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    • 2. 发明申请
    • Method and Apparatus to Assess the Thermal Damage Caused to a PCD Cutter Using Capacitance Spectroscopy
    • 使用电容光谱法评估引起PCD切割机的热损伤的方法和装置
    • US20140062509A1
    • 2014-03-06
    • US14073557
    • 2013-11-06
    • Federico BellinVamsee Chintamaneni
    • Federico BellinVamsee Chintamaneni
    • G01R27/26
    • G01R27/2605G01N27/22G01N33/40
    • A method and apparatus for non-destructively determining the wear resistance of an ultra-hard polycrystalline structure after being coupled to a downhole tool using capacitance measurements. The apparatus includes a capacitance measuring device having a positive and negative terminal, a leached component comprising a polycrystalline structure that has been coupled to a downhole tool, a first wire, and a second wire. The first wire electrically couples the positive terminal to a surface of the leached component and the second wire electrically couples the negative terminal to a surface of the downhole tool. The capacitance is measured for the leached component one or more times and compared to a calibration curve that shows a relationship between capacitance values and wear resistance, thereby allowing determination of an estimated wear resistance for the polycrystalline structure.
    • 在使用电容测量结合到井下工具之后,非破坏性地确定超硬多晶结构的耐磨性的方法和装置。 该装置包括具有正极端子和负极端子的电容测量装置,包括已连接到井下工具,第一导线和第二导线的多晶结构的浸出部件。 第一线将正端子电耦合到浸出部件的表面,并且第二线将负极端子电耦合到井下工具的表面。 对于浸出组分测量电容量一次或多次,并与显示电容值和耐磨性之间的关系的校准曲线进行比较,从而可以确定多晶结构的估计耐磨性。
    • 3. 发明申请
    • Method to Improve the Performance of a Leached Cutter
    • 提高沥青切割机性能的方法
    • US20130213433A1
    • 2013-08-22
    • US13401452
    • 2012-02-21
    • Federico BellinVamsee Chintamaneni
    • Federico BellinVamsee Chintamaneni
    • B08B3/12B08B3/08B23B27/20G01R27/26
    • B08B3/12B08B3/08B08B7/028B23B27/148B23B27/20B23B2226/12B23B2226/315B23B2270/28Y10T408/81
    • A cleaned component having a polycrystalline structure, a method and apparatus for cleaning a leached component to form the cleaned component, and a method for determining the effectiveness of cleaning the leached component. The cleaned component includes a leached layer that has at least a portion of by-product materials removed. The by-product materials were deposited into the leached layer during a leaching process that formed the leached layer. The apparatus and method for cleaning includes a tank, a cleaning fluid placed within the tank, and at least a portion of the leached layer immersed into the cleaning fluid. Optionally, a transducer emits ultrasonic waves into the leached layer. The method for determining the effectiveness of cleaning includes cleaning the leached component to form the cleaned component, measuring one or more capacitance values of the cleaned component, repeating the cleaning and the measuring until achieving a stable lower limit capacitance value.
    • 具有多晶结构的清洁部件,用于清洁浸出部件以形成清洁部件的方法和装置,以及用于确定清洗部件的有效性的方法。 清洁的部件包括具有除去的副产物材料的至少一部分的浸出层。 在形成浸出层的浸出过程中,副产物材料沉积到浸出层中。 用于清洁的装置和方法包括罐,置于罐内的清洗液,以及浸入清洗液中的浸出层的至少一部分。 可选地,换能器将超声波发射到浸出层中。 用于确定清洁效果的方法包括清洗浸出的部件以形成清洁的部件,测量清洁部件的一个或多个电容值,重复清洁和测量直到达到稳定的下限电容值。
    • 4. 发明申请
    • Non-Destructive Leaching Depth Measurement Using Capacitance Spectroscopy
    • 使用电容光谱法进行非破坏性浸出深度测量
    • US20140253149A1
    • 2014-09-11
    • US14286136
    • 2014-05-23
    • Federico BellinVamsee Chintamaneni
    • Federico BellinVamsee Chintamaneni
    • G01N27/22
    • G01N27/22G01N33/40
    • A method of characterizing a quality of a polycrystalline diamond compact (PDC) cutter includes obtaining a PDC cutter that includes a leached layer and an unleached layer. The unleached layer is positioned adjacent to the leached layer, and the leached layer has at least a portion of a catalyst material removed from therein. The method further includes measuring capacitance values of the PDC cutter at multiple frequencies of an electrical signal provided to the PDC cutter by a capacitance measuring device to measure the capacitance values of the PDC cutter. The method also includes characterizing a quality of the PDC cutter based on a lowest capacitance value from among the capacitance values. Each capacitance value of the capacitance values is measured at a respective frequency of the multiple frequencies of the electrical signal.
    • 表征多晶金刚石压块(PDC)切割器的质量的方法包括获得包括浸出层和未漂白层的PDC切割器。 未浸提层定位成与浸出层相邻,并且浸出层具有从其中去除的至少一部分催化剂材料。 该方法还包括通过电容测量装置测量提供给PDC切割器的电信号的多个频率来测量PDC切割器的电容值,以测量PDC切割器的电容值。 该方法还包括基于来自电容值的最低电容值来表征PDC切割器的质量。 在电信号的多个频率的相应频率处测量电容值的每个电容值。
    • 6. 发明申请
    • Anti-Balling Coating On Drill Bits And Downhole Tools
    • 钻头和井下工具防滚涂
    • US20140102809A1
    • 2014-04-17
    • US13652148
    • 2012-10-15
    • William W. KingVamsee Chintamaneni
    • William W. KingVamsee Chintamaneni
    • E21B10/46C09D7/12
    • C09D7/40C08K3/14C08K2003/0887C09D7/61C09D175/04E21B10/00E21B10/46E21B41/00
    • A coating that includes a polyisocyanate compound and at least one metal inclusion selected from the group consisting of tungsten and tungsten carbide. The metal inclusions range between about five percent by weight to about fifty percent by weight. A downhole tool that includes a body, a shank positioned at one end of the body, at least one cutter coupled to the body, and a coating coupled to at least a portion of one or more of the body or the shank. The coating includes a polyisocyanate compound and at least one metal inclusion selected from the group consisting of tungsten, tungsten carbide, and aluminum. The metal inclusions range between about five percent by weight to about fifty percent by weight. An intermediate coating is optionally disposed between at least a portion of the coating and at least one of the body or the shank.
    • 包括多异氰酸酯化合物和选自钨和碳化钨中的至少一种金属夹杂物的涂层。 金属夹杂物的重量在约5%至约50%之间。 一种井下工具,其包括主体,位于所述主体的一端的柄,连接到所述主体的至少一个切割器,以及耦合到所述主体或所述柄中的一个或多个的至少一部分的涂层。 涂层包括多异氰酸酯化合物和选自钨,碳化钨和铝的至少一种金属夹杂物。 金属夹杂物的重量在约5%至约50%之间。 中间涂层任选地设置在涂层的至少一部分与主体或柄之中的至少一个之间。
    • 7. 发明申请
    • Method to Improve the Leaching Process
    • 改善浸出过程的方法
    • US20130247478A1
    • 2013-09-26
    • US13428635
    • 2012-03-23
    • Federico BellinVamsee Chintamaneni
    • Federico BellinVamsee Chintamaneni
    • C09K3/14
    • G01N27/221B22F3/24B22F7/06B22F2003/244C22C26/00E21B10/00E21B10/56
    • A method to leach a component that includes a polycrystalline structure. The method includes obtaining the component having the polycrystalline structure. The polycrystalline structure includes catalyst material deposited therein. The method also includes performing a leaching process on the polycrystalline structure to an intermediate leaching depth. The leaching process removes at least a portion of the catalyst material from the polycrystalline structure and forms one or more by-product materials deposited therein. The method also includes performing a cleaning process on the polycrystalline structure, which removes at least a portion of the by-product materials. The leaching process and the cleaning process are iteratively continued until the intermediate leaching depth reaches a desired leaching depth, both of which are measured from one end of the polycrystalline structure. The desired leaching depth is greater than at least one intermediate leaching depth.
    • 一种浸出包括多晶结构的组分的方法。 该方法包括获得具有多晶结构的部件。 多晶结构包括沉积在其中的催化剂材料。 该方法还包括对多晶结构进行中间浸出深度的浸出过程。 浸出过程将催化剂材料的至少一部分从多晶结构中去除并形成沉积在其中的一种或多种副产物材料。 该方法还包括对多晶结构进行清洁处理,其去除至少一部分副产物材料。 迭代过程和清洗过程直到中间浸出深度达到所需的浸出深度,两者都是从多晶结构的一端测量的。 所需的浸出深度大于至少一个中间浸出深度。
    • 8. 发明申请
    • APPARATUS TO IMPROVE THE PERFORMANCE OF A LEACHED CUTTER
    • 提高浸出式切割机性能的设备
    • US20150209837A1
    • 2015-07-30
    • US14681348
    • 2015-04-08
    • Federico BellinVamsee Chintamaneni
    • Federico BellinVamsee Chintamaneni
    • B08B3/08B08B3/12B23B27/20
    • B08B3/12B08B3/08B08B7/028B23B27/148B23B27/20B23B2226/12B23B2226/315B23B2270/28Y10T408/81
    • A cleaned component having a polycrystalline structure, a method and apparatus for cleaning a leached component to form the cleaned component, and a method for determining the effectiveness of cleaning the leached component. The cleaned component includes a leached layer that has at least a portion of by-product materials removed. The by-product materials were deposited into the leached layer during a leaching process that formed the leached layer. The apparatus and method for cleaning includes a tank, a cleaning fluid placed within the tank, and at least a portion of the leached layer immersed into the cleaning fluid. Optionally, a transducer emits ultrasonic waves into the leached layer. The method for determining the effectiveness of cleaning includes cleaning the leached component to form the cleaned component, measuring one or more capacitance values of the cleaned component, repeating the cleaning and the measuring until achieving a stable lower limit capacitance value.
    • 具有多晶结构的清洁部件,用于清洁浸出部件以形成清洁部件的方法和装置,以及用于确定清洗部件的有效性的方法。 清洁的部件包括具有除去的副产物材料的至少一部分的浸出层。 在形成浸出层的浸出过程中,副产物材料沉积到浸出层中。 用于清洁的装置和方法包括罐,置于罐内的清洗液,以及浸入清洗液中的浸出层的至少一部分。 可选地,换能器将超声波发射到浸出层中。 用于确定清洁效果的方法包括清洗浸出的部件以形成清洁的部件,测量清洁部件的一个或多个电容值,重复清洁和测量直到达到稳定的下限电容值。
    • 9. 发明申请
    • Use of Capacitance to Analyze Polycrystalline Diamond
    • 使用电容分析多晶金刚石
    • US20130214799A1
    • 2013-08-22
    • US13401188
    • 2012-02-21
    • Federico BellinVamsee Chintamaneni
    • Federico BellinVamsee Chintamaneni
    • G01R27/26
    • G01N27/22G01N33/40
    • A method, system, and apparatus for non-destructively characterizing one or more regions within an ultra-hard polycrystalline structure using capacitance measurements. The apparatus includes a capacitance measuring device having a positive and negative terminal, a leached component comprising a polycrystalline structure, a first wire, and a second wire. The leached component includes a first surface and an opposing second surface. The first wire electrically couples the positive terminal to one of the surfaces of the leached component and the second wire electrically couples the negative terminal to the other surface of the leached component. The capacitance is measured one or more times and compared to a calibration curve to determine an estimated leaching depth within the polycrystalline structure. A data scattering range is ascertained to determine a relative porosity of the polycrystalline structure or the leaching quality within the polycrystalline structure.
    • 一种用于使用电容测量来非特异性地表征超硬多晶结构内的一个或多个区域的方法,系统和装置。 该装置包括具有正和负端子的电容测量装置,包括多晶结构的浸出部件,第一线和第二线。 浸出的组分包括第一表面和相对的第二表面。 第一线将正端子电耦合到浸出部件的一个表面,并且第二线将负极端子电耦合到浸出部件的另一表面。 测量电容一次或多次,并与校准曲线进行比较,以确定多晶结构内的估计浸出深度。 确定数据散射范围以确定多晶结构的相对孔隙率或多晶结构内的浸出质量。
    • 10. 发明申请
    • Use of Eddy Currents to Analyze Polycrystalline Diamond
    • 使用涡流分析多晶金刚石
    • US20130214768A1
    • 2013-08-22
    • US13401231
    • 2012-02-21
    • Vamsee ChintamaneniFederico Bellin
    • Vamsee ChintamaneniFederico Bellin
    • G01R33/12
    • G01N27/72C22C26/00G01B7/10G01N33/38G01N33/40
    • A method, system, and apparatus for non-destructively characterizing one or more regions within an ultra-hard polycrystalline structure using eddy current measurements. The apparatus includes an eddy current measuring device having at least one terminal, a leached component comprising a polycrystalline structure, a first wire, and a probe. The leached component includes a cutting surface and an opposing second surface. A portion of the polycrystalline structure extending inwardly from the cutting surface has at least a portion of a catalyst material removed from therein. The first wire electrically couples the terminal to the probe, which is placed in contact with the cutting surface. The eddy current is measured one or more times and compared to a calibration curve to determine an estimated leaching depth within the polycrystalline structure. A data scattering range is ascertained to determine a relative porosity of the polycrystalline structure or the leaching quality within the polycrystalline structure.
    • 一种用于使用涡流测量在非硬质多晶结构内非破坏性地表征一个或多个区域的方法,系统和装置。 该装置包括具有至少一个端子的涡流测量装置,包括多晶结构的浸出部件,第一焊丝和探针。 浸出的组分包括切割表面和相对的第二表面。 从切割表面向内延伸的多晶结构的一部分具有从其中去除的催化剂材料的至少一部分。 第一线将端子电耦合到与切割表面接触的探针。 测量涡流一次或多次,并与校准曲线进行比较,以确定多晶结构内的估计浸出深度。 确定数据散射范围以确定多晶结构的相对孔隙率或多晶结构内的浸出质量。