 1. 发明授权
    • Method and apparatus for charged particle spectroscopy
    • 充电粒子光谱的方法和装置
    • US3783280A
    • 1974-01-01
    • US3783280D
    • 1972-03-21
    • ASS ELECT IND
    • WATSON J
    • H01J49/48H01J39/34
    • H01J49/482
    • In a cylindrical mirror analyzer, charged, particles from a source are deflected in the radial electric field between a pair of coaxial tubular electrodes, and are brought to a focus. A collector aperture positioned at the focus selects particles of predetermined energy, these particles being detected by a suitable detector. The particles cross the axis at some point between the source and the focus. An apertured member located at this point prevents skew electrons (i.e. electrons not travelling in radial planes) from reaching the focus. In this way the performance of the analyzer is improved.
    • 在圆柱形镜面分析仪中,来自源的带电粒子在一对同轴管状电极之间的径向电场中偏转,并被聚焦。 位于焦点处的收集器孔选择预定能量的颗粒,这些颗粒由合适的检测器检测。 颗粒在源和焦点之间的某个点处穿过轴。 位于该点的有孔构件防止偏斜电子(即,不在径向平面中行进的电子)到达焦点。 以这种方式,提高了分析仪的性能。