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    • 3. 发明申请
    • RLINK-ON-DIE INTERCONNECT FEATURES TO ENABLE SIGNALING
    • RLINK-DIE互连功能使信令生效
    • WO2018009167A1
    • 2018-01-11
    • PCT/US2016/040907
    • 2016-07-02
    • INTEL CORPORATIONZHANG, Yu AmosAYGUN, Kemal
    • ZHANG, Yu AmosAYGUN, Kemal
    • H01L23/50H01L23/52H01L23/522H01L23/00H01L21/768
    • H01L21/76877H01L21/76898H01L23/50H01L23/522H01L23/5222H01L23/5227
    • Integrated circuit (IC) chip "on-die" interconnection features (and methods for their manufacture) may improve signal connections and transmission through a data signal communication channel from one chip, through semiconductor device packaging, and to another component, such as another chip. Such chip interconnection features may include (1) "last silicon metal level (LSML)" data signal "leadway (LDW) routing" traces isolated between LSLM isolation (e.g., power and/or ground) traces to: (2) add a length of the isolated data signal LDW traces to increase a total length of and tune data signal communication channels extending through a package between two communicating chips and (3) create switched buffer (SB) pairs of data signal channels that use the isolated data signal LDW traces to switch the locations of the pairs data signal circuitry and surface contacts for packaging connection bumps.
    • 集成电路(IC)芯片“片上”(on-die) 互连特征(以及用于其制造的方法)可以改善通过数据信号通信信道从一个芯片经过半导体器件封装到另一个组件(例如另一个芯片)的信号连接和传输。 这样的芯片互连特征可以包括(1)“最后硅金属层(LSML)” 数据信号“引线(LDW)路由” (2)添加一段长度的隔离数据信号LDW迹线,以增加延伸通过两个通信芯片之间的封装的数据信号通信信道的总长度和调谐数据信号通信信道 和(3)创建使用隔离数据信号LDW迹线的切换缓冲器(SB)对数据信号通道来切换数据信号电路和表面触点的位置以用于封装连接凸点。