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    • 1. 发明授权
    • High voltage NMOS pass gate for integrated circuit with high voltage
generator and flash non-volatile memory device having the pass gate
    • 具有高电压发生器的集成电路的高电压NMOS通过栅极和具有通过栅极的闪存非易失性存储器件
    • US5852576A
    • 1998-12-22
    • US944904
    • 1997-10-06
    • Binh Quang LePau-Ling ChenShane Charles HollmerShoichi KawamuraMichael Shingche ChungVincent C. LeungMasaru Yano
    • Binh Quang LePau-Ling ChenShane Charles HollmerShoichi KawamuraMichael Shingche ChungVincent C. LeungMasaru Yano
    • G11C16/06G11C8/08G11C16/12G11C13/00
    • G11C16/12G11C8/08
    • Two NMOS boost transistors have their sources connected to the high voltage input while their drains and gates are cross-connected. Two coupling capacitors connect two alternate phase clocks to the gates of the two cross-connected boost transistors. An NMOS pass transistor has its gate connected to the drain of one of the NMOS boost transistors, its source connected to the high voltage input, and its drain connected to the output. In an embodiment, two diode-connected regulation transistors connect the gates of the boost transistors to the high voltage input. These connections insure that the gates of the boost transistors and the gate of the pass transistor never reach voltages higher than one threshold voltage above the high voltage input. In another embodiment, two discharge transistors have their drains connected to a decode input, their sources connected to the gates of the boost transistors, and their gates connected to the positive power supply. By setting the decode input at zero volts, the voltages at the gates of the boost transistors and of the pass transistor are held at zero volts, thus disabling them. In the preferred embodiment, both the regulation transistors and the discharge transistors are included in the high voltage pass gate.
    • 两个NMOS升压晶体管的源极连接到高压输入端,而它们的漏极和栅极交叉连接。 两个耦合电容器将两个交替相位时钟连接到两个交叉连接的升压晶体管的栅极。 NMOS传输晶体管的栅极连接到一个NMOS升压晶体管的漏极,其源极连接到高压输入,其漏极连接到输出。 在一个实施例中,两个二极管连接的调节晶体管将升压晶体管的栅极连接到高电压输入。 这些连接确保升压晶体管的栅极和传输晶体管的栅极不会达到高于高电压输入以上的一个阈值电压的电压。 在另一个实施例中,两个放电晶体管的漏极连接到解码输入,其源极连接到升压晶体管的栅极,并且其栅极连接到正电源。 通过将解码输入设置为零伏特,升压晶体管和传输晶体管的栅极处的电压保持在零伏特,从而禁止它们。 在优选实施例中,调节晶体管和放电晶体管都包括在高压通栅中。
    • 2. 发明授权
    • Integration of embedded and test mode timer
    • 集成嵌入式和测试模式定时器
    • US06732308B1
    • 2004-05-04
    • US09664819
    • 2000-09-19
    • Vincent C. Leung
    • Vincent C. Leung
    • G01R3128
    • G11C29/12015G11C29/14G11C2207/104
    • The present invention discloses an embedded and test mode timer circuit that is used to perform operations in an embedded mode and a plurality of test modes in a memory device. When the memory device is operating in the embedded mode, the embedded and test mode timer circuit is activated to automatically direct at least one logic circuit to execute logic tasks at predetermined times. When the memory device is operating in a test mode, the embedded and test mode timer circuit is activated to automatically direct a portion of the logic circuits to execute logic tasks at predetermined times and the remaining portion of the logic circuit are manually directed.
    • 本发明公开了一种嵌入式和测试模式定时器电路,用于在存储器件中执行嵌入模式和多种测试模式的操作。 当存储器件以嵌入式模式工作时,嵌入式和测试模式定时器电路被激活,以自动引导至少一个逻辑电路在预定时间执行逻辑任务。 当存储器件在测试模式下工作时,嵌入式和测试模式定时器电路被激活,以自动指示逻辑电路的一部分在预定时间执行逻辑任务,并且逻辑电路的剩余部分被手动引导。