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1. 发明申请

WO2022074047A1 MULTI-SPECTRAL OPTICAL SENSOR AND SYSTEM 审中-公开
公开(公告)号：WO2022074047A1
公开(公告)日：2022-04-14
申请号：PCT/EP2021/077534
申请日：2021-10-06
申请人： AMS SENSORS GERMANY GMBH
发明人： SIESS, Gunter , MANNHEIM, Volker , PLESS, Holger , KOMMA, Julius
IPC分类号： G01J3/02 , G01J1/42
摘要： A monolithic semiconductor chip defines a plurality of subarrays of optical detector regions, wherein each subarray of optical detector regions includes a corresponding plurality of optical detector regions and wherein each subarray of optical detector regions has the same relative spatial arrangement of optical detector regions as each of the other subarrays of optical detector regions. A multi-spectral optical sensor comprises the monolithic semiconductor chip, a plurality of optical filters, and a plurality of lens elements, wherein each optical filter is aligned between a corresponding lens element and a corresponding subarray of optical detector regions such that light which is incident on any one of the lens elements along a direction of incidence converges through the corresponding optical filter onto a corresponding one of the optical detector regions of the corresponding subarray of optical detector regions, which corresponding one of the optical detector regions depends on the direction of incidence. Such a multi-spectral optical sensor may be used to measure spectral information relating to different parts or sectors of a scene captured by an image sensor or a camera. A multi-spectral optical system and an image sensing system are also disclosed which comprise the multi-spectral optical sensor.

2. 发明申请

WO2020187838A1 METHOD AND APPARATUS FOR DETERMINING OR CLASSIFYING THE SURFACE COLOUR OF AT LEAST PARTLY TRANSLUCENT MATERIALS 审中-公开
公开(公告)号：WO2020187838A1
公开(公告)日：2020-09-24
申请号：PCT/EP2020/057119
申请日：2020-03-16
申请人： AMS SENSORS GERMANY GMBH
发明人： SIESS, Gunter , PLESS, Holger , MANNHEIM, Volker
IPC分类号： G01J3/02 , G01J3/10 , G01J3/28 , G01J3/42 , G01N21/25 , G01N21/47
摘要： An apparatus for determining a colour of a translucent material. The apparatus comprises a first light source (1) configured to illuminate a translucent material (8) at a first surface location, a second light source (2) configured to illuminate the translucent material at a second surface location spaced apart from said first surface location, and a light spectral sensor (3) configured to detect light at said first surface location. The apparatus is configured to operate the first and second light sources alternately., Apertures (4, 7) are arranged such that light detected by the light spectral sensor originating from said first source is principally light diffusely reflected from said first surface location under exclusion of specularly reflected light, and light detected by the detector originating from said second source is principally light scattered by scattering centres in the interior of the translucent material.

3. 发明申请

WO2021130155A1 INTEGRATED UV RADIATION SENSOR 审中-公开
公开(公告)号：WO2021130155A1
公开(公告)日：2021-07-01
申请号：PCT/EP2020/087414
申请日：2020-12-21
申请人： AMS SENSORS GERMANY GMBH
发明人： SIESS, Gunter , BUSS, Markus , KOMMA, Julius , PLESS, Holger , JAZAYERIFAR, Mahmoud , BLIEM, Peter , LECHNER, Franz , EILMSTEINER, Gerhard , ROGER, Frederic
IPC分类号： G01J1/04 , G01J1/42 , G02B5/20 , G01J1/0492 , G01J1/429 , G02B5/208
摘要： An integrated radiation sensor is disclosed. The integrated radiation sensor comprises a first optical filter associated with a first radiation-sensing element and a second optical filter associated with a second radiation-sensing element. The first optical filter is configured to pass radiation to the first radiation-sensing element with wavelengths within a UV-C range. The second optical filter is configured to pass radiation to the second radiation-sensing element with wavelengths longer than wavelengths within the UV-C range. Also disclosed is a method of manufacturing the integrated radiation sensor and methods of use of the integrated radiation sensor.

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