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    • 10. 发明申请
    • EVANESCENT MICROWAVE PROBE WITH ENHANCED RESOLUTION AND SENSITIVITY
    • 具有增强分辨率和灵敏度的EVANESCENT MICROWAVE探头
    • WO2006017249A2
    • 2006-02-16
    • PCT/US2005024597
    • 2005-07-12
    • INTEMATIX CORPXIANG XIAO-DONGYANG HAITAOWANG GANG
    • XIANG XIAO-DONGYANG HAITAOWANG GANG
    • C12Q1/68
    • G01Q10/065G01Q60/22
    • Novel systems of an evanescent microwave probe (EWP) are disclosed, which enable measurements of physical properties of a sample with enhanced sensitivity and resolution, simultaneously. In one embodiment, new shielding features are added to the probe (which may be of either a sharpened tip or loop configuration) to reduce the effects of residual far field radiation, while maintaining the probe section that extends beyond the shielding aperture of the resonator. To further increase the sensitivity of the instrument, an automatic gain-controlled active feedback loop system may be added to the probe resonator to form a self-oscillator. This new active circuit feature significantly increases the effective Q of the resonator probe, enhancing the sensitivity of both the frequency and Q measurement.
    • 公开了一种ev逝微波探测器(EWP)的新型系统,可同时测量具有增强灵敏度和分辨率的样品的物理性能。 在一个实施例中,将新的屏蔽特征添加到探头(其可以是尖锐的尖端或环形配置)以减少残余远场辐射的影响,同时保持探头部分延伸超出谐振器的屏蔽孔径。 为了进一步增加仪器的灵敏度,可以将自动增益控制的主动反馈回路系统添加到探头谐振器中以形成自振荡器。 这种新的有源电路特征显着增加了谐振器探头的有效Q,提高了频率和Q测量的灵敏度。