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    • 9. 发明公开
    • 이미지 센서 및 그 구동 방법
    • 图像传感器及其操作方法
    • KR1020090015286A
    • 2009-02-12
    • KR1020070079501
    • 2007-08-08
    • 삼성전자주식회사
    • 송재호김기홍
    • H04N5/374H04N5/363
    • An image sensor and a driving method thereof for appropriately controlling the potential level of a reset device are provided not to be limited within subjects mentioned and to make the other subjects, which are not mentioned, specifically understood as the person skilled in the art from the following material. An image sensor comprises a photoelectric conversion device, a charge coupled device, a charge transfer device, a pixel array(10), and a matrix driving unit(20). The charge transfer device transmits an electric charge accumulated in the photoelectric conversion device to the charge coupled device. In the pixel array, a unit pixel including a reset device for resetting the charge coupled device is arranged in a matrix type. The matrix driving unit provides a boosting reset signal to the reset device which is boosted in order to have a level higher than a power supply voltage.
    • 提供了用于适当地控制复位装置的电位电平的图像传感器及其驱动方法,其不限于所提及的主题,并且使未被提及的其他被摄体从本领域技术人员中被明确地理解为 以下材料。 图像传感器包括光电转换装置,电荷耦合装置,电荷转移装置,像素阵列(10)和矩阵驱动装置(20)。 电荷转移装置将积累在光电转换装置中的电荷传送到电荷耦合装置。 在像素阵列中,包括用于复位电荷耦合器件的复位器件的单位像素被布置成矩阵型。 矩阵驱动单元向复位装置提供升压复位信号,该复位装置被升压以便具有高于电源电压的电平。
    • 10. 发明公开
    • 불휘발성 메모리 장치에서 전하 손실에 기인한 오류 데이터정정 방법
    • 校正非易失性存储器件中充电损失引起的故障数据的方法
    • KR1020080075710A
    • 2008-08-19
    • KR1020070014988
    • 2007-02-13
    • 삼성전자주식회사
    • 이승원이병훈김기홍김선권
    • G11C16/34G11C29/42G11C16/30
    • G11C16/3431G06F11/1068G11C16/3418G11C2029/0411G11C29/42
    • A method of correcting fault data caused by charge loss in a non-volatile memory device is provided to maintain the reliability of data of a memory cell included in the non-volatile memory device even in case of charge loss. According to a method of correcting fault data of a non-volatile memory device including a plurality of memory cells, fault data is detected from a second data group, by comparing a first data group read from the memory cells by referring to a first voltage(S410) with the second data group read from the memory cells(S430) by referring to a second voltage higher than the first voltage(S440). Fault data is detected from the first data group, through ECC(Error Correction Coding)(S450). The data of the memory cells are rewritten, by correcting fault data of the first data group and fault data of the second data group(S470).
    • 提供了一种校正由非易失性存储器件中的电荷损失引起的故障数据的方法,以便即使在电荷损失的情况下也能维持包括在非易失性存储器件中的存储单元的数据的可靠性。 根据一种校正包括多个存储单元的非易失性存储器件的故障数据的方法,通过参考第一电压(第一电压)比较从存储器单元读取的第一数据组,从第二数据组检测故障数据 S410),其中通过参考高于第一电压的第二电压从存储器单元读取第二数据组(S430)(S440)。 通过ECC(错误校正编码)从第一数据组检测故障数据(S450)。 通过校正第一数据组的故障数据和第二数据组的故障数据来重写存储单元的数据(S470)。