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    • 5. 发明授权
    • Method of making emitter regions by implantation through a
non-monocrystalline layer
    • 通过非单晶层注入制造发射极区域的方法
    • US4452645A
    • 1984-06-05
    • US242961
    • 1981-03-12
    • Wei-Kan ChuIngrid E. MagdoHans S. Rupprecht
    • Wei-Kan ChuIngrid E. MagdoHans S. Rupprecht
    • H01L21/265H01L21/324H01L29/08H01L21/225
    • H01L29/0804H01L21/265H01L21/324Y10S148/039Y10S148/047Y10S148/117Y10S148/124
    • A transistor structure is provided with an emitter which is formed from non-monocrystalline silicon which is caused to be converted to monocrystalline silicon during the manufacture of the transistor. In the process of manufacturing the present semiconductor structure, a subcollector is formed in a semiconductor substrate. The subcollector dopant out diffuses into a subsequently deposited epitaxial layer. A base region is formed in the epitaxial layer of a conductivity type opposite that of the conductivity type of the subcollector. This results in a PN junction between the base region and the out diffused subcollector impurities forming the collector of the transistor.A layer of non-monocrystalline silicon is deposited on the epitaxial layer. At least a portion of the non-monocrystalline silicon forms a precursor for an emitter region which is contiguous to but vertically displaced from the surface of the base region. The emitter precursor is then bombarded with ions of a conductivity type that is the same as the conductivity type of the subcollector. The ion bombardment is at a dose and energy level sufficient to displace a portion of the Gaussian distribution of the ions across the interface between the non-monocrystalline layer and the epitaxial layer and into the base region. Thereafter, the structure is annealed by suitable means to drive a portion of the ions deeper into the base region and to convert the non-monocrystalline silicon of the emitter precursor into a monocrystalline emitter region.
    • 晶体管结构设置有由非单晶硅形成的发射极,其在晶体管的制造期间被引入单晶硅。 在制造本半导体结构的过程中,在半导体衬底中形成子集电极。 子集电极掺杂剂扩散到随后沉积的外延层中。 在与子集电极的导电类型相反的导电类型的外延层中形成基极区。 这导致形成晶体管的集电极的基极区域和出射扩散的子集电极杂质之间的PN结。 一层非单晶硅沉积在外延层上。 非单晶硅的至少一部分形成与基底区域的表面相邻但垂直移位的发射极区域的前体。 然后用与子集电极的导电类型相同的导电类型的离子轰击发射体前体。 离子轰击处于足以将离子的高斯分布的一部分移动穿过非单晶层和外延层之间的界面并进入基极区域的剂量和能级。 此后,通过合适的方式对该结构进行退火以将一部分离子驱动到基极区域中,并将发射极前体的非单晶硅转换为单晶发射极区域。
    • 9. 发明授权
    • Explosives detection by directional fast neutron beams scan with associated particles
    • 通过定向快中子束扫描与相关颗粒的爆炸物检测
    • US07420175B2
    • 2008-09-02
    • US11279625
    • 2006-04-13
    • Wei-Kan ChuJiarui Lui
    • Wei-Kan ChuJiarui Lui
    • G01N23/222
    • G01V5/0008G01V5/0069
    • This invention is related to equipment and techniques for fast neutron activation analysis of explosives and /or other warfare agent. The techniques are based on 14 MeV fast neutrons from D-T fusion reaction, the kinematics of the nuclear reaction and fast coincidence between α-particles of the D-T reaction and γ-quanta from fast neutron induced reactions. A fast neutron generator with effective target cooling and different operation modes provides high neutron yield, long life, and simple maintenance of the equipment and good geometric resolution of the directional neutron beam. High positional resolution of the directionally scanning neutron beam, high time resolution of the coincidence and high neutron yield provide the real time robust screen of explosives with high speed and/or high sensitivity, flexibility for big and small items and overall high probability of detection (PD) and low probability of false alarms (PFA). The remote video scan device also has zooming capability to change solid angle.
    • 本发明涉及爆炸物和/或其他战剂的快中子活化分析的设备和技术。 这些技术基于D-T融合反应的14 MeV快中子,核反应的运动学和D-T反应的α粒子与快中子诱导反应的γ量子之间的快速重合。 具有有效目标冷却和不同操作模式的快速中子发生器提供高中子产量,长寿命和设备的简单维护以及方向中子束的良好几何分辨率。 方向扫描中子束的高位置分辨率,高重时和高中子产量的高时间分辨率提供具有高速度和/或高灵敏度的爆炸物的实时鲁棒屏幕,用于大型和小型物品的灵活性以及总体高检测概率( PD)和低误报率概率(PFA)。 远程视频扫描设备还具有变焦功能,可以改变立体角度。