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2. 发明申请

WO0169268A3 INTEGRATED CIRCUIT TEST SOCKET LID ASSEMBLY 审中-公开
标题翻译：集成电路测试插座组件
公开(公告)号：WO0169268A3
公开(公告)日：2002-02-28
申请号：PCT/US0105646
申请日：2001-02-22
申请人： 3M INNOVATIVE PROPERTIES CO
发明人： KIFFE HEATHER Y
IPC分类号： G01R31/26 , G01R1/04 , G01R1/073 , H01R33/76
CPC分类号： G01R1/0466 , G01R1/0458
摘要： A test socket for integrated circuits includes a socket body (10) for making electrical connection between leads or pads of an integrated circuit and a load board. A lid assembly is pivotally connected to the socket body by a hinge and is rotatable between a closed position and an open position. The lid assembly is removable from the socket body without tools. The lid assembly includes a frame member secured to the hinge, and a pressure plate and actuation member contained within the frame member. The bottom surface of the pressure plate includes a plurality of channels extending from an open central portion to the circumference of the pressure plate for permitting thermal air flow over the integrated circuit. A preferred embodiment of the lid assembly provides a visual indication to the user when an integrated circuit is undergoing testing.
摘要翻译：用于集成电路的测试插座包括用于在集成电路的引线或焊盘和负载板之间进行电连接的插座主体（10）。盖组件通过铰链枢转地连接到插座主体，并且可以在关闭位置和打开位置之间旋转。盖组件可从插座主体上拆卸而无需工具。盖组件包括固定到铰链的框架构件和容纳在框架构件内的压板和致动构件。压板的底表面包括从打开的中心部分延伸到压力板的圆周的多个通道，用于允许热空气流过集成电路。当集成电路正在进行测试时，盖组件的优选实施例向用户提供视觉指示。

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