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1. 发明授权

US06496433B2 Semiconductor device and semiconductor device testing method 失效
标题翻译：半导体器件和半导体器件测试方法
公开(公告)号：US06496433B2
公开(公告)日：2002-12-17
申请号：US09756198
申请日：2001-01-09
申请人： Yasuhiro Okumura , Yoshitaka Takahashi , Akihiro Funyu
发明人： Yasuhiro Okumura , Yoshitaka Takahashi , Akihiro Funyu
IPC分类号： G11C700
CPC分类号： G11C29/46 , G11C29/14
摘要： A semiconductor device has a normal mode and a test mode for testing the semiconductor device, and is provided with a first circuit which receives an input signal, a test signal and an output enable signal, and outputs the input signal in response to the output enable signal, a second circuit which is coupled to the first circuit and outputs the input signal obtained from the first circuit, and power supply pads which receive a power supply voltage which is supplied in common to the first circuit and the second circuit. The first circuit fixes an output impedance of the second circuit to a high-impedance regardless of the output enable signal when the test signal indicates the test mode.
摘要翻译：半导体器件具有用于测试半导体器件的正常模式和测试模式，并且具有接收输入信号，测试信号和输出使能信号的第一电路，并响应于输出使能输出输入信号信号，耦合到第一电路并输出从第一电路获得的输入信号的第二电路以及接收向第一电路和第二电路共同提供的电源电压的电源焊盘。当测试信号指示测试模式时，第一电路将第二电路的输出阻抗固定为高阻抗，而与输出使能信号无关。

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