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1. 发明申请

US20120105624A1 METHOD AND DEVICE FOR DEFECT INSPECTION IN SEPARATED TRANSPARENT AND/OR SEMI-TRANSPARENT BODY 审中-公开
标题翻译：分离透明和/或半透明体内缺陷检查的方法和装置
公开(公告)号：US20120105624A1
公开(公告)日：2012-05-03
申请号：US13381422
申请日：2010-07-02
申请人： Xiaofeng Lin , Jean-Philippe Schweitzer , Huifen Li , Wenhua Deng , Haifeng Chen , Dazhi Chen
发明人： Xiaofeng Lin , Jean-Philippe Schweitzer , Huifen Li , Wenhua Deng , Haifeng Chen , Dazhi Chen
IPC分类号： H04N7/18
CPC分类号： G01N21/958 , G01N21/9009
摘要： An apparatus and a method for detecting a defect of a separated low rigidity transparent or translucent body, wherein an image acquiring device includes: a first conveyer and a second conveyer to convey a separated low rigidity transparent or translucent body; a transparent bridge disposed between a first conveyer and a second conveyer along a transport path of the separated low rigidity transparent or translucent body, the transparent bridge having a top surface; an illuminating unit disposed on one side of the transparent bridge and configured to project diffusive light onto the top surface of the transparent bridge by transmitting through the transparent bridge; and an image pickup unit disposed on the other side of the transparent bridge and configured to receive light projected from the illuminating unit and transmitting through the separated low rigidity transparent or translucent body to form an image when the separated low rigidity transparent or translucent body enters the top surface of the transparent bridge. With the apparatus and the method, it is possible to detect a defect of the separated low rigidity transparent or translucent body.
摘要翻译：一种用于检测分离的低刚性透明或半透明体的缺陷的装置和方法，其中图像获取装置包括：第一传送器和第二传送器，用于传送分离的低刚性透明或半透明体; 透明桥，其沿着分离的低刚性透明或半透明体的输送路径设置在第一输送机和第二输送机之间，透明桥具有顶表面; 照明单元，其设置在所述透明桥的一侧，并且被配置为通过透过所述透明桥将漫射光投射到所述透明桥的顶表面上; 以及图像拾取单元，其设置在所述透明桥的另一侧，并且被配置为接收从所述照明单元投影的光并且在所分离的低刚性透明或半透明体进入所述透明半导体时透过所述分离的低刚性透明体或半透明体形成图像透明桥顶面。利用该装置和方法，可以检测分离的低刚性透明或半透明体的缺陷。

2. 发明授权

US08958063B2 Illumination system for detecting the defect in a transparent substrate and a detection system including the same 有权
标题翻译：用于检测透明基板中的缺陷的照明系统和包括其的检测系统
公开(公告)号：US08958063B2
公开(公告)日：2015-02-17
申请号：US14369384
申请日：2011-12-31
申请人： Xiaofeng Guo , Huifen Li , Xiaofeng Lin , Xiaowei Sun , Wenhua Deng
发明人： Xiaofeng Guo , Huifen Li , Xiaofeng Lin , Xiaowei Sun , Wenhua Deng
IPC分类号： G01N21/00 , G01N21/88 , G01N21/958 , F21K99/00 , F21Y103/00
CPC分类号： G01N21/8806 , F21K9/27 , F21Y2103/10 , F21Y2115/10 , G01N21/896 , G01N21/958 , G01N2021/8816 , G01N2201/0633 , G01N2201/105
摘要： An illumination device for providing near isotropic illumination, and particularly an illumination system for detecting the defect in a transparent substrate and a detection system including the same are presented. An illumination system includes: an illumination system for detecting the defect in a transparent substrate, including light source receptacle in bar shape; first spot light sources, each emitting a respective first light, the respective first lights being substantially parallel to each other and the first spot light sources being arranged to a first line of spot light sources along the longitudinal direction of the receptacle; and second spot light sources, each emitting a respective second light, the respective second lights being substantially parallel to each other and the second spot light sources being arranged to a second line of spot light sources along the longitudinal direction of the receptacle.
摘要翻译：提供一种用于提供近似各向同性照明的照明装置，特别是用于检测透明基板中的缺陷的照明系统和包括该照明装置的检测系统。照明系统包括：用于检测透明基板中的缺陷的照明系统，包括条形光源容器; 第一点光源，每个发射各自的第一光，各个第一光基本上彼此平行，并且第一点光源沿着插座的纵向布置到第一线点光源; 以及第二点光源，每个发射各自的第二光，所述各个第二光基本上彼此平行，并且所述第二点光源沿着所述插座的纵向布置到第二线点光源。

3. 发明申请

US20140347657A1 ILLUMINATION SYSTEM FOR DETECTING THE DEFECT IN A TRANSPARENT SUBSTRATE AND A DETECTION SYSTEM INCLUDING THE SAME 有权
标题翻译：用于检测透明基板中的缺陷的照明系统和包括其的检测系统
公开(公告)号：US20140347657A1
公开(公告)日：2014-11-27
申请号：US14369384
申请日：2011-12-31
申请人： Xiaofeng Guo , Huifen Li , Xiaofeng Lin , Xiaowei Sun , Wenhua Deng
发明人： Xiaofeng Guo , Huifen Li , Xiaofeng Lin , Xiaowei Sun , Wenhua Deng
IPC分类号： G01N21/88 , F21K99/00 , G01N21/958
CPC分类号： G01N21/8806 , F21K9/27 , F21Y2103/10 , F21Y2115/10 , G01N21/896 , G01N21/958 , G01N2021/8816 , G01N2201/0633 , G01N2201/105
摘要： An illumination device for providing near isotropic illumination, and particularly an illumination system for detecting the defect in a transparent substrate and a detection system including the same are presented, An illumination system includes: an illumination system for detecting the defect in a transparent substrate, including light source receptacle in bar shape; first spot light sources, each emitting a respective first light, the respective first lights being substantially parallel to each other and the first spot light sources being arranged to a first line of spot light sources along the longitudinal direction of the receptacle; and second spot light sources, each emitting a respective second light, the respective second lights being substantially parallel to each other and the second spot light sources being arranged to a second line of spot light sources along the longitudinal direction of the receptacle.
摘要翻译：一种用于提供近似各向同性照明的照明装置，特别是用于检测透明基板中的缺陷的照明系统和包括其的检测系统。一种照明系统，包括：用于检测透明基板中的缺陷的照明系统，包括光源插座为棒状; 第一点光源，每个发射各自的第一光，各个第一光基本上彼此平行，并且第一点光源沿着插座的纵向布置到第一线点光源; 以及第二点光源，每个发射各自的第二光，所述各个第二光基本上彼此平行，并且所述第二点光源沿着所述插座的纵向布置到第二线点光源。

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