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1. 发明申请

US20060289757A1 Electron beam system and electron beam measuring and observing methods 失效
公开(公告)号：US20060289757A1
公开(公告)日：2006-12-28
申请号：US11505872
申请日：2006-08-18
申请人： Nobuo Kochi , Hirotami Koike , Yasuko Tsuruga , Shinichi Okada
发明人： Nobuo Kochi , Hirotami Koike , Yasuko Tsuruga , Shinichi Okada
IPC分类号： G21K7/00
CPC分类号： H01J37/265 , H01J37/28 , H01J2237/221 , H01J2237/2611
摘要： To provide an electron beam system capable of performing three-dimensional measurement of a sample with high precision irrespective of the tilt angle and height of the sample. The electron beam system has a correction factor storing section 32 for storing a correction factor at a reference tilt angle with respect to a plane which is used to tilt a sample by a sample tilting section 5, an approximate coordinate measuring section 28 for obtaining an approximate shape or approximate coordinate values of the sample based on an output corresponding to a stereo image from an electron beam detecting section 4, an image correcting section 30 for correcting the stereo image according to the tilt angle created by the sample tilting section 5 based on the shape or coordinate values of the sample obtained in the approximate coordinate measuring section 28 using a correction factor stored in the correction factor storing section 32, and a precise coordinate measuring section 34 for obtaining a shape or coordinate values of the sample which are more precise than those obtained in the approximate coordinate measuring section 28 based on a corrected stereo image obtained in the image correcting section 30.

2. 发明授权

US07329867B2 Electron beam system and electron beam measuring and observing methods 失效
标题翻译：电子束系统和电子束测量和观测方法
公开(公告)号：US07329867B2
公开(公告)日：2008-02-12
申请号：US11505872
申请日：2006-08-18
申请人： Nobuo Kochi , Hirotami Koike , Yasuko Tsuruga , Shinichi Okada
发明人： Nobuo Kochi , Hirotami Koike , Yasuko Tsuruga , Shinichi Okada
IPC分类号： H01J37/28
CPC分类号： H01J37/265 , H01J37/28 , H01J2237/221 , H01J2237/2611
摘要： To provide an electron beam system capable of performing three-dimensional measurement of a sample with high precision irrespective of the tilt angle and height of the sample. The electron beam system has a correction factor storing section 32 for storing a correction factor at a reference tilt angle with respect to a plane which is used to tilt a sample by a sample tilting section 5, an approximate coordinate measuring section 28 for obtaining an approximate shape or approximate coordinate values of the sample based on an output corresponding to a stereo image from an electron beam detecting section 4, an image correcting section 30 for correcting the stereo image according to the tilt angle created by the sample tilting section 5 based on the shape or coordinate values of the sample obtained in the approximate coordinate measuring section 28 using a correction factor stored in the correction factor storing section 32, and a precise coordinate measuring section 34 for obtaining a shape or coordinate values of the sample which are more precise than those obtained in the approximate coordinate measuring section 28 based on a corrected stereo image obtained in the image correcting section 30.
摘要翻译：提供能够以高精度执行样品的三维测量的电子束系统，而与样品的倾斜角度和高度无关。电子束系统具有校正因子存储部分32，用于存储相对于用于通过样本倾斜部分5倾斜样本的平面的参考倾斜角的校正因子，用于获得近似坐标测量部分28的近似坐标测量部分28 基于与来自电子束检测部分4的立体图像相对应的输出的样本的形状或近似坐标值，用于根据由样本倾斜部分5产生的倾斜角校正立体图像的图像校正部分30 使用存储在校正因子存储部分32中的校正因子在近似坐标测量部分28中获得的样本的形状或坐标值，以及精确坐标测量部分34，用于获得样本的形状或坐标值，其比基于所获得的校正立体图像在近似坐标测量部分28中获得的那些在图像校正部30中。

3. 发明授权

US06959227B2 Lens layout setting apparatus for lens grinding process and display apparatus for the same 失效
标题翻译：用于透镜研磨处理的透镜布局设定装置及其显示装置
公开(公告)号：US06959227B2
公开(公告)日：2005-10-25
申请号：US10761737
申请日：2004-01-21
申请人： Hiroyuki Okada , Mitsuo Ishii , Jun Onose , Takahiro Watanabe , Toshihiro Iwai , Akihiro Harada , Yasuko Tsuruga
发明人： Hiroyuki Okada , Mitsuo Ishii , Jun Onose , Takahiro Watanabe , Toshihiro Iwai , Akihiro Harada , Yasuko Tsuruga
IPC分类号： B24B9/14 , B24B19/03 , G06F19/00
CPC分类号： B24B19/03 , B24B9/144
摘要： A lens layout setting apparatus for lens grinding processing apparatus having a display screen of a display device for various settings for processing data of eyeglass lens shape for an eyeglass frame, and data of lens grinding process to grind the lens based on the data of lens shape for the frame, further including a control means to add, delete or rearrange a setting condition. The display device displays data of eyeglass lens shape for an eyeglass frame, and of eyeglass lens grinding process required for grinding the lens based on the data, and further displays tabs arranged to display a layout operating screen to set a layout of the data of lens shape for the frame, a state of measuring an edge thickness of the lens, simulation of the shape of a V-shaped protrusion formed on an edge of the lens, and a grinding process screen.
摘要翻译：一种用于透镜研磨处理设备的透镜布置设置装置，具有用于处理用于眼镜框架的眼镜镜片形状的数据的各种设置的显示装置的显示屏以及根据透镜形状的数据研磨透镜的透镜研磨处理装置的数据对于该帧，还包括用于添加，删除或重新排列设置条件的控制装置。显示装置显示眼镜框架的眼镜镜片形状的数据和根据数据研磨透镜所需的眼镜镜片研磨处理，并且还显示布置成显示布局操作画面的标签，以设置透镜数据的布局用于框架的形状，测量透镜的边缘厚度的状态，形成在透镜的边缘上的V形突起的形状的模拟以及研磨处理屏幕。

4. 发明授权

US07539340B2 Apparatus and method for three-dimensional coordinate measurement 失效
标题翻译：用于三维坐标测量的装置和方法
公开(公告)号：US07539340B2
公开(公告)日：2009-05-26
申请号：US10830456
申请日：2004-04-23
申请人： Nobuo Kochi , Yasuko Tsuruga
发明人： Nobuo Kochi , Yasuko Tsuruga
IPC分类号： G06K9/00
CPC分类号： H01J37/28 , G01B15/04 , G06K9/209 , G06K2209/19 , G06T7/593 , H01J37/265 , H01J2237/2611
摘要： A three-dimensional coordinate measuring apparatus has a first and second incident angle adjusting sections for adjusting the attitude of the object in the directions of first and second neutral axes, respectively, to adjust the incident angle of the beam projected on the object from an imaging optical system relative to the object so that first and second stereoscopic images of the object can be formed, a matching process section for searching for corresponding points corresponding to measurement points in first and second search directions generally perpendicular to the first and second neutral axes, respectively, in the first and second stereoscopic images, and a shape measuring section for obtaining three-dimensional coordinate data of the object based on the relation between the measurement points and the corresponding points in the first and second stereoscopic images.
摘要翻译：三维坐标测量装置具有第一和第二入射角调节部分，用于分别调节物体在第一和第二中立轴线方向上的姿态，以调整投射在物体上的光束的入射角度与成像光学系统相对于物体，从而可以形成物体的第一和第二立体图像;匹配处理部分，用于分别搜索与第一和第二中立轴线大致垂直的第一和第二搜索方向上的测量点对应的点以及形状测量部分，用于基于第一和第二立体图像中的测量点和对应点之间的关系来获得对象的三维坐标数据。

5. 发明申请

US20070002276A1 Apparatus and method for measuring spectrum image data of eyeground 有权
标题翻译：用于测量眼底光谱图像数据的装置和方法
公开(公告)号：US20070002276A1
公开(公告)日：2007-01-04
申请号：US11292277
申请日：2005-12-02
申请人： Yoko Hirohara , Tatsuo Yamaguchi , Toshifumi Mihashi , Hiroyuki Aoki , Yasuko Tsuruga
发明人： Yoko Hirohara , Tatsuo Yamaguchi , Toshifumi Mihashi , Hiroyuki Aoki , Yasuko Tsuruga
IPC分类号： A61B3/14 , A61B3/10
CPC分类号： A61B3/152 , A61B3/0025 , A61B5/14555
摘要： The object of the invention is to provide a favorable spectral characteristic that reduces variation depending on the frequency of received light intensity, and that is gentle on a subject eye. It also eliminates displacement between positions of respective spectral images of the same part even if a change in alignment occurs between the eye and apparatus with the lapse of time. An apparatus 1 for measuring spectral fundus image data of this invention comprises: an illumination optical system 10 having an illumination light source 11 that emits a light beam in a specified wavelength range; a light receiving optical system 20 for forming a fundus image on the light receiving surface of a photographing section 4; a liquid crystal wavelength tunable filter 32 capable of choosing a wavelength of a transmitted light beam in a specified wavelength range; a spectral characteristic correction filter 13 having wavelength characteristic for correcting the wavelength characteristic of the emitted light intensity of the illumination light source 11 and the transmission wavelength characteristic of the wavelength tunable filter 32 so that the received light intensity on the light receiving surface is kept within the specified range; and a data measuring section 7 for taking the spectral fundus image data from the light receiving surface while changing the wavelength of the light beam passing through the wavelength tunable filter 32.
摘要翻译：本发明的目的是提供一种有利的光谱特性，其可以根据接收的光强度的频率减小变化，并且对被摄体的眼睛是温和的。即使随着时间的推移在眼睛和装置之间发生对准改变，也消除了相同部分的各个光谱图像的位置之间的位移。用于测量本发明的光谱眼底图像数据的装置1包括：照明光学系统10，其具有发射特定波长范围内的光束的照明光源11; 用于在拍摄部分4的光接收表面上形成眼底图像的光接收光学系统20; 能够选择特定波长范围内的透射光束的波长的液晶波长可调滤波器32; 具有用于校正照明光源11的发射光强度的波长特性和波长可调滤光器32的透射波长特性的波长特性的光谱特性校正滤光器13，使得受光面上的接收光强度保持在指定范围; 以及数据测量部分7，用于在改变通过波长可调滤波器32的光束的波长的同时从光接收表面获取光谱眼底图像数据。

6. 发明授权

US07151258B2 Electron beam system and electron beam measuring and observing methods 失效
标题翻译：电子束系统和电子束测量和观测方法
公开(公告)号：US07151258B2
公开(公告)日：2006-12-19
申请号：US10897434
申请日：2004-07-23
申请人： Nobuo Kochi , Hirotami Koike , Yasuko Tsuruga , Shinichi Okada
发明人： Nobuo Kochi , Hirotami Koike , Yasuko Tsuruga , Shinichi Okada
IPC分类号： H01J37/28
CPC分类号： H01J37/265 , H01J37/28 , H01J2237/221 , H01J2237/2611
摘要： To provide an electron beam system capable of performing three-dimensional measurement of a sample with high precision irrespective of the tilt angle and height of the sample. The electron beam system has a correction factor storing section 32 for storing a correction factor at a reference tilt angle with respect to a plane which is used to tilt a sample by a sample tilting section 5, an approximate coordinate measuring section 28 for obtaining an approximate shape or approximate coordinate values of the sample based on an output corresponding to a stereo image from an electron beam detecting section 4, an image correcting section 30 for correcting the stereo image according to the tilt angle created by the sample tilting section 5 based on the shape or coordinate values of the sample obtained in the approximate coordinate measuring section 28 using a correction factor stored in the correction factor storing section 32, and a precise coordinate measuring section 34 for obtaining a shape or coordinate values of the sample which are more precise than those obtained in the approximate coordinate measuring section 28 based on a corrected stereo image obtained in the image correcting section 30.
摘要翻译：提供能够以高精度执行样品的三维测量的电子束系统，而与样品的倾斜角度和高度无关。电子束系统具有校正因子存储部分32，用于存储相对于用于通过样本倾斜部分5倾斜样本的平面的参考倾斜角的校正因子，用于获得近似坐标测量部分28的近似坐标测量部分28 基于与来自电子束检测部分4的立体图像相对应的输出的样本的形状或近似坐标值，用于根据由样本倾斜部分5产生的倾斜角校正立体图像的图像校正部分30 使用存储在校正因子存储部分32中的校正因子在近似坐标测量部分28中获得的样本的形状或坐标值，以及精确坐标测量部分34，用于获得样本的形状或坐标值，其比基于所获得的校正立体图像在近似坐标测量部分28中获得的那些在图像校正部30中。

7. 发明申请

US20050061972A1 Electron beam system and electron beam measuring and observing methods 失效
标题翻译：电子束系统和电子束测量和观测方法
公开(公告)号：US20050061972A1
公开(公告)日：2005-03-24
申请号：US10897434
申请日：2004-07-23
申请人： Nobuo Kochi , Hirotami Koike , Yasuko Tsuruga , Shinichi Okada
发明人： Nobuo Kochi , Hirotami Koike , Yasuko Tsuruga , Shinichi Okada
IPC分类号： H01J37/28 , G01N23/00
CPC分类号： H01J37/265 , H01J37/28 , H01J2237/221 , H01J2237/2611
摘要： To provide an electron beam system capable of performing three-dimensional measurement of a sample with high precision irrespective of the tilt angle and height of the sample. The electron beam system has a correction factor storing section 32 for storing a correction factor at a reference tilt angle with respect to a plane which is used to tilt a sample by a sample tilting section 5, an approximate coordinate measuring section 28 for obtaining an approximate shape or approximate coordinate values of the sample based on an output corresponding to a stereo image from an electron beam detecting section 4, an image correcting section 30 for correcting the stereo image according to the tilt angle created by the sample tilting section 5 based on the shape or coordinate values of the sample obtained in the approximate coordinate measuring section 28 using a correction factor stored in the correction factor storing section 32, and a precise coordinate measuring section 34 for obtaining a shape or coordinate values of the sample which are more precise than those obtained in the approximate coordinate measuring section 28 based on a corrected stereo image obtained in the image correcting section 30.
摘要翻译：提供能够以高精度执行样品的三维测量的电子束系统，而与样品的倾斜角度和高度无关。电子束系统具有校正因子存储部分32，用于存储相对于用于通过样本倾斜部分5倾斜样本的平面的参考倾斜角的校正因子，用于获得近似坐标测量部分28的近似坐标测量部分28 基于与来自电子束检测部分4的立体图像相对应的输出的样本的形状或近似坐标值，用于根据由样本倾斜部分5产生的倾斜角校正立体图像的图像校正部分30 使用存储在校正因子存储部分32中的校正因子在近似坐标测量部分28中获得的样本的形状或坐标值，以及精确坐标测量部分34，用于获得样本的形状或坐标值，其比在近似坐标测量部分28中基于经校正的立体图像获得的那些图像校正部30。

8. 发明授权

US06751522B2 Lens layout setting apparatus for lens grinding process and display apparatus for the same 有权
标题翻译：用于透镜研磨处理的透镜布局设定装置及其显示装置
公开(公告)号：US06751522B2
公开(公告)日：2004-06-15
申请号：US09941483
申请日：2001-08-29
申请人： Hiroyuki Okada , Mitsuo Ishii , Jun Onose , Takahiro Watanabe , Toshihiro Iwai , Akihiro Harada , Yasuko Tsuruga
发明人： Hiroyuki Okada , Mitsuo Ishii , Jun Onose , Takahiro Watanabe , Toshihiro Iwai , Akihiro Harada , Yasuko Tsuruga
IPC分类号： G06F1900
CPC分类号： B24B19/03 , B24B9/144
摘要： A lens layout display apparatus for lens grinding processing apparatus having a display screen on which is displayed data of eyeglass lens shape for an eyeglass frame, and data of eyeglass lens grinding process to grind the eyeglass lens based on the data of eyeglass lens shape for an eyeglass frame, the display means also displaying various icons which show a state of measuring an edge thickness of the eyeglass lens, a state of simulation of the shape of a V-shaped protrusion formed on an edge of the eyeglass lens, a state processing the edge portion of the eyeglass lens, and a completion of the grinding process of an eyeglass lens.
摘要翻译：一种透镜研磨处理装置，具有显示画面，其上显示眼镜框架的眼镜镜片形状的数据，以及根据眼镜镜片形状的数据研磨眼镜镜片研磨工序的数据，所述显示装置还显示出显示测量眼镜镜片的边缘厚度的状态的各种图标，形成在眼镜镜片的边缘上的V形突起的形状的模拟状态，眼镜镜片的边缘部分，以及眼镜镜片的研磨过程的完成。

9. 发明授权

US07850305B2 Apparatus and method for measuring spectrum image data of eyeground 有权
标题翻译：用于测量眼底光谱图像数据的装置和方法
公开(公告)号：US07850305B2
公开(公告)日：2010-12-14
申请号：US11292277
申请日：2005-12-02
申请人： Yoko Hirohara , Tatsuo Yamaguchi , Toshifumi Mihashi , Hiroyuki Aoki , Yasuko Tsuruga
发明人： Yoko Hirohara , Tatsuo Yamaguchi , Toshifumi Mihashi , Hiroyuki Aoki , Yasuko Tsuruga
IPC分类号： A61B3/14 , A61B3/10
CPC分类号： A61B3/152 , A61B3/0025 , A61B5/14555
摘要： The object of the invention is to provide a favorable spectral characteristic that reduces variation depending on the frequency of received light intensity, and that is gentle on a subject eye. It also eliminates displacement between positions of respective spectral images of the same part even if a change in alignment occurs between the eye and apparatus with the lapse of time. An apparatus 1 for measuring spectral fundus image data of this invention comprises: an illumination optical system 10 having an illumination light source 11 that emits a light beam in a specified wavelength range; a light receiving optical system 20 for forming a fundus image on the light receiving surface of a photographing section 4; a liquid crystal wavelength tunable filter 32 capable of choosing a wavelength of a transmitted light beam in a specified wavelength range; a spectral characteristic correction filter 13 having wavelength characteristic for correcting the wavelength characteristic of the emitted light intensity of the illumination light source 11 and the transmission wavelength characteristic of the wavelength tunable filter 32 so that the received light intensity on the light receiving surface is kept within the specified range; and a data measuring section 7 for taking the spectral fundus image data from the light receiving surface while changing the wavelength of the light beam passing through the wavelength tunable filter 32.
摘要翻译：本发明的目的是提供一种有利的光谱特性，其可以根据接收的光强度的频率减小变化，并且对被摄体的眼睛是温和的。即使随着时间的推移在眼睛和装置之间发生对准改变，也消除了相同部分的各个光谱图像的位置之间的位移。用于测量本发明的光谱眼底图像数据的装置1包括：照明光学系统10，其具有发射特定波长范围内的光束的照明光源11; 用于在拍摄部分4的光接收表面上形成眼底图像的光接收光学系统20; 能够选择特定波长范围内的透射光束的波长的液晶波长可调滤波器32; 具有用于校正照明光源11的发射光强度的波长特性和波长可调滤光器32的透射波长特性的波长特性的光谱特性校正滤光器13，使得受光面上的接收光强度保持在指定范围; 以及数据测量部分7，用于在改变通过波长可调滤波器32的光束的波长的同时从光接收表面获取光谱眼底图像数据。

10. 发明申请

US20080007692A1 Apparatus and method for spectrally measuring fundus 审中-公开
标题翻译：用于光学测量眼底的装置和方法
公开(公告)号：US20080007692A1
公开(公告)日：2008-01-10
申请号：US11812081
申请日：2007-06-14
申请人： Toshifumi Mihashi , Yoko Hirohara , Hiroyuki Aoki , Yasuko Tsuruga
发明人： Toshifumi Mihashi , Yoko Hirohara , Hiroyuki Aoki , Yasuko Tsuruga
IPC分类号： A61B3/14
CPC分类号： A61B3/10
摘要： To provide a spectroscopic fundus measuring apparatus capable of identifying each part in spectral fundus images easily and accurately based on its spectral characteristic and a measuring method therefor. A spectral fundus image measuring apparatus 1 of the present invention includes: an illumination optical system 10 having an illumination light source 11 for illuminating a fundus; a light receiving optical system 20 for receiving a wavelength-tunable light beam reflected from the illuminated fundus to photograph a series of spectral fundus images of different wavelengths; an image processing section 7 for processing the spectral fundus images; a storage section 7A for storing the spectral fundus images; and a display section 7B for displaying the spectral fundus images. The image processing section 7 has a position correcting section 72 for correcting the series of spectral fundus images photographed by the light receiving optical system 20 to match the positions of the same parts therein, and an image extracting section 74 for extracting spectral fundus images in wavelength ranges predetermined for respective specific parts from the series of spectral fundus images corrected in the position correcting section 72.
摘要翻译：提供一种能够基于其光谱特性容易且准确地识别光谱眼底图像中的每个部分的光谱眼底测量装置及其测量方法。本发明的光谱眼底图像测量装置1包括：具有用于照射眼底的照明光源11的照明光学系统10; 光接收光学系统20，用于接收从发光眼睛反射的波长可调光束，以拍摄不同波长的一系列光谱眼底图像; 用于处理光谱眼底图像的图像处理部分7; 用于存储频谱眼底图像的存储部分7A; 以及用于显示频谱眼底图像的显示部分7B。图像处理部分7具有位置校正部分72，用于校正由光接收光学系统20拍摄的一系列光谱眼底图像，以匹配其中相同部分的位置;以及图像提取部分74，用于提取波长的光谱眼底图像从位置校正部分72中校正的一系列频谱眼底图像中的各个特定部分预定的范围。

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