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1. 发明公开

KR20100097031A Test section unit, test head and electronic device testing apparatus 有权
标题翻译：测试单元，测试头和电子设备测试设备
公开(公告)号：KR20100097031A
公开(公告)日：2010-09-02
申请号：KR20100015542
申请日：2010-02-22
申请人： ADVANTEST CORP
发明人： MURAKAMI TORU , MINEO HIROYUKI , YOO JU HWAN
IPC分类号： G01R31/26 , G01R31/01
CPC分类号： G01R31/2886
摘要： PURPOSE: A test unit, a test head, and an apparatus for testing electronic components are provided to increase a circuit area by simplifying the mechanical structure of the apparatus. CONSTITUTION: An electronic component to be tested is mounted on a plurality of sockets(311). A performance board(301) functions as a main board. The sockets are installed on the performance board without a socket board. A sub-board, on which a peripheral circuit is mounted, is electrically connected to the performance board. The sub-board is installed opposite to the sockets.
摘要翻译：目的：提供测试单元，测试头和用于测试电子部件的设备，以通过简化设备的机械结构来增加电路面积。构成：待测试的电子部件安装在多个插座（311）上。执行板（301）作为主板。插座安装在没有插座板的性能板上。安装有外围电路的子板与性能板电连接。子板与插座相对安装。

2. 发明专利

JPH09218222A PROBE CARD 失效
公开(公告)号：JPH09218222A
公开(公告)日：1997-08-19
申请号：JP2246396
申请日：1996-02-08
申请人： ADVANTEST CORP
发明人： SEKINO TAKASHI , MURAKAMI TORU
IPC分类号： G01R1/073 , H01L21/66
摘要： PROBLEM TO BE SOLVED: To obtain a probe card exhibiting good transmission characteristics even at high frequency. SOLUTION: The probe card comprises probes 3a-3d, a printed wiring board 2, and an annular holding base 4. The holding base 4 is tapered, on the side for holding the probe, to recede from the printed wiring board 2 as approaching the inner circumference. An annular insulating protrusion 4b is formed in the vicinity of inner circumferential edge of the tapered surface 4a in order to support the probe. An earth plate 12 is formed on the tapered surface 4a. The probe 3a for high frequency signal has coaxial structure and the outer conductor 15 thereof is connected with the earth plate 12 through a conductive adhesive 16. The probe 3c for power supply and the probe 3d for ground are connected with the earth plate 12, respectively, through a microchip capacitor 21 and the conductive adhesive 16. Since the probes 3c, 3d are connected with the earth plate 12, effective length thereof is shortened and thereby the inductance thereof is decreased thus realizing a microstrip line structure.

3. 发明专利

JP2001358413A ELECTRIC CIRCUIT BOARD 失效
公开(公告)号：JP2001358413A
公开(公告)日：2001-12-26
申请号：JP2000176878
申请日：2000-06-13
申请人： ADVANTEST CORP
发明人： MURAKAMI TORU
IPC分类号： H05K1/02 , H05K3/46
摘要： PROBLEM TO BE SOLVED: To provide an electric circuit board wherein the amount of charges accumulated between a through hole and a signal line or a ground line can be reduced without increasing impedance of the signal line or the ground line. SOLUTION: In the electric circuit board 511, a wiring pattern layer 511a is laminated via an insulating layer 511b, and through holes 511c insulated from the wiring pattern layer 511a via the insulating layer 511b are arranged. An outer peripheral edge of the through hole 511c is circular, and an insulating layer outer peripheral edge 511a1 of the wiring pattern layer 511a is not circular. A part βsandwiched by the insulating layer outer peripheral edges 511a1 is formed with almost constant width D.

4. 发明专利

JPH09196970A PROBE CARD 失效
公开(公告)号：JPH09196970A
公开(公告)日：1997-07-31
申请号：JP1012696
申请日：1996-01-24
申请人： ADVANTEST CORP
发明人： MURAKAMI TORU , WATANABE FUMIO
IPC分类号： G01R1/073 , H01L21/66
摘要： PROBLEM TO BE SOLVED: To improve propagation characteristics of high frequency of a probe part. SOLUTION: The probe card consists of multiple probes 3, a ring-like printed wiring 2 and a ring-like holding stage 4, etc. The surface on the side of holding the probe of the holding stage 4 is a taper surface 4a crossing the printed wiring board 2, and it is formed so that an outside periphery 4a1 of the taper surface is almost in contact with the rear surface of the printed wiring board 2. On the taper surface 4a, with the probe 3 as an internal conductor, earth boards 12 and 14 are formed with a dielectric layer 13 in between on and under the internal conductor, thus, a probe part has a strip line structure. Alternately, a micro strip line structure omitting either one of the earth boards 12 and 14 may be employed.

5. 发明专利

JPH0864646A PROBE CARD 失效
公开(公告)号：JPH0864646A
公开(公告)日：1996-03-08
申请号：JP21811594
申请日：1994-08-19
申请人： ADVANTEST CORP
发明人： MURAKAMI TORU
IPC分类号： G01R31/26 , G01R1/073 , H01L21/66
摘要： PURPOSE: To reduce the cost of consumable goods, i.e., probe card, by employing such structure as the intrinsic structural part of a wafer to be measured is separated from the common structural part at the time of measuring various types of wafer having different number of pins or pitch. CONSTITUTION: A probe card 3 receives the electrical connection end of a test head 5 and interconnects the test head 5 and a probe pin assembly 10. The probe pin assembly 10 receives the electrical connection end of the probe card 3 and brings it into electrical contact with a wafer 6 to be measured from the forward end of the probe pin 1.

6. 发明专利

JP2010197389A Test section unit, test head, and electronic component testing device 有权
标题翻译：测试单元，测试头和电子元件测试设备
公开(公告)号：JP2010197389A
公开(公告)日：2010-09-09
申请号：JP2010034451
申请日：2010-02-19
申请人： Advantest Corp , 株式会社アドバンテスト
发明人： MURAKAMI TORU , MINEO HIROYUKI , YOO JU HWAN
IPC分类号： G01R31/26 , G01R31/28
CPC分类号： G01R31/2886
摘要： PROBLEM TO BE SOLVED: To provide a test section unit, a test head and an electronic component testing device which have both simple mechanical structure and excellent electric property, while its circuit area is easily increased.
SOLUTION: In the test section unit 300 installed in the test head body 100, a plurality of sockets 311 equipped with the electronic component under test and a performance board 301 as a main substrate are provided. All of these plural sockets 311 are installed in the performance board 301 without intervention of any socket board.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供具有简单的机械结构和优异的电性能的测试部分单元，测试头和电子部件测试装置，同时其电路面积容易增加。解决方案：在安装在测试头主体100中的测试部件单元300中，设置有配备有被测电子部件的多个插座311和作为主基板的性能板301。所有这些多个插座311安装在执行板301中，而不会插入任何插座板。版权所有（C）2010，JPO＆INPIT

7. 发明专利

JPH08316594A WIRING BOARD FOR INSPECTING PRINTED WIRING BOARD 失效
公开(公告)号：JPH08316594A
公开(公告)日：1996-11-29
申请号：JP14251395
申请日：1995-05-17
申请人： ADVANTEST CORP
发明人： MURAKAMI TORU
IPC分类号： G01R31/02 , H05K1/02 , H05K3/00
摘要： PURPOSE: To realize an inexpensive inspection of a DUT by splitting a dedicated inspection jig into a region usable commonly and a region unusable commonly, and using a part of inspection jig commonly thereby reducing the manufacturing cost of dedicated inspection jig. CONSTITUTION: A dedicated inspection jig 3 board is split into B board for common part where the inspection pins 7 of a printed board 2 to be inspected are located at common positions and A board for special part where the inspection pins 7 are located at different positions. Both boards are then fitted each other.

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