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    • 2. 发明专利
    • Lithographic apparatus and surface cleaning method
    • 平面设备和表面清洁方法
    • JP2011124569A
    • 2011-06-23
    • JP2010263517
    • 2010-11-26
    • Asml Netherlands Bvエーエスエムエル ネザーランズ ビー.ブイ.
    • KANEKO TAKESHIHOEKERD KORNELIS TIJMEN
    • H01L21/027
    • G03F7/70341G03F7/70925G03F7/7095G03F7/70975
    • PROBLEM TO BE SOLVED: To provide a method and apparatus for cleaning a contaminated surface of the lithographic apparatus. SOLUTION: The liquid confinement structure is equipped with at least of two openings 10 used for supplying a liquid to a gap below the structure and extracting it. Flow direction between openings can be switched. A supplying line for supplying the liquid to a gap outside the radial direction of openings adapted to two-layer flow and supplying the liquid to the liquid confinement structure, and an extracting line for extracting the liquid from the liquid confinement structure, have an inner surface having corrosion resistance against organic liquid. A corrosive cleaning liquid can be used for cleaning a photoresist contamination. COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:提供一种用于清洁光刻设备的污染表面的方法和设备。 解决方案:液体限制结构至少配备有用于将液体供给到结构下方的间隙的两个开口10并将其提取。 开关之间的流动方向可以切换。 一种用于将液体供应到适于两层流动的开口的径向外的间隙并将液体供应到液体限制结构的供应管线和用于从液体限制结构中提取液体的提取管线具有内表面 对有机液体具有耐腐蚀性。 腐蚀性清洁液可用于清洁光致抗蚀剂污染物。 版权所有(C)2011,JPO&INPIT