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    • 1. 发明授权
    • 자유지지형 나노박막 제조 방법 및 제조 장치
    • 自制纳米纤维的制造方法和装置
    • KR101300014B1
    • 2013-08-26
    • KR1020120104253
    • 2012-09-19
    • 한국기계연구원
    • 황보윤이충광김상민김재현이학주
    • B82B3/00C01B31/04
    • B82B3/0038B82B3/0061C01B32/182C01B32/186
    • PURPOSE: A manufacturing method of freestanding nano-films configured to prevent damage to a freestanding graphene formed on a through hole on a substrate is provided to easily produce a freestanding graphene with large area. CONSTITUTION: A manufacturing method of freestanding nano-films comprises the steps of: a first step in which one side of a polymer layer (300) is transcribed for a nano thin-film to be attached on the upper side of a substrate (100) with a through hole passing through the top and the bottom of a laminate having nano thin-film on one side of the laminate, a second step in which nano thin-film is formed on the upper side of the substrate, has a polymer layer on the upper side and the substrate is turned for the polymer layer to on the lower part, and a third step in which a solvent (600) contacts the polymer layer to remove the polymer layer for the solvent not to be inserted into the through hole of the substrate. The nano thin-film promotes drying of the transcribed substrate. The nano thin-film is a graphene layer (200) which is synthesized through the chemical vapor deposition (CVD).
    • 目的:提供独立式纳米膜的制造方法,其被配置为防止对形成在基板上的通孔上的独立石墨烯的损坏,以容易地产生具有大面积的独立石墨烯。 构成:独立式纳米膜的制造方法包括以下步骤:第一步骤是将聚合物层(300)的一侧转印以将纳米薄膜附着在基板(100)的上侧, 在层叠体一侧通过具有纳米薄膜的层叠体的顶部和底部的通孔,在基板的上侧形成有纳米薄膜的第二工序,在基板的上侧形成有聚合物层 将上侧和基板转动用于聚合物层到下部,以及第三步骤,其中溶剂(600)与聚合物层接触以除去不插入通孔的溶剂的聚合物层 底物。 纳米薄膜促进转录底物的干燥。 纳米薄膜是通过化学气相沉积(CVD)合成的石墨烯层(200)。
    • 2. 发明授权
    • 고분자 불순물이 없는 자유지지 나노박막 제조 방법
    • 自由支撑无聚合物杂质的纳米薄膜的制备方法
    • KR101827380B1
    • 2018-02-09
    • KR1020160002395
    • 2016-01-08
    • 한국기계연구원
    • 이충광황보윤김재현이학주
    • C01B31/04
    • 본발명은제1관통홀이형성된폴리머필름을나노박막에밀착시켜, 너비방향으로상기제1관통홀이나노박막의내측부분에배치되도록폴리머필름에나노박막을부착시키는단계(S10); 및상기나노박막이부착된폴리머필름을관통공이형성된타겟기판에밀착시키되나노박막이타겟기판에밀착되도록하며, 너비방향으로상기관통공이제1관통홀의내측부분에배치되도록하여, 상기관통공이형성된타겟기판에나노박막이자유지지되도록전사하는단계(S20); 를포함하여이루어져, 나노박막이관통공에의해자유지지된부분이폴리머나다른물질들에접촉되지않도록전사하여제조될수 있어, 자유지지된나노박막의표면에고분자불순물이없도록할 수있는고분자불순물이없는자유지지나노박막제조방법에관한것이다.
    • 本发明包括所述通孔的第一步骤中,与形成在所述纳米薄膜的聚合物膜,在宽度方向紧密接触所述第一通孔安装在聚合物膜上的纳米薄膜被设置在所述纳米薄膜(S10)的内部部分; 和被放置在所述通孔的内侧部分现在之一是通过聚合物膜的孔,其中通孔形成粘附sikidoe与目标基底紧密接触的纳米薄膜,并且使得所述纳米薄膜粘附到所述目标基板,宽度方向,所述通孔的所述目标被形成 (S20)将纳米薄膜转移以自由支撑在基板上; 包括由纳米薄膜有由贯通孔通过转录从与聚合物或其它材料接触来制备的支撑自由部分的,是自由支承纳米薄膜的表面,能够防止高分子杂质聚合物杂质 免费的纳米薄膜。
    • 5. 发明授权
    • 전기습윤 현상을 이용한 자유지지형 나노박막의 물성 시험 장치
    • 使用电润湿的独立纳米膜的性能测试仪器
    • KR101453947B1
    • 2014-10-22
    • KR1020130076102
    • 2013-06-28
    • 한국기계연구원
    • 이충광황보윤김상민이학주김재현
    • G01N27/26
    • The present invention relates to a device and a method for testing physical properties of a freestanding nanofilm using an electrowetting phenomenon. More specifically, the freestanding nanofilm is formed on a substrate on which holes are formed. On an inner side of the hole, an electrode layer and an insulation layer are formed. Electrolyte is contained in the inner side of the hole. Electric power is applied to the electrode layer and the electrolyte. A contact angle between the electrolyte and the insulation layer which varies according to voltages applied is used to calculate pressure of the inside of the electrolyte. Thereby, a degree of deformation of the freestanding nanofilm can be measured to test the physical properties such as residual stress, tensile strength, elastic modulus, or a Poisson′s ratio of the nanofilm.
    • 本发明涉及使用电润湿现象来测试独立纳米薄膜的物理性能的装置和方法。 更具体地,在形成有孔的基板上形成独立的纳米薄膜。 在孔的内侧形成电极层和绝缘层。 电解质包含在孔的内侧。 对电极层和电解质施加电力。 使用根据施加的电压而变化的电解质和绝缘层之间的接触角来计算电解质内部的压力。 因此,可以测量独立纳米薄膜的变形程度,以测试残余应力,拉伸强度,弹性模量或纳米薄膜的泊松比等物理性能。
    • 9. 发明授权
    • 자유지지형 나노박막의 물성 시험 장치 및 방법
    • 物业测试设备及其自动化方法
    • KR101409812B1
    • 2014-06-24
    • KR1020130054682
    • 2013-05-14
    • 한국기계연구원
    • 황보윤김재현이학주이충광김상민
    • G01B21/32B82Y35/00
    • G01B21/32B82Y35/00C01B32/182G01B9/04G01Q60/00
    • The present invention relates to an apparatus and a method for testing physical properties of a freestanding nano thin film, and more specifically, to an apparatus and a method for testing physical properties of a freestanding nano thin film, wherein, a nano thin film is mounted on an upper surface of a substrate having a plurality of penetration holes, the substrate on which a freestanding nano thin film is formed is fixed to a jig, and the degree to which the freestanding nano thin film is transformed is measured by using an atomic force microscope, or an interferometer, etc. while applying vacuum at specific pressure, thereby testing mechanical properties such as tensile strength, elastic modulus or Poisson′s ratio of the freestanding nano thin film.
    • 本发明涉及一种用于测试独立式纳米薄膜的物理性能的装置和方法,更具体地,涉及一种用于测试独立式纳米薄膜的物理性质的装置和方法,其中,安装纳米薄膜 在具有多个贯通孔的基板的上表面上,将形成有独立的纳米薄膜的基板固定在夹具上,通过使用原子力来测定独立的纳米薄膜的变形程度 显微镜或干涉仪等,同时在特定压力下施加真空,从而测试独立式纳米薄膜的机械性能如拉伸强度,弹性模量或泊松比。