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    • 9. 发明授权
    • Dual-modulation faraday rotation spectroscopy
    • 双调制法拉第旋转光谱
    • US08947663B2
    • 2015-02-03
    • US14215739
    • 2014-03-17
    • Yin WangGerard Wysocki
    • Yin WangGerard Wysocki
    • G01J4/00G01J4/04G01N21/21
    • G01N21/21G01J3/447G01N21/1717G01N2021/1727
    • A dual-modulation Faraday rotation spectroscopic (FRS) system is disclosed. The FRS system uses an FRS sample cell configured to subject a sample to a low frequency modulated magnetic field. The system includes a polarized laser light source configured to generate a high frequency wavelength-modulated light beam incident on the sample, the high frequency wavelength-modulated light beam being modulated at a higher frequency than the low frequency modulated magnetic field. A polarizer is configured to receive from the sample a transmitted light beam having a modulated polarization having a polarization rotation and translate the modulated polarization of the transmitted light beam into an intensity modulated beam. A photodetector is configured to detect the intensity modulated beam and generate a photodetector signal. A dual demodulator is coupled to the photodetector and is configured to demodulate the photodetector signal.
    • 公开了一种双调制法拉第旋转光谱(FRS)系统。 FRS系统使用被配置为使样本进入低频调制磁场的FRS采样单元。 该系统包括被配置为产生入射在样品上的高频波长调制光束的偏振激光光源,高频波长调制光束以比低频调制磁场更高的频率进行调制。 偏振器被配置为从样本接收具有具有偏振旋转的调制偏振的透射光束,并将透射光束的调制偏振转换成强度调制光束。 光电检测器被配置为检测强度调制光束并产生光电检测器信号。 双重解调器耦合到光电检测器并且被配置为解调光电检测器信号。
    • 10. 发明申请
    • Dual-Modulation Faraday Rotation Spectroscopy
    • 双调制法拉第旋转光谱
    • US20140268148A1
    • 2014-09-18
    • US14215739
    • 2014-03-17
    • Yin WangGerard Wysocki
    • Yin WangGerard Wysocki
    • G01J4/04G01N21/21
    • G01N21/21G01J3/447G01N21/1717G01N2021/1727
    • A dual-modulation Faraday rotation spectroscopic (FRS) system is disclosed. The FRS system uses an FRS sample cell configured to subject a sample to a low frequency modulated magnetic field. The system includes a polarized laser light source configured to generate a high frequency wavelength-modulated light beam incident on the sample, the high frequency wavelength-modulated light beam being modulated at a higher frequency than the low frequency modulated magnetic field. A polarizer is configured to receive from the sample a transmitted light beam having a modulated polarization having a polarization rotation and translate the modulated polarization of the transmitted light beam into an intensity modulated beam. A photodetector is configured to detect the intensity modulated beam and generate a photodetector signal. A dual demodulator is coupled to the photodetector and is configured to demodulate the photodetector signal.
    • 公开了一种双调制法拉第旋转光谱(FRS)系统。 FRS系统使用被配置为使样本进入低频调制磁场的FRS采样单元。 该系统包括被配置为产生入射在样品上的高频波长调制光束的偏振激光光源,高频波长调制光束以比低频调制磁场更高的频率进行调制。 偏振器被配置为从样本接收具有具有偏振旋转的调制偏振的透射光束,并将透射光束的调制偏振转换成强度调制光束。 光电检测器被配置为检测强度调制光束并产生光电检测器信号。 双重解调器耦合到光电检测器并且被配置为解调光电检测器信号。