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    • 1. 发明授权
    • Electric part testing apparatus with movable adapter
    • 带可移动适配器的电气部件测试装置
    • US06636057B1
    • 2003-10-21
    • US09667753
    • 2000-09-21
    • Youji Uchikura
    • Youji Uchikura
    • G01R3102
    • G01R1/07371
    • Testing apparatus for an electronic part having first and second pins includes an adapter having through-holes, and a testing plate having pads. Connecting members are arranged in the through-holes of the adapter, each connecting member including a pin contact portion, a pad contact portion, and a spring between the pin and pad contact portions. Top surfaces of pin contact portions are within the through-holes so that pins can be inserted into through-holes above the pin contact portions. The top surface of the first pin contact portion is higher than that of the second pin contact portion. The adapter is movably supported by the testing plate. During the test, as the electronic part is pressed toward the adapter, the first pins contact the first pin contact portions and the first test is carried out, first and second pins then contact first and second pin contact portions, and the adapter is then moved toward the testing plate to further enhance the connection and second test is carried out.
    • 具有第一和第二引脚的电子部件的测试装置包括具有通孔的适配器和具有焊盘的测试板。 连接构件布置在适配器的通孔中,每个连接构件包括销接触部分,衬垫接触部分和在销和衬垫接触部分之间的弹簧。 销接触部分的顶表面在通孔内,使得销可以插入销接触部分上方的通孔中。 第一销接触部分的顶表面高于第二销接触部分的顶表面。 适配器由测试板可移动地支撑。 在测试期间,当电子部件被压向适配器时,第一销接触第一销接触部分并进行第一次测试,第一和第二销然后接触第一和第二销接触部分,然后适配器移动 向测试板进一步加强连接,并进行第二次测试。