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    • 3. 发明专利
    • BR9917199A
    • 2002-01-08
    • BR9917199
    • 1999-06-08
    • 3M INNOVATIVE PROPERTIES CO
    • HARDY L CHARLESTRICE JENNIFER L
    • C09G1/02C09K3/14H01L21/321
    • A family of working liquids useful in modifying exposed surfaces of wafers for semiconductor fabrication are provided along with methods of modifying exposed surfaces of wafers for semiconductor fabrication utilizing such a family of working liquids, and semiconductor wafers made according the foregoing process. The working liquid of the invention is a solution of initial components, the components comprising: an oxidizing agent; an ionic buffer; a passivating agent; a chelating agent selected from iminodiacetic acid and salts thereof; and water. The method of the invention comprises the steps of: a) providing a wafer comprising a first material having a surface etched to form a pattern and a second material deployed over the surface of the first material; b) contacting the second material of the wafer with abrasive in the presence of the working liquid; and c) relatively moving the wafer while the second material is in contact with the abrasive until an exposed surface of the wafer is planar and comprises at least one area of exposed first material and one area of exposed second material.
    • 7. 发明专利
    • AT234906T
    • 2003-04-15
    • AT99973765
    • 1999-06-08
    • 3M INNOVATIVE PROPERTIES CO
    • HARDY L CHARLESTRICE JENNIFER L
    • C09G1/02C09K3/14H01L21/321
    • A family of working liquids useful in modifying exposed surfaces of wafers for semiconductor fabrication are provided along with methods of modifying exposed surfaces of wafers for semiconductor fabrication utilizing such a family of working liquids, and semiconductor wafers made according the foregoing process. The working liquid of the invention is a solution of initial components, the components comprising: an oxidizing agent; an ionic buffer; a passivating agent; a chelating agent selected from iminodiacetic acid and salts thereof; and water. The method of the invention comprises the steps of: a) providing a wafer comprising a first material having a surface etched to form a pattern and a second material deployed over the surface of the first material; b) contacting the second material of the wafer with abrasive in the presence of the working liquid; and c) relatively moving the wafer while the second material is in contact with the abrasive until an exposed surface of the wafer is planar and comprises at least one area of exposed first material and one area of exposed second material.
    • 9. 发明申请
    • COMPOSITIONS AND METHODS FOR MODIFYING A SURFACE SUITED FOR SEMICONDUCTOR FABRICATION
    • 用于修改用于半导体制造的表面的组合物和方法
    • WO2009023387A3
    • 2009-04-02
    • PCT/US2008069396
    • 2008-07-08
    • 3M INNOVATIVE PROPERTIES CO
    • HARDY L CHARLESKRANZ HEATHER KWOOD THOMAS EKAISAKI DAVID AGAGLIARDI JOHN JCLARK JOHN CSAVU PATRICIA MCLARK PHILIP G
    • H01L21/304
    • H01L21/31053B24B37/044B24B37/245C09G1/02H01L21/3212
    • The disclosure pertains to compositions and methods for modifying or refining the surface of a wafer suited for semiconductor fabrication. The compositions include working liquids useful in modifying a surface of a wafer suited for fabrication of a semiconductor device. In some embodiments, the working liquids are aqueous solutions of initial components substantially free of loose abrasive particles, the components including water, a surfactant, and a pH buffer exhibiting at least one pKa greater than 7. In certain embodiments, the pH buffer includes a basic pH adjusting agent and an acidic complexing agent, and the working liquid exhibits a pH from about 7 to about 12. In further embodiments, the disclosure provides a fixed abrasive article comprising a surfactant suitable for modifying the surface of a wafer, and a method of making the fixed abrasive article. Additional embodiments describe methods that may be used to modify a wafer surface.
    • 本公开涉及用于改性或精制适于半导体制造的晶片表面的组合物和方法。 组合物包括可用于改性适于制造半导体器件的晶片表面的工作液体。 在一些实施方案中,工作液体是基本上不含松散磨料颗粒的初始组分的水溶液,组分包括水,表面活性剂和显示至少一个pKa大于7的pH缓冲液。在某些实施方案中,pH缓冲剂包括 碱性pH调节剂和酸性络合剂,并且工作液体的pH为约7至约12.在另外的实施方案中,本公开提供了包含适于改性晶片表面的表面活性剂的固定磨料制品,以及方法 制造固定的磨料制品。 另外的实施例描述了可用于修改晶片表面的方法。