专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

WO2012006210A3 ANALYTE TEST STRIP AND ANALYTE METER DEVICE 审中-公开
标题翻译：分析测试条和分析仪器设备
公开(公告)号：WO2012006210A3
公开(公告)日：2014-03-20
申请号：PCT/US2011042572
申请日：2011-06-30
申请人： AGAMATRIX INC , IYENGAR SRIDHAR , HARDING IAN , BOITEAU CHARLES , BUTTERS COLIN
发明人： IYENGAR SRIDHAR , HARDING IAN , BOITEAU CHARLES , BUTTERS COLIN
IPC分类号： G01N21/25 , G01N27/327
CPC分类号： G01N27/327 , G01J1/42 , G01N21/255 , G01N21/7703 , G01N21/8483 , G01N27/3272 , G01N27/3273 , G01N33/48707 , G01N33/48771 , G01N2201/08
摘要： A test strip with an incorporated optical waveguide and deflectors punched through the optical waveguide allows light to exit through a layer of the test strip and be detected by a photo detector. Using light and a photodetector, these uniquely coded strips are identified. The waveguide can be constructed by sandwiching two layers of the test strip around a light transmissible layer. This configuration allows light to be transmitted through the test strip and out the other end, as well as allowing some light to escape the deflector. This light is detected by a photodetector mounted in the analyte test meter. The deflectors may be placed in patterns such that detection of this light indicates certain characteristics of the strip, such as non-counterfeit, regional identification, type of analyte tested, and coding information.
摘要翻译：具有结合的光波导的测试条和穿过光波导穿过的偏转器允许光通过测试条的层离开并由光电检测器检测。使用光和光电检测器，识别这些唯一编码的条带。波导可以通过将两条测试条夹在透光层周围来构造。这种配置允许光线通过测试条传输，并将光线从另一端传输，并允许一些光线从偏转器中逸出。该光被安装在分析物测试仪中的光检测器检测。偏转器可以被放置成图案，使得该光的检测指示条带的某些特性，例如非假冒，区域识别，被测试分析物的类型和编码信息。

2. 发明申请

WO2012037486A9 METHOD AND APPARATUS FOR ENCODING TEST STRIPS 审中-公开
标题翻译：用于编码测试条的方法和装置
公开(公告)号：WO2012037486A9
公开(公告)日：2012-08-30
申请号：PCT/US2011051983
申请日：2011-09-16
申请人： AGAMATRIX INC , IYENGAR SRIDHAR , BOITEAU CHARLES , FOREST MARTIN , BUTTERS COLIN
发明人： IYENGAR SRIDHAR , BOITEAU CHARLES , FOREST MARTIN , BUTTERS COLIN
IPC分类号： G01N27/327 , G01N33/487
CPC分类号： G01N27/3272 , A61B5/05 , A61B5/14 , A61B5/150022 , C12Q1/00 , G01N27/327 , G01N27/3273 , G01N33/48771
摘要： A test meter for receiving a test strip comprises: (a) a housing; (b) electronic circuitry disposed within the housing and (c) a strip port connector connected to the electronic circuitry and extending to an opening in the housing, said strip port connector connecting the electronic circuitry with a received test strip. The strip port connector contains a pair of top and bottom contacts, said top and bottom contacts having a proximal end and a distal end and a central contact portion, the top and bottom contacts of the pair are transversely aligned with one another; and the distal ends of the top and bottom contacts are separated or separable from one another by insertion of a test strip between the opposed contacts. The contacts and the meter are adapted to permit detection of faulty contacts and/or coding associated with an inserted test strip.
摘要翻译：用于接收测试条的测试仪包括：（a）壳体; （b）设置在壳体内的电子电路和（c）连接到电子电路并延伸到壳体中的开口的条形端口连接器，所述条形端口连接器将电子电路与接收的测试条连接。带状端口连接器包括一对顶部和底部触点，所述顶部和底部触点具有近端和远端以及中心接触部分，该对的顶部和底部触点彼此横向对准; 并且通过在相对的触点之间插入测试条，顶部和底部触点的远端彼此分离或分离。触点和仪表适于允许检测与插入的测试条相关联的故障触点和/或编码。

3. 发明申请

WO2009049015A9 IDENTIFICATION METHOD FOR ELECTROCHEMICAL TEST STRIPS 审中-公开
标题翻译：电化学试验片的鉴定方法
公开(公告)号：WO2009049015A9
公开(公告)日：2009-10-01
申请号：PCT/US2008079294
申请日：2008-10-09
申请人： AGAMATRIX INC , BOITEAU CHARLES , FOREST MARTIN , IYENGAR SRIDHAR , WEI BAOGUO
发明人： BOITEAU CHARLES , FOREST MARTIN , IYENGAR SRIDHAR , WEI BAOGUO
IPC分类号： G01N27/26 , C12M1/34 , C12Q1/00
CPC分类号： G01N27/307 , G01N33/48771
摘要： The present invention provides a method and apparatus for creating test strips that may be identified based on differences in electrical conduction or resistance between contact point on the test strip. This is achieved by creating a base test strip with contact points that may be connected to other contact points by an electrical connection. These base test strips may be modified to create a difference in electrical conductivity between contact points, or a contact point may be eliminated. This modification can be used to distinguish different types of test strips based on electrical signature. Additionally, the base test strip may be created such that multiple modifications are possible to distinguish numerous characteristics of test strips.
摘要翻译：本发明提供了一种用于产生测试条的方法和装置，所述测试条可以基于测试条上的接触点之间的电传导或电阻的差异来识别。这可以通过创建带有接触点的基座测试条来实现，该接触点可以通过电气连接与其他接触点连接。这些基础测试条可以被修改以产生接触点之间的电导率差异，或者可以消除接触点。此修改可用于根据电子签名来区分不同类型的测试条。另外，可以创建基础测试条，使得可以进行多种修改以区分测试条的许多特征。

4. 发明申请

WO2009049015A2 IDENTIFICATION METHOD FOR ELECTROCHEMICAL TEST STRIPS 审中-公开
标题翻译：电化学测试仪的识别方法
公开(公告)号：WO2009049015A2
公开(公告)日：2009-04-16
申请号：PCT/US2008079294
申请日：2008-10-09
申请人： AGAMATRIX INC , BOITEAU CHARLES , FOREST MARTIN , IYENGAR SRIDHAR , WEI BAOGUO
发明人： BOITEAU CHARLES , FOREST MARTIN , IYENGAR SRIDHAR , WEI BAOGUO
IPC分类号： G01N27/26 , C12M1/34 , C12Q1/00
CPC分类号： G01N27/307 , G01N33/48771
摘要： The present invention provides a method and apparatus for creating test strips that may be identified based on differences in electrical conduction or resistance between contact point on the test strip. This is achieved by creating a base test strip with contact points that may be connected to other contact points by an electrical connection. These base test strips may be modified to create a difference in electrical conductivity between contact points, or a contact point may be eliminated. This modification can be used to distinguish different types of test strips based on electrical signature. Additionally, the base test strip may be created such that multiple modifications are possible to distinguish numerous characteristics of test strips.
摘要翻译：本发明提供一种用于产生测试条的方法和装置，其可以基于测试条上的接触点之间的电导率或电阻的差异来识别。这通过创建具有可以通过电连接而连接到其它接触点的接触点的基底测试条来实现。这些基本测试条可以被修改以产生接触点之间的导电性差异，或者可以消除接触点。该修改可以用于基于电特征来区分不同类型的测试条。此外，可以创建基本测试条，使得可以进行多种修改来区分测试条的许多特征。

5. 发明专利

AU2011301843B2 Method and apparatus for encoding test strips 未知
公开(公告)号：AU2011301843B2
公开(公告)日：2015-02-05
申请号：AU2011301843
申请日：2011-09-16
申请人： AGAMATRIX INC
发明人： IYENGAR SRIDHAR , BOITEAU CHARLES , FOREST MARTIN , BUTTERS COLIN
IPC分类号： G01N27/327 , G01N33/487
摘要： A test meter for receiving a test strip comprises: (a) a housing; (b) electronic circuitry disposed within the housing and (c) a strip port connector connected to the electronic circuitry and extending to an opening in the housing, said strip port connector connecting the electronic circuitry with a received test strip. The strip port connector contains a pair of top and bottom contacts, said top and bottom contacts having a proximal end and a distal end and a central contact portion, the top and bottom contacts of the pair are transversely aligned with one another; and the distal ends of the top and bottom contacts are separated or separable from one another by insertion of a test strip between the opposed contacts. The contacts and the meter are adapted to permit detection of faulty contacts and/or coding associated with an inserted test strip.

6. 发明专利

AU2011276421A1 Analyte test strip and analyte meter device 未知
公开(公告)号：AU2011276421A1
公开(公告)日：2013-01-31
申请号：AU2011276421
申请日：2011-06-30
申请人： AGAMATRIX INC
发明人： IYENGAR SRIDHAR , HARDING IAN , BOITEAU CHARLES , BUTTERS COLIN
IPC分类号： G01N21/25
摘要： A test strip with an incorporated optical waveguide and deflectors punched through the optical waveguide allows light to exit through a layer of the test strip and be detected by a photo detector. Using light and a photodetector, these uniquely coded strips are identified. The waveguide can be constructed by sandwiching two layers of the test strip around a light transmissible layer. This configuration allows light to be transmitted through the test strip and out the other end, as well as allowing some light to escape the deflector. This light is detected by a photodetector mounted in the analyte test meter. The deflectors may be placed in patterns such that detection of this light indicates certain characteristics of the strip, such as non-counterfeit, regional identification, type of analyte tested, and coding information.

7. 发明专利

AU2014203520A1 ANALYTE TEST TRIP AND ANALYTE METER DEVICE 未知
公开(公告)号：AU2014203520A1
公开(公告)日：2014-07-17
申请号：AU2014203520
申请日：2014-06-27
申请人： AGAMATRIX INC
发明人： IYENGAR SRIDHAR , HARDING IAN , BOITEAU CHARLES , BUTTERS COLIN
IPC分类号： G01N21/25 , G01N27/327
摘要： Abstract A test strip with an incorporated optical waveguide and deflectors punched through the optical waveguide allows light to exit through a layer of the test strip and be detected by a photo detector. Using light and a photodetector, these uniquely coded strips are identified. The waveguide can be constructed by sandwiching two layers of the test strip around a light transmissible layer. This configuration allows light to be transmitted through the test strip and out the other end, as well as allowing some light to escape the deflector. This light is detected by a photodetector mounted in the analyte test meter. The deflectors may be placed in patterns such that detection of this light indicates certain characteristics of the strip, such as non-counterfeit, regional identification, type of analyte tested, and coding information. WO 2012/006210 PCTUUS2011/042572

8. 发明专利

AU2011276421B2 Analyte test strip and analyte meter device 未知
公开(公告)号：AU2011276421B2
公开(公告)日：2014-09-18
申请号：AU2011276421
申请日：2011-06-30
申请人： AGAMATRIX INC
发明人： IYENGAR SRIDHAR , HARDING IAN , BOITEAU CHARLES , BUTTERS COLIN
IPC分类号： G01N21/25 , G01N27/327
摘要： A test strip with an incorporated optical waveguide and deflectors punched through the optical waveguide allows light to exit through a layer of the test strip and be detected by a photo detector. Using light and a photodetector, these uniquely coded strips are identified. The waveguide can be constructed by sandwiching two layers of the test strip around a light transmissible layer. This configuration allows light to be transmitted through the test strip and out the other end, as well as allowing some light to escape the deflector. This light is detected by a photodetector mounted in the analyte test meter. The deflectors may be placed in patterns such that detection of this light indicates certain characteristics of the strip, such as non-counterfeit, regional identification, type of analyte tested, and coding information.

9. 发明专利

ES2851336T3 Método y aparato para codificar tiras de ensayo 未知
公开(公告)号：ES2851336T3
公开(公告)日：2021-09-06
申请号：ES11779891
申请日：2011-09-16
申请人： AGAMATRIX INC
发明人： IYENGAR SRIDHAR , BOITEAU CHARLES , FOREST MARTIN , BUTTERS COLIN
IPC分类号： G01N27/327 , A61B5/15 , G01N33/487
摘要： Un medidor de ensayo para recibir una tira de ensayo que comprende: (a) un alojamiento (11); (b) circuitería electrónica (15) dispuestos dentro del alojamiento, y (c) un conector (13) de puerto de tira conectado a la circuitería electrónica y que se extiende hasta una abertura en el alojamiento, dicho conector de puerto de tira conectando la circuitería electrónica con una tira de ensayo recibida, en el que el conector de puerto de tira contiene contactos superior e inferior que forman un par de contactos (20,20'; 30,30'; 40,40'; 50,50'), teniendo dichos contactos superior e inferior un extremo proximal (22,22' ; 32,32'; 42,42') y un extremo distal (23,23'; 33,33'; 43,43') y una parte de contacto central (24,24'; 34,34'; 44,44'; 54,54'), los contactos superior e inferior del par están alineados transversalmente entre sí, los extremos distales de los contactos superior e inferior son separables entre sí mediante la inserción de una tira de ensayo entre ellos, y en el que uno de los contactos superior o inferior está conectado a la circuitería electrónica para leer las marcas de codificación dispuestas en una superficie de una tira de ensayo, y el otro de los contactos superior o inferior está conectado a la circuitería electrónica para obtener información sobre las mediciones realizadas por el tira de ensayo en una muestra introducida en la tira de ensayo, caracterizado por que los contactos superior e inferior del par están solicitados de manera que las respectivas partes de contacto central están en contacto eléctrico entre sí cuando no se recibe una tira de ensayo en el medidor de ensayo, y la circuitería electrónica está configurada para ensayar el contacto eléctrico entre el par de contactos superior e inferior en uno o más momentos cuando no se inserta una tira de ensayo entre los contactos superior e inferior.

10. 发明专利

AU2013204866B2 Method and Apparatus for Encoding Test Strips 未知
公开(公告)号：AU2013204866B2
公开(公告)日：2015-09-03
申请号：AU2013204866
申请日：2013-04-12
申请人： AGAMATRIX INC
发明人： IYENGAR SRIDHAR , BOITEAU CHARLES , FOREST MARTIN , BUTTERS COLIN
IPC分类号： G01N27/327 , G01N33/487
摘要： A test meter for receiving a test strip comprising: a housing; electronic circuitry disposed within the housing; and a strip port connector connected to the electronic circuitry and extending to an opening in the housing, said strip port connector connecting the electronic circuitry with a received test strip. The strip port connector contains a pair of top and bottom contacts, said top and bottorn contacts having a proximal end and a distal end and a central contact portion, the top and bottom contacts of the pair are transversely aligned with one another; and the distal ends of the top and bottom contacts are separated or separable from one another by insertion of a test strip between the opposed contacts. The contacts and the meter are adapted to permit detection of faulty contacts and/or coding associated with an inserted test strip. S/il Replacement Sheet A-- N - 'NN, N, * N, ' A-N N, A- -, KNN )AN 7~4 pA - -A AA - A' - & \) WAjt >t ~~-* PA 7 nfl> / ~ 'N N, A' NN-, 'C -y -A- N N A- -N, -P A- A- Ak\N>~' A- 7' A -- A h A A ~ 2" -. A A' ~ .2) * 'Ny 2- -- '7.-- -- A N N.NN.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式