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1. 发明授权

US07772834B2 Handler and process for testing a semiconductor chips using the handler 失效
标题翻译：处理程序和使用处理程序测试半导体芯片的过程
公开(公告)号：US07772834B2
公开(公告)日：2010-08-10
申请号：US12182681
申请日：2008-07-30
申请人： Jung Ug An , Wan Hee Choi , Hae Jun Park , Kyeong Tae Kim
发明人： Jung Ug An , Wan Hee Choi , Hae Jun Park , Kyeong Tae Kim
IPC分类号： G01R31/28
CPC分类号： G01R31/2867
摘要： A test handler includes a loading unit including a loading picker and a loading ascending/descending unit, an unloading unit including an unloading picker and an unloading ascending/descending unit, and a chamber system. A passage site connects the loading unit and the chamber system, and also connects the chamber system and the unloading unit. The arrangement of the handler reduces the time for the loading and unloading processes by performing the loading and unloading processes on separate test trays located at separate loading and unloading positions.
摘要翻译：测试处理器包括装载单元，包括装载选择器和装载上升/下降单元，卸载单元，包括卸载拾取器和卸载上升/下降单元，以及室系统。通道位置连接装载单元和室系统，还连接室系统和卸载单元。处理器的布置通过在位于分开的装载和卸载位置的单独的测试盘上执行装载和卸载过程来减少加载和卸载过程的时间。

2. 发明申请

US20080071409A1 HANDLER 审中-公开
标题翻译：处理器
公开(公告)号：US20080071409A1
公开(公告)日：2008-03-20
申请号：US11857712
申请日：2007-09-19
申请人： Jung-ug AHN , Sun-hwal Kim , Wan-hee Choi , Jung Hur
发明人： Jung-ug AHN , Sun-hwal Kim , Wan-hee Choi , Jung Hur
IPC分类号： H01L21/68
CPC分类号： G01R31/2893 , G01R31/2867
摘要： A handler is provided, including a chamber in which to-be-tested packaged chips contained in a test tray are connected to sockets of a test board, an exchanging unit exchanging the test trays with the chamber; a transferring unit transferring the test tray containing the to-be-tested packaged chips from the exchanging unit to the chamber, and transferring the test tray containing tested packaged chips from the chamber to the exchanging unit, a picker removing the tested packaged chips from the test tray staying in the exchanging unit and putting the to-be-tested packaged chips into the test tray staying in the exchanging unit; and an inserting unit including a pusher pushing the test tray to connect the to-be-tested packaged chips to the sockets of the test board, a pusher driving unit driving the pusher, a sensor sensing an amount of pressure applied by the pusher to the test tray; and a controller controlling the pusher driving unit to enable the pusher to apply a proper amount of pressure to the test tray.
摘要翻译：提供处理器，包括一个室，其中容纳在测试托盘中的待测试的封装芯片连接到测试板的插座，交换单元将测试托盘与腔室交换; 传送单元，将包含要被测试的包装芯片的测试托盘从所述更换单元传送到所述室，以及将包含经测试的封装芯片的测试托盘从所述室传送到所述交换单元;拾取器，将测试的封装芯片从测试托盘停留在更换单元中，并将待测试的包装的芯片放入留在更换单元中的测试托盘中; 以及插入单元，其包括推动所述测试托盘以将待测试的封装芯片连接到所述测试板的插座的推动器，驱动所述推动器的推动器驱动单元，感测由所述推动器施加的压力的传感器试纸盘以及控制器，其控制所述推动器驱动单元以使所述推动器能够向所述测试托盘施加适当的压力。

3. 发明授权

US07495463B2 System and method for transferring trays within a test handler 失效
标题翻译：在测试处理程序中传送托盘的系统和方法
公开(公告)号：US07495463B2
公开(公告)日：2009-02-24
申请号：US12039045
申请日：2008-02-28
申请人： Jung Ug An , Hae Jun Park , Kyung Min Hyun , Wan Hee Choi
发明人： Jung Ug An , Hae Jun Park , Kyung Min Hyun , Wan Hee Choi
IPC分类号： G01R31/02
CPC分类号： G01R31/2893
摘要： A handler for handling semiconductor chips during a testing process includes a loading position at which packaged chips are loaded into a test tray, and an unloading position at which the packaged chips are unloaded from the test tray. The test tray follows a path through the handler from the loading position to the unloading position, and from the unloading position to the loading position. By separately performing the loading and unloading operations at these different positions within the handler, malfunctions in loading and unloading pickers that load and unload the chips may be reduced. Further, a malfunction in one picker performing one operation may be prevented from influencing operations of the other picker performing another operation. Additionally, collision between the loading picker and the unloading picker may be prevented.
摘要翻译：在测试过程中用于处理半导体芯片的处理器包括将封装芯片装载到测试托盘中的装载位置以及从测试托盘卸载封装芯片的卸载位置。测试盘沿着穿过处理器的路径从装载位置到卸载位置，并且从卸载位置到装载位置。通过在处理机内的这些不同的位置分别执行装载和卸载操作，可以减少加载和卸载芯片的加载和卸载拾取器的故障。此外，可以防止执行一个操作的一个拾取器中的故障影响另一个执行另一操作的拾取器的操作。此外，可以防止装载拾取器与卸载拾取器之间的碰撞。

4. 发明申请

US20080074120A1 PUSHING BLOCK AND AND A HANDLER WITH THE PUSHING BLOCK 审中-公开
标题翻译：推动块和与推动块的处理器
公开(公告)号：US20080074120A1
公开(公告)日：2008-03-27
申请号：US11858560
申请日：2007-09-20
申请人： Jung-ug AHN , Sun-hwal Kim , Wan-hee Choi , Jung Hur
发明人： Jung-ug AHN , Sun-hwal Kim , Wan-hee Choi , Jung Hur
IPC分类号： H01R13/62 , G01R31/26
CPC分类号： G01R31/2893
摘要： Provided is a pushing block for use in a handle and a handler equipped with the pushing block. The pushing block includes pushing pins, provided under the test tray, each pushing the latch upwards from under the test tray to enable the latch to release the packaged chip, a first plate on which the pushing pins are provided, and an assembly changing horizontal motion into vertical motion to move the first plate vertically. Positioning of the pushing block under the test tray prevents interference between the pushing block and the picker during loading and unloading and makes it convenient to take corrective action when malfunction of the picker occurs.
摘要翻译：提供了一种用于手柄的推动块和装有推动块的搬运装置。推动块包括设置在测试托盘下方的推动销，每个推动销从测试托盘下方向上推动闩锁，以使闩锁释放封装的芯片，其上设置有推动销的第一板，以及改变水平运动的组件垂直运动以垂直移动第一板。推动块在测试托盘下方的定位可以防止装载和卸载过程中推动块与拾取器之间的干扰，从而在拾取器发生故障时方便采取纠正措施。

5. 发明申请

US20090033352A1 HANDLER AND PROCESS FOR TESTING A SEMICONDUCTOR CHIPS USING THE HANDLER 失效
标题翻译：使用处理器测试半导体器件的处理程序和过程
公开(公告)号：US20090033352A1
公开(公告)日：2009-02-05
申请号：US12182681
申请日：2008-07-30
申请人： Jung Ug AN , Wan Hee CHOI , Hae Jun PARK , Kyeong Tae KIM
发明人： Jung Ug AN , Wan Hee CHOI , Hae Jun PARK , Kyeong Tae KIM
IPC分类号： G01R31/26 , G01R1/02
CPC分类号： G01R31/2867
摘要： A test handler includes a loading unit including a loading picker and a loading ascending/descending unit, an unloading unit including an unloading picker and an unloading ascending/descending unit, and a chamber system. A passage site connects the loading unit and the chamber system, and also connects the chamber system and the unloading unit. The arrangement of the handler reduces the time for the loading and unloading processes by performing the loading and unloading processes on separate test trays located at separate loading and unloading positions.
摘要翻译：测试处理器包括装载单元，包括装载选择器和装载上升/下降单元，卸载单元，包括卸载拾取器和卸载上升/下降单元，以及室系统。通道位置连接装载单元和室系统，还连接室系统和卸载单元。处理器的布置通过在位于分开的装载和卸载位置的单独的测试盘上执行装载和卸载过程来减少装载和卸载过程的时间。

6. 发明申请

US20080075574A1 PICKER AND HEAD ASSEMBLY WITH THE PICKERS 审中-公开
标题翻译：拍摄者和头部大会与拍摄者
公开(公告)号：US20080075574A1
公开(公告)日：2008-03-27
申请号：US11858531
申请日：2007-09-20
申请人： Jung-ug AHN , Sun-hwal Kim , Wan-hee Choi , Jung Hur
发明人： Jung-ug AHN , Sun-hwal Kim , Wan-hee Choi , Jung Hur
IPC分类号： B65G1/04
CPC分类号： H05K13/0409 , H05K13/041 , H05K13/0413
摘要： Provided is a picker for transferring packaged chips, including a picker base, a base block fixably connected to the picker base, a plurality of nozzle assemblies, provided to the base block, each nozzle assembly being movable up and down, and having a nozzle which a packaged chip is held against or released from by air pressure, an air pressure supplying unit supplying negative or positive pressure by which the packaged chip is held against or released from the nozzle, a plurality of first mechanisms, through each of which the negative or positive pressure is supplied to the nozzle; and a plurality of second mechanisms, each of which moves up and down each of nozzle assemblies.
摘要翻译：提供了一种用于传送包装芯片的拾取器，包括拾取器基座，可固定地连接到拾取器基座的基座，设置在基座上的多个喷嘴组件，每个喷嘴组件可上下移动，并且具有喷嘴封装的芯片被保持抵抗或通过空气压力释放;空气压力供应单元，其提供负压或正压，通过所述空气压力供应单元将封装的芯片保持抵靠或从喷嘴释放;多个第一机构，向喷嘴供给正压; 以及多个第二机构，每个机构每个喷嘴组件都上下移动。

7. 发明申请

US20080297140A1 SYSTEM AND METHOD FOR TRANSFERRING TRAYS WITHIN A TEST HANDLER 失效
标题翻译：用于在测试处理器中传输托盘的系统和方法
公开(公告)号：US20080297140A1
公开(公告)日：2008-12-04
申请号：US12039045
申请日：2008-02-28
申请人： Jung Ug AN , Hae Jun Park , Kyung Min Hyun , Wan Hee Choi
发明人： Jung Ug AN , Hae Jun Park , Kyung Min Hyun , Wan Hee Choi
IPC分类号： G01R1/02
CPC分类号： G01R31/2893
摘要： A handler for handling semiconductor chips during a testing process includes a loading position at which packaged chips are loaded into a test tray, and an unloading position at which the packaged chips are unloaded from the test tray. The test tray follows a path through the handler from the loading position to the unloading position, and from the unloading position to the loading position. By separately performing the loading and unloading operations at these different positions within the handler, malfunctions in loading and unloading pickers that load and unload the chips may be reduced. Further, a malfunction in one picker performing one operation may be prevented from influencing operations of the other picker performing another operation. Additionally, collision between the loading picker and the unloading picker may be prevented.
摘要翻译：在测试过程中用于处理半导体芯片的处理器包括将封装芯片装载到测试托盘中的装载位置以及从测试托盘卸载封装芯片的卸载位置。测试盘沿着穿过处理器的路径从装载位置到卸载位置，并且从卸载位置到装载位置。通过在处理机内的这些不同的位置分别执行装载和卸载操作，可以减少加载和卸载芯片的加载和卸载拾取器的故障。此外，可以防止执行一个操作的一个拾取器中的故障影响另一个执行另一操作的拾取器的操作。此外，可以防止装载拾取器与卸载拾取器之间的碰撞。

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