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    • 1. 发明专利
    • METHOD FOR DETECTING SURFACE FLAW OF GLASS
    • JPH04270948A
    • 1992-09-28
    • JP5613191
    • 1991-02-27
    • ASAHI GLASS CO LTD
    • YAMAUCHI HIDEOMATSUI ATSUSHI
    • G01N21/88G01N21/958
    • PURPOSE:To detect a flaw separately from other defect by judging that two cells are continuous when the interval between two cells whose defects are detected is preset length or less to perform continuation processing. CONSTITUTION:An inspection area is divided into arbitrary cells and, when the interval between two cells judged to have a defect is equal to or less than preset length, they are regarded to be continuous ones. For example, when the length of one side of a cell is set to 100mum and the interval between two cells having a minute flaw is 100mum or less, two cells are judged to be continuous to perform continuation processing and this flaw is detected as 100mum. When the interval between two cells having a flaw is 300mum or less, by the continuation processing of two cells, the flaw is detected as 700mum and the length of dust is detected as 200mum. When a defect longer than 200mum is preset as an inferior product and a defect of 200mum or less is preset as a good product, dust can be judged to be a good product and a flaw can be judged to be an inferior product.