会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • Optical element and image projecting apparatus
    • 光学元件和图像投影设备
    • US20070217011A1
    • 2007-09-20
    • US11709862
    • 2007-02-23
    • Yoshiyuki KiyosawaHideaki Hirai
    • Yoshiyuki KiyosawaHideaki Hirai
    • G02B27/28
    • G02B27/285G02B26/06
    • An optical element with a phase structure configured to provide a phase difference between a first polarization component of light and a second polarization component of the light which is orthogonal to the first polarization component, is provided, in which the phase structure includes a first fine periodic structure which includes plural first dielectric plates with a first thickness and a first refractive index which are periodically arranged in a first fine period and a second fine periodic structure which includes plural second dielectric plates with a second thickness and a second refractive index which are periodically arranged in a second fine period, wherein a refractive index of a medium between the plural first dielectric plates and a refractive index of a medium between the plural second dielectric plates are different from the first refractive index and the second refractive index, and at least one of, the first fine period and the second fine period, a ratio of the first thickness to the first fine period and a ratio of the second thickness to the second fine period, and the first refractive index and the second refractive index, is different from each other.
    • 具有相位结构的光学元件被配置为提供光的第一偏振分量和与第一偏振分量正交的光的第二偏振分量之间的相位差,其中相位结构包括第一精细周期 结构,其包括具有第一厚度和第一折射率的多个第一电介质板,其在第一精细周期中周期性地布置;以及第二微细周期结构,其包括具有第二厚度和第二折射率的多个第二电介质板, 在第二精细周期中,多个第一电介质板之间的介质的折射率与多个第二电介质板之间的介质的折射率不同于第一折射率和第二折射率,以及至少一个 ,第一罚款期和第二罚款期间,第一罚款期和第二罚款期 第一精细周期的厚度和第二厚度与第二细小周期的比率以及第一折射率和第二折射率彼此不同。
    • 2. 发明授权
    • Optical element and optical device
    • 光学元件和光学元件
    • US07894133B2
    • 2011-02-22
    • US11868048
    • 2007-10-05
    • Hideaki HiraiYoshiyuki KiyosawaKazuhiro UmekiYasuhiro Fujimura
    • Hideaki HiraiYoshiyuki KiyosawaKazuhiro UmekiYasuhiro Fujimura
    • G02B5/30
    • G02B5/1809G02B5/1866G02B5/3083
    • A disclosed optical element includes: a transparent substrate; a subwavelength structure layer disposed on the transparent substrate, the subwavelength structure layer having a refractive index different from a refractive index of the transparent substrate; a minute concave and convex structure of one-dimensional grating formed on the subwavelength structure layer with a subwavelength period smaller than a wavelength to be used, where a concave portion reaches a boundary surface between the transparent substrate and the subwavelength structure layer; and an open hole portion formed on a subwavelength structure layer side of the transparent substrate so as to communicate with the concave portion of the minute structure and to be arranged with the same period as in the minute structure of one-dimensional grating. At least at the open hole portion, a refractive index relative to an incident light is changed in a direction orthogonal to the boundary surface.
    • 所公开的光学元件包括:透明基板; 设置在所述透明基板上的亚波长结构层,所述亚波长结构层的折射率不同于所述透明基板的折射率; 形成在亚波长结构层上的亚波长时间段小于要使用的波长的一维光栅的微小凹凸结构,其中凹部到达透明基板和亚波长结构层之间的边界面; 以及开口部,形成在透明基板的亚波长结构层侧,以与微细结构的凹部连通并且与一维光栅的微小结构相同的周期配置。 至少在开孔部分,相对于入射光的折射率在与边界表面正交的方向上变化。
    • 3. 发明申请
    • OPTICAL ELEMENT AND OPTICAL DEVICE
    • 光学元件和光学器件
    • US20080106789A1
    • 2008-05-08
    • US11868048
    • 2007-10-05
    • Hideaki HiraiYoshiyuki KiyosawaKazuhiro UmekiYasuhiro Fujimura
    • Hideaki HiraiYoshiyuki KiyosawaKazuhiro UmekiYasuhiro Fujimura
    • G02B5/18
    • G02B5/1809G02B5/1866G02B5/3083
    • A disclosed optical element includes: a transparent substrate; a subwavelength structure layer disposed on the transparent substrate, the subwavelength structure layer having a refractive index different from a refractive index of the transparent substrate; a minute concave and convex structure of one-dimensional grating formed on the subwavelength structure layer with a subwavelength period smaller than a wavelength to be used, where a concave portion reaches a boundary surface between the transparent substrate and the subwavelength structure layer; and an open hole portion formed on a subwavelength structure layer side of the transparent substrate so as to communicate with the concave portion of the minute structure and to be arranged with the same period as in the minute structure of one-dimensional grating. At least at the open hole portion, a refractive index relative to an incident light is changed in a direction orthogonal to the boundary surface.
    • 所公开的光学元件包括:透明基板; 设置在所述透明基板上的亚波长结构层,所述亚波长结构层的折射率不同于所述透明基板的折射率; 形成在亚波长结构层上的亚波长时间段小于要使用的波长的一维光栅的微小凹凸结构,其中凹部到达透明基板和亚波长结构层之间的边界面; 以及开口部,形成在透明基板的亚波长结构层侧,以与微细结构的凹部连通并且与一维光栅的微小结构相同的周期配置。 至少在开孔部分,相对于入射光的折射率在与边界表面正交的方向上变化。
    • 4. 发明授权
    • Magnetic field probe having a shielding and isolating layers to protect lead wires extending between a coil and pads
    • 磁场探头具有屏蔽和隔离层,以保护在线圈和焊盘之间延伸的导线
    • US06483304B1
    • 2002-11-19
    • US09041041
    • 1998-03-12
    • Futoyoshi KouYoshiyuki Kiyosawa
    • Futoyoshi KouYoshiyuki Kiyosawa
    • G01R2908
    • G01R29/0878G01V3/10
    • A magnetic field probe includes a substrate and a conductive layer provided on the substrate. The conductive layer has a coil, lead wires, and pads. The coil has at least one turn and outputs a signal indicative of a magnetic field from a device under test in a vicinity of the magnetic field probe. The lead wires extend from the coil to the pads, the signal from the coil being transmitted to the pads through the lead wires. An isolating layer of a dielectric material is provided on the lead wires to protect the lead wires between the coil and the pads in the conductive layer. A shielding layer of a conductive material is provided on the isolating layer to protect the isolating layer. The shielding layer prevents distortion of the magnetic field at the lead wires in conjunction with the isolating layer.
    • 磁场探针包括衬底和设置在衬底上的导电层。 导电层具有线圈,引线和焊盘。 线圈具有至少一匝,并且在磁场探针附近输出表示来自被测器件的磁场的信号。 引线从线圈延伸到焊盘,来自线圈的信号通过引线传输到焊盘。 在导线上设置电介质材料的绝缘层,以保护引线在导体层中的线圈和焊盘之间。 在绝缘层上设置导电材料的屏蔽层以保护隔离层。 屏蔽层防止引线与隔离层结合的磁场变形。
    • 5. 发明授权
    • Magnetic field probe having a shielding layer to protect lead wires with an isolating layer
    • 磁场探头具有屏蔽层,用于保护引线与隔离层
    • US06696834B2
    • 2004-02-24
    • US10229215
    • 2002-08-28
    • Futoyoshi KouYoshiyuki Kiyosawa
    • Futoyoshi KouYoshiyuki Kiyosawa
    • G01R2908
    • G01R29/0878G01V3/10
    • A magnetic field probe includes a substrate and a conductive layer provided on the substrate. The conductive layer has a coil, lead wires, and pads. The coil has at least one turn and outputs a signal indicative of a magnetic field from a device under test in a vicinity of the magnetic field probe. The lead wires extend from the coil to the pads, the signal from the coil being transmitted to the pads through the lead wires. An isolating layer of a dielectric material is provided on the lead wires to protect the lead wires between the coil and the pads in the conductive layer. A shielding layer of a conductive material is provided on the isolating layer to protect the isolating layer. The shielding layer prevents distortion of the magnetic field at the lead wires in conjunction with the isolating layer.
    • 磁场探针包括衬底和设置在衬底上的导电层。 导电层具有线圈,引线和焊盘。 线圈具有至少一匝,并且在磁场探针附近输出表示来自被测器件的磁场的信号。 引线从线圈延伸到焊盘,来自线圈的信号通过引线传输到焊盘。 在导线上设置电介质材料的绝缘层,以保护引线在导体层中的线圈和焊盘之间。 在绝缘层上设置导电材料的屏蔽层以保护隔离层。 屏蔽层防止引线与隔离层结合的磁场变形。