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    • 6. 发明公开
    • 가공품의 측정장치 및 방법
    • 用于测量工作的装置和方法
    • KR1020090000209A
    • 2009-01-07
    • KR1020070010582
    • 2007-02-01
    • 삼성전자주식회사
    • 최성욱송진영김진규송명철
    • G01B21/04G06Q50/04
    • G01B21/04G06Q50/04
    • A measuring apparatus of processing products and a method thereof are provided to perform processing and measurement through once setup, thereby removing an error value caused by repeated setup. A measure apparatus of a processing product comprises a processing device(100) and a computer(150). The processing device measures the processing product after processing a mold. The computer displays and stores the measurement result value corresponding to a processing location value of the processing product measured by the processing device. The processing device comprises a first controller(101) and a probe(103). The first controller performs a control operation so as to transmit the processing location value of the measured processing products to the computer. The probe processes the mold under control of the first controller, and measures the processing location value of the processing product.
    • 提供了一种处理产品的测量装置及其方法,用于通过一次设置来执行处理和测量,从而消除由重复设置引起的错误值。 处理产品的测量装置包括处理装置(100)和计算机(150)。 处理装置在处理模具之后测量加工产品。 计算机显示和存储与由处理装置测量的处理产品的处理位置值相对应的测量结果值。 处理装置包括第一控制器(101)和探头(103)。 第一控制器执行控制操作,以将测量的处理产品的处理位置值传送到计算机。 探头在第一控制器的控制下处理模具,并测量加工产品的加工位置值。