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    • 6. 发明申请
    • CLOSED LOOP CONTROL BY MEASURING OPTICAL PROPERTIES
    • 通过测量光学特性的闭环控制
    • WO2015010713A1
    • 2015-01-29
    • PCT/EP2013/065411
    • 2013-07-22
    • APPLIED MATERIALS, INC.SCHNAPPENBERGER, FrankHELLMICH, Anke
    • SCHNAPPENBERGER, FrankHELLMICH, Anke
    • G05B19/042
    • G05B19/042
    • A method and an apparatus for processing a substrate, particularly for processing a large area substrate are described. The method for processing a large area substrate includes: transporting a large area substrate in a substantially vertically arranged state through a chamber arrangement of an apparatus for processing a large area substrate at a transportation speed; processing the large area substrate using a processing device of the apparatus for processing a large area substrate; monitoring at least one optical property of the substantially vertically arranged large area substrate using a measurement arrangement, wherein the substantially vertically arranged large area substrate is illuminated with diffuse light; and controlling at least one process parameter based on the monitored at least one optical property of the large area substrate.
    • 描述了用于处理衬底的方法和装置,特别是用于处理大面积衬底的方法和装置。 用于处理大面积基板的方法包括:通过用于以传输速度处理大面积基板的装置的室布置,大体上垂直排列的大面积基板传送; 使用用于处理大面积基板的装置的处理装置来处理大面积基板; 使用测量装置监测基本垂直布置的大面积基板的至少一个光学特性,其中基本垂直布置的大面积基板被漫射光照射; 以及基于所监测的所述大面积衬底的至少一个光学特性来控制至少一个工艺参数。
    • 8. 发明申请
    • APPARATUS AND METHOD FOR PROCESSING A LARGE AREA SUBSTRATE
    • 用于处理大面积基板的装置和方法
    • WO2015010714A1
    • 2015-01-29
    • PCT/EP2013/065412
    • 2013-07-22
    • APPLIED MATERIALS, INC.HELLMICH, AnkeSCHNAPPENBERGER, FrankSCHROEDER, Juergen
    • HELLMICH, AnkeSCHNAPPENBERGER, FrankSCHROEDER, Juergen
    • G01N21/47G01N21/896G01N21/958
    • G01N21/474G01N21/896G01N21/958
    • An apparatus (100) for processing a large area substrate (120) and a method for measuring at least one optical property of a substantially vertically arranged large area substrate is described. The apparatus for processing a large area substrate comprises: a chamber arrangement (110) for transporting the large area substrate there through in a vertically arranged state, wherein the chamber arrangement includes at least one chamber, a processing device for processing the vertically arranged large area substrate and an exit port (112) for the vertically arranged large area substrate; a transport system for transporting the substrate through the chamber arrangement; and a measuring arrangement (210) comprising an optical measuring device. The optical measuring device includes an illuminating device (211) for emitting diffuse light onto the vertically arranged large area substrate, and a light detecting device for measuring at least one optical property of the vertically arranged large area substrate.
    • 描述了一种用于处理大面积基板(120)的设备(100)和用于测量基本垂直布置的大面积基板的至少一个光学特性的方法。 用于处理大面积基板的装置包括:用于在垂直布置的状态下输送大面积基板的室配置(110),其中所述室装置包括至少一个室,用于处理垂直布置的大面积的处理装置 基板和用于垂直布置的大面积基板的出口(112); 用于通过所述室装置输送所述基板的输送系统; 和包括光学测量装置的测量装置(210)。 光学测量装置包括用于向垂直布置的大面积基板发射漫射光的照明装置(211),以及用于测量垂直布置的大面积基板的至少一个光学特性的光检测装置。
    • 10. 发明申请
    • SPUTTERING SYSTEM, ROTATABLE CYLINDRICAL TARGET ASSEMBLY, BACKING TUBE, TARGET ELEMENT AND COOLING SHIELD
    • 喷射系统,可旋转圆柱形目标组件,背管,目标元件和冷却屏蔽
    • WO2011006799A1
    • 2011-01-20
    • PCT/EP2010/059656
    • 2010-07-06
    • APPLIED MATERIALS, INC.SCHNAPPENBERGER, FrankWEBER, RolandKREMPEL-HESSE, JoergHELLMICH, Anke
    • SCHNAPPENBERGER, FrankWEBER, RolandKREMPEL-HESSE, JoergHELLMICH, Anke
    • H01J37/34
    • H01J37/342H01J37/3405H01J37/3435H01J37/3497
    • The application concerns a target backing tube for a rotatable cylindrical target assembly (120) comprising : a tube (122a) for at least one target element (126a) to be disposed there around, wherein the tube has an exterior surface adapted to face the at least one target element, wherein a portion of the exterior surface of the tube has a mean emissivity of 0.7 to 1, wherein the portion is at least 50% of the exterior surface of the tube. Further, the application concerns a cooling shield for a sputtering system comprising a rotatable target, the cooling shield has an interior surface adapted to face a target element of a sputtering system and an exterior surface; wherein a portion of the interior surface of the cooling shield has a mean emissivity of 0.7 to 1, wherein the portion is at least 50% of the interior surface of the cooling shield. Additionally, the application concerns a target element for a rotatable cylindrical target assembly of a sputtering system, wherein the target element an interior surface adapted to face a target backing tube onto which the target cylinder is adapted to be disposed and exterior surface, wherein a portion of the interior surface of the target element has a emissivity of 0.7 to 1, wherein the portion is at least 50% of the interior surface of the target element.
    • 该应用涉及用于可旋转圆柱形目标组件(120)的目标背衬管,包括:用于至少一个目标元件(126a)的管(122a),其布置在其周围,其中管具有适于面向 至少一个目标元件,其中所述管的外表面的一部分的平均发射率为0.7至1,其中所述部分是所述管的外表面的至少50%。 此外,该应用涉及包括可旋转靶的溅射系统的冷却屏蔽,冷却屏具有适于面对溅射系统的目标元件和外表面的内表面; 其中所述冷却罩的内表面的一部分的平均发射率为0.7-1,其中所述部分是所述冷却屏蔽的内表面的至少50%。 另外,该应用涉及一种用于溅射系统的可旋转圆柱形目标组件的目标元件,其中目标元件适于面向目标背衬管的内表面,目标圆柱体适于放置在其上并且外表面,其中一部分 目标元件的内表面的发射率为0.7比1,其中该部分是目标元件的内表面的至少50%。