专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JP2017088439A セラミックス／アルミニウム接合体、パワーモジュール用基板、及び、パワーモジュール审中-公开
公开(公告)号：JP2017088439A
公开(公告)日：2017-05-25
申请号：JP2015218892
申请日：2015-11-06
申请人：三菱マテリアル株式会社 , Mitsubishi Materials Corp , 国立大学法人東京大学 , Univ Of Tokyo , 国立大学法人東京大学
发明人： KUROMITSU YOSHIO , AKIYAMA KAZUHIRO , NAGASE TOSHIYUKI , NAGATOMO YOSHIYUKI , TERASAKI NOBUYUKI , IKUHARA YUUICHI , SHIBATA NAOYA , KUMAMOTO AKIHITO
IPC分类号： C04B37/02 , H01L23/12 , H01L23/36
CPC分类号： C04B37/02 , H01L23/12 , H01L23/36 , H01L2224/32225
摘要：【課題】セラミックス部材とアルミニウム部材とが確実に接合され、冷熱サイクル負荷時の接合信頼性に優れるとともにセラミックス部材の割れの発生を抑制することができるセラミックス/アルミニウム接合体を提供する。【解決手段】アルミニウム部材12のうちセラミックス部材11との接合界面から厚さ方向に2μmの範囲内に、スピネル結晶構造を有するMg含有酸化物36が分散しており、アルミニウム部材12のうちセラミックス部材11との接合界面近傍領域にMg,Si,Oが偏析した偏析部31を有し、偏析部31と接合界面30からアルミニウム部材12側に10μm離間した位置とのMg,Si,Oの質量比が、それぞれ所定の範囲内とされ、接合界面30からアルミニウム部材12側に10μm離間した位置におけるMg量が0.8mass%以下とされている。【選択図】図2

2. 发明专利

JP2014056717A Conductive thin film 有权
标题翻译：导电薄膜
公开(公告)号：JP2014056717A
公开(公告)日：2014-03-27
申请号：JP2012200917
申请日：2012-09-12
申请人： Univ Of Tokyo , 国立大学法人東京大学
发明人： IKUHARA YUUICHI , YAMAMOTO TAKEHISA , SHIBATA NAOYA , MIMUKAI YUKI , KOBAYASHI SHUNSUKE
IPC分类号： H01B5/14 , C01G23/00 , C23C14/28 , H01L21/28 , H01L21/3205 , H01L21/768 , H01L23/532
摘要： PROBLEM TO BE SOLVED: To provide a conductive thin film which can improve physical properties regardless of other configurations.SOLUTION: A conductive thin film 3 made of a perovskite oxide represented by the general formula ABOhas a vacancy group 8 made of a plurality of vacancies 7 that get together. The vacancy group 8 generates strains.
摘要翻译：要解决的问题：提供可以改善物理性能的导电薄膜，而不管其它结构如何。解决方案：由通式ABO表示的由钙钛矿氧化物制成的导电薄膜3由多个空位7制成的空位组8 聚在一起空缺组8产生菌株。

3. 发明专利

JP2014032990A Antiferromagnetic material, magnetoresistive element, and magnetic random access memory 审中-公开
标题翻译：抗磁材料，磁性元件和磁性随机存取存储器
公开(公告)号：JP2014032990A
公开(公告)日：2014-02-20
申请号：JP2012170951
申请日：2012-08-01
申请人： Univ Of Tokyo , 国立大学法人東京大学
发明人： IKUHARA YUUICHI , YAMAMOTO TAKEHISA , SUGIYAMA KAZUO , SHIBATA NAOYA
IPC分类号： H01F10/32 , H01F10/18 , H01L21/8246 , H01L27/105 , H01L43/08 , H01L43/10
摘要： PROBLEM TO BE SOLVED: To provide an antiferromagnetic material in which a pinned magnetic part can be miniaturized, a magnetoresistive element, and a magnetic random access memory.SOLUTION: An antiferromagnetic material 1 includes a ferromagnetic part 4 formed by linearly arranging dislocations 3 in one dimension. The antiferromagnetic material 1 contains at least one of a nickel oxide, an iron oxide and a manganese oxide, as a main constituent, and the ferromagnetic part 4 is formed with a density of 1×10/cmor more. A magnetoresistive element includes: a nonmagnetic thin film that uses a magnetization pinned thin film formed of the antiferromagnetic material having the ferromagnetic part and is formed on the magnetization pinned thin film; and a magnetization free thin film formed on the nonmagnetic thin film.
摘要翻译：要解决的问题：提供一种可以将钉扎磁性部件小型化的反铁磁材料，磁阻元件和磁性随机存取存储器。解反：反铁磁材料1包括通过将位错3线性排列在一个中的铁磁部分4 尺寸。反铁磁材料1含有氧化镍，氧化铁和氧化锰中的至少一种作为主要成分，铁氧体部分4以1×10 / cm 2以上的密度形成。磁阻元件包括：非磁性薄膜，其使用由具有铁磁性部分的反铁磁材料形成的磁化固定薄膜，并形成在磁化固定薄膜上; 以及形成在非磁性薄膜上的无磁化薄膜。

4. 发明专利

JP2012022971A Aberration correction method and aberration correction device for scanning transmission electron microscope 有权
标题翻译：用于扫描传输电子显微镜的检测校正方法和异常校正装置
公开(公告)号：JP2012022971A
公开(公告)日：2012-02-02
申请号：JP2010161673
申请日：2010-07-16
申请人： Jeol Ltd , Univ Of Tokyo , 国立大学法人東京大学 , 日本電子株式会社
发明人： SHIBATA NAOYA , SAWADA HIDEAKI , KONO YUJI
IPC分类号： H01J37/153 , H01J37/22 , H01J37/244 , H01J37/28
摘要： PROBLEM TO BE SOLVED: To provide an aberration correction method and an aberration correction device that minimize a time lag accompanying change in aberration and have high calculation accuracy of an aberration coefficient in high resolution observation.SOLUTION: A scanning transmission electron microscope having an aberration corrector makes an electron beam incident on a detector with plural detection faces, simultaneously picks up a dark field image by the electron beam and a bright field image including angle information of the electron beam for each of the detection faces, calculates an aberration coefficient from the plural bright field images with the dark field image as a position reference of an observed image, and controls the aberration corrector on the basis of the calculated aberration coefficient so as to reduce aberration.
摘要翻译：解决的问题：提供一种像差校正方法和像差校正装置，其使伴随像差变化的时滞最小化，并且在高分辨率观察中具有高的像差系数的计算精度。解决方案：具有像差校正器的扫描透射电子显微镜使电子束入射到具有多个检测面的检测器上，同时通过电子束拾取暗场图像和包括电子束的角度信息的明视场图像对于每个检测面，从具有暗场图像的多个亮场图像中计算像差系数作为观察图像的位置参考，并且基于计算的像差系数控制像差校正器，以减少像差。版权所有（C）2012，JPO＆INPIT

5. 发明专利

JP2010212233A Transmission electron microscope 有权
标题翻译：传输电子显微镜
公开(公告)号：JP2010212233A
公开(公告)日：2010-09-24
申请号：JP2010026242
申请日：2010-02-09
申请人： Jeol Ltd , Univ Of Tokyo , 国立大学法人東京大学 , 日本電子株式会社
发明人： SHIBATA NAOYA , INAMI WATARU , SAWADA HIDEAKI
IPC分类号： H01J37/244
摘要： PROBLEM TO BE SOLVED: To provide a transmission electron microscope particularly capable of processing a shape of a photodetector into an optional shape by using an optical fiber as a photoconductive medium.
SOLUTION: The transmission electron microscope enabled to obtain a high-angled scattering image and a dark field image from transmitted electrons which transmit a sample piece 50 is provided with a scintillator 1 for converting the transmitted electron signal which transmits the sample piece 50 into a light signal and an optical fiber 20 which connects the light signal output of the scintillator with a photodetector 30. A connection part between the optical fiber 20 and the photodetector 30 is structured to be processed into an optional shape.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供一种特别能够通过使用光纤作为感光介质将光电检测器的形状加工成可选形状的透射电子显微镜。解决方案：能够从透射样品50的透射电子获得高角散射图像和暗场图像的透射电子显微镜设置有用于转换透射样品片50的透射电子信号的闪烁体1 将光信号和光纤20连接，该光纤20将闪烁体的光信号输出与光电检测器30连接。光纤20和光电检测器30之间的连接部分被构造成可选的形状。版权所有（C）2010，JPO＆INPIT

6. 发明专利

JP2007242514A Transmission electron microscope, and its control method 审中-公开
标题翻译：传输电子显微镜及其控制方法
公开(公告)号：JP2007242514A
公开(公告)日：2007-09-20
申请号：JP2006065806
申请日：2006-03-10
申请人： Jeol Ltd , Univ Of Tokyo , 国立大学法人東京大学 , 日本電子株式会社
发明人： SHIBATA NAOYA , SAWADA HIDEAKI
IPC分类号： H01J37/147 , H01J37/153 , H01J37/26
摘要： PROBLEM TO BE SOLVED: To provide a transmission electron microscope which electrically performs a tilt adjustment impossible for a person or a sample tilt mechanism to control, and achieves a precise tilt adjustment.
SOLUTION: An electron beam E generated and accelerated by an electron gun 1 connected to a high voltage power source is focused by a focusing lens 3 formed of condenser lenses, tilted by two stages of deflection coils of a deflection part 4, and applied to a sample 5a on a sample setting table in a sample room 5. The electron beam having passed through the sample 5a put and held on the sample setting table enters an objective lens 6. An aberration corrector 7 corrects aberration caused in the objective lens 6.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：提供电气执行人或样品倾斜机构不可能的倾斜调节的透射电子显微镜以进行控制，并且实现精确的倾斜调节。解决方案：通过连接到高压电源的电子枪1产生和加速的电子束E被由聚光透镜形成的聚焦透镜3聚焦，聚光透镜3由偏转部分4的两级偏转线圈倾斜，并且施加到样品室5中的样品设置台上的样品5a。放置并保持在样品设置台上的通过样品5a的电子束进入物镜6.像差校正器7校正在物镜中引起的像差 6.版权所有（C）2007，JPO＆INPIT

7. 发明专利

JP2011243516A Adjustment method of multiple division stem detector 有权
标题翻译：多级干扰检测器的调整方法
公开(公告)号：JP2011243516A
公开(公告)日：2011-12-01
申请号：JP2010116906
申请日：2010-05-21
申请人： Jeol Ltd , Univ Of Tokyo , 国立大学法人東京大学 , 日本電子株式会社
发明人： SHIBATA NAOYA , KONO YUJI , SAWADA HIDEAKI
IPC分类号： H01J37/244
摘要： PROBLEM TO BE SOLVED: To precisely and easily conduct the gain and off-set adjustments of a multiple division STEM detector.SOLUTION: An electron beam having uniform current density is radiated to the entire detection surface DF of a circular scintillator 601 disposed on the optical axis of a scanning transmission electron microscope, and each of photomultiplier tubes 603 receives light output from the scintillator 601 via an optical fiber bundle 602. And, the intensity of a detection signal output from each photomultiplier tube 603 is measured and then the gain and off-set of the multiple division STEM detector are adjusted for each of detection regions DR, which is obtained by dividing the detection surface DF of the scintillator 601 in a radial direction and an angle direction, so that the intensity of the detection signal output from each photomultiplier tube 603 is proportional to the area of each detection region DR.
摘要翻译：要解决的问题：精确和轻松地进行多分割STEM检测器的增益和偏移调整。解决方案：具有均匀电流密度的电子束照射到设置在扫描透射电子显微镜的光轴上的环形闪烁器601的整个检测表面DF，并且每个光电倍增管603接收从闪烁器601输出的光测量从各个光电倍增管603输出的检测信号的强度，然后对每个检测区域DR调整多个分割STEM检测器的增益和偏移量，该检测区域DR由将闪烁体601的检测面DF沿径向和角度方向分割，使得从各个光电倍增管603输出的检测信号的强度与各检测区域DR的面积成比例。版权所有（C）2012，JPO＆INPIT

8. 发明专利

JP2011173802A Short chain cationic polyamino acid and use thereof 有权
标题翻译：短链阳离子聚氨酯酸及其用途
公开(公告)号：JP2011173802A
公开(公告)日：2011-09-08
申请号：JP2010037014
申请日：2010-02-23
申请人： Nano Career Kk , Univ Of Tokyo , ナノキャリア株式会社 , 国立大学法人東京大学
发明人： KATO YASUKI , ISHII ATSUSHI , SHIBATA NAOYA , HAYASHI TATSUYUKI , KATAOKA KAZUNORI , MIYATA KANJIRO , NISHIYAMA NOBUHIRO
IPC分类号： C07K4/00 , A61K31/7105 , A61K31/713 , A61K47/42 , A61K47/48 , A61K48/00
CPC分类号： C08G69/10 , A61K47/60 , A61K47/6455 , C12N15/111 , C12N2310/14 , C12N2320/32
摘要： PROBLEM TO BE SOLVED: To provide a carrier which can form a complex stable in physiological conditions together with such a small molecular nucleic acid as siRNA and can suitably release the small molecular nucleic acid in a cell. SOLUTION: There are provided a cationic polyamino acid containing cationic amino acid residues having cationic groups on side chains and hydrophobic amino acid residues having hydrophobic groups on side chains, and having an ability to associate with a nucleic acid, wherein 1 to 20 cationic amino acid residues are contained therein; and a block copolymer containing the cationic amino acid and a hydrophilic polymer. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：待解决的问题：提供能够在生理条件下与siRNA等小分子核酸形成复合物稳定的载体，并且可以适当地释放细胞中的小分子核酸。解决方案：提供一种阳离子聚氨基酸，其含有在侧链上具有阳离子基团的阳离子氨基酸残基和在侧链上具有疏水基团的疏水性氨基酸残基，并具有与核酸缔合的能力，其中1至20 其中含有阳离子氨基酸残基; 和含有阳离子性氨基酸和亲水性聚合物的嵌段共聚物。版权所有（C）2011，JPO＆INPIT

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式