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    • 4. 发明授权
    • Particle analyzer for analyzing particles
    • 用于分析颗粒的粒子分析仪
    • US09207159B2
    • 2015-12-08
    • US13326188
    • 2011-12-14
    • Wenheng GuoJin TengYingjian ZhanShuang ZhouHuilin Shi
    • Wenheng GuoJin TengYingjian ZhanShuang ZhouHuilin Shi
    • G01N33/00G01N31/00G01N15/14G01N35/00
    • G01N15/14G01N35/00G01N2015/1486
    • A particle analyzer may include a sampling unit configured to collect samples containing particles; a sample preparing unit configured to prepare different sub-samples; a reaction unit configured to incubate the sub-samples and one or more corresponding reagents respectively and provide them to the injecting unit; an injecting unit configured to inject the sub-samples to the optical unit; an optical unit configured to irradiate the sub-samples to obtain particle information; a processing unit configured to process and output the particle information; and a threshold value unit configured to compare a total number of particles with a pre-determined threshold value and to output a result of the comparison to the injecting unit to control subsequent injection of one or more sub-samples.
    • 粒子分析仪可以包括:采集单元,被配置为收集含有颗粒的样品; 配置成准备不同子样本的样品制备单元; 反应单元,被配置为分别孵育子样品和一种或多种相应的试剂并将其提供给注射单元; 注入单元,被配置为将所述子样本注入所述光学单元; 光学单元,被配置为照射所述子样本以获得粒子信息; 处理单元,被配置为处理和输出所述粒子信息; 以及阈值单元,被配置为将粒子的总数与预定阈值进行比较,并且将所述比较的结果输出到所述注入单元,以控制一个或多个子样本的后续注入。
    • 5. 发明申请
    • PARTICLE ANALYZER AND METHOD FOR ANALYZING PARTICLES
    • 颗粒分析仪和分析颗粒的方法
    • US20120171659A1
    • 2012-07-05
    • US13326188
    • 2011-12-14
    • Wenheng GuoJin TengYingjian ZhanShuang ZhouHuilin Shi
    • Wenheng GuoJin TengYingjian ZhanShuang ZhouHuilin Shi
    • C12Q3/00C12M1/36
    • G01N15/14G01N35/00G01N2015/1486
    • A particle analyzer may include a sampling unit configured to collect samples containing particles; a sample preparing unit configured to prepare different sub-samples; a reaction unit configured to incubate the sub-samples and one or more corresponding reagents respectively and provide them to the injecting unit; an injecting unit configured to inject the sub-samples to the optical unit; an optical unit configured to irradiate the sub-samples to obtain particle information; a processing unit configured to process and output the particle information; and a threshold value unit configured to compare a total number of particles with a pre-determined threshold value and to output a result of the comparison to the injecting unit to control subsequent injection of one or more sub-samples.
    • 粒子分析仪可以包括:采集单元,被配置为收集含有颗粒的样品; 配置成准备不同子样本的样品制备单元; 反应单元,被配置为分别孵育子样品和一种或多种相应的试剂并将其提供给注射单元; 注入单元,被配置为将所述子样本注入所述光学单元; 光学单元,被配置为照射所述子样本以获得粒子信息; 处理单元,被配置为处理和输出所述粒子信息; 以及阈值单元,被配置为将粒子的总数与预定阈值进行比较,并且将所述比较的结果输出到所述注入单元,以控制一个或多个子样本的后续注入。