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    • 1. 发明公开
    • 집적 회로-MEMS 플랫폼상에 구조물을 지지하는 검사-질량체 및 이의 제조 방법
    • 集成电路MEMS平台支持结构的防护质量及其制造方法
    • KR1020090097942A
    • 2009-09-16
    • KR1020097014975
    • 2007-10-24
    • 아쿠스티카 인코퍼레이티드
    • 다이아몬드브렛엠질레즈닉매튜에이밴드미어잔이가브리엘카이검제이
    • H01L29/84G01P15/125
    • B81C1/00246B81C2203/0742
    • Provided is a micro-electromechanical-system (MEMS) device including a substrate; at least one semiconductor layer provided on the substrate; a circuit region including at least one chip containing drive/sense circuitry, the circuit region provided on the at least one semiconductor layer; a support structure attached to the substrate; at least one elastic device attached to the support structure; a proof-mass suspended by the at least one elastic device and free to move in at least one of the x-, y-, and z-directions; at least one top electrode provided on the at least one elastic device; and at least one bottom electrode located beneath the at least one elastic device such that an initial capacitance is generated between the at least one top and bottom electrodes, wherein the drive/sense circuitry, proof-mass, supporting structure, and the at least one top and bottom electrodes are fabricated on the at least one semiconductor layer.
    • 提供了一种包括基板的微机电系统(MEMS)装置; 设置在所述基板上的至少一个半导体层; 电路区域,包括至少一个包含驱动/感测电路的芯片,所述电路区域设置在所述至少一个半导体层上; 附着在基板上的支撑结构; 连接到所述支撑结构的至少一个弹性装置; 由所述至少一个弹性装置悬挂的自由移动的x,y和z方向中的至少一个; 设置在所述至少一个弹性装置上的至少一个顶部电极; 以及位于所述至少一个弹性装置下方的至少一个底部电极,使得在所述至少一个顶部和底部电极之间产生初始电容,其中所述驱动/感测电路,证明质量,支撑结构和所述至少一个 在至少一个半导体层上制造顶部和底部电极。