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    • 1. 发明申请
    • METHOD AND APPARATUS FOR MEASURING REFRACTIVE INDEX
    • 用于测量折射率的方法和装置
    • WO2012129168A1
    • 2012-09-27
    • PCT/US2012/029670
    • 2012-03-19
    • CANON KABUSHIKI KAISHAYU, Chung-Chieh
    • YU, Chung-Chieh
    • G01N21/41
    • G01N21/45
    • A method and apparatus for measuring refractive index of an object are disclosed. The method includes, acquiring a number of first fringes of a first interference pattern formed by interference of a first beam of light transmitted through the object with a second beam of light not transmitted through the object; acquiring a number of second fringes of a second interference pattern formed by interference of a third beam of light reflected from a first surface of the object with a fourth beam of light transmitted through the object and reflected from a second surface of the object; and calculating the refractive index of the object based on the number of first fringes and the number of second fringes. The method may further include calculating the Abbe number of the object based on the refractive indices of the object measured at different wavelengths.
    • 公开了一种用于测量物体的折射率的方法和装置。 该方法包括:获取由透过物体的第一光束的干涉而形成的第一干涉图案的第一条纹和不透过物体的第二光束; 获取第二干涉图案的第二条纹,所述第二干涉图案由从所述物体的第一表面反射的第三光束的干涉与透射通过所述物体并从所述物体的第二表面反射的第四光束形成; 并且基于第一条纹的数量和第二条纹的数量来计算物体的折射率。 该方法还可以包括基于在不同波长处测量的物体的折射率来计算物体的阿贝数。