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    • 1. 发明申请
    • Pre-Charge Voltage Generation and Power Saving Modes
    • 预充电电压产生和省电模式
    • US20120320695A1
    • 2012-12-20
    • US13599836
    • 2012-08-30
    • Valerie L. LinesHakJune OH
    • Valerie L. LinesHakJune OH
    • G11C7/00
    • G11C5/148G11C5/147G11C7/1048G11C7/1078G11C7/1096G11C8/08G11C2207/2227
    • A system includes a voltage generator to produce a pre-charge voltage signal for pre-charging one or more signals in a memory circuit. The one or more signals can be data bus lines used to access memory. The voltage generator can include an input indicating whether the memory circuit is set to a power-saving mode. According to one embodiment, the input adjusts a magnitude of the pre-charge voltage signal produced by the voltage generator. Such an embodiment is useful over conventional methods because adjusting the pre-charge voltage can result in power savings. As an example, when in the power-saving mode, the voltage generator circuit can adjust the pre-charge voltage to a value that reduces an amount of leakage current associated with a pre-charge voltage. Reducing the leakage with respect to the pre-charge voltage means that the saved power can be used for other useful purposes.
    • 系统包括电压发生器,以产生用于对存储器电路中的一个或多个信号进行预充电的预充电电压信号。 一个或多个信号可以是用于访问存储器的数据总线。 电压发生器可以包括指示存储器电路是否被设置为省电模式的输入。 根据一个实施例,输入调节由电压发生器产生的预充电电压信号的幅度。 这种实施例对于常规方法是有用的,因为调节预充电电压可导致功率节省。 例如,在省电模式下,电压发生器电路可以将预充电电压调整为减小与预充电电压相关联的漏电流量的值。 减少相对于预充电电压的泄漏意味着所节省的功率可以用于其他有用的目的。
    • 2. 发明授权
    • Dynamic memory word line driver scheme
    • 动态内存字线驱动方案
    • US08023314B2
    • 2011-09-20
    • US12405153
    • 2009-03-16
    • Valerie L. Lines
    • Valerie L. Lines
    • G11C11/24
    • G11C8/08G11C11/4085
    • A circuit which accurately controls the word line (pass transistor gate) driving voltage to a voltage which is both controlled and is not significantly greater than is needed to drive the word line. The circuit eliminates the need for a double-boot-strapping circuit, and ensures that no voltages exceed that necessary to fully turn on a memory cell access transistor. Voltages in excess of that which would reduce reliability are avoided, and accurate driving voltages are obtained. A DRAM includes word lines, memory cells having enable inputs connected to the word lines, a gate receiving word line selecting signals at first logic levels Vss and Vdd, and for providing a select signal at levels Vss and Vdd, a high voltage supply source Vpp which is higher in voltage than Vdd, a circuit for translating the select signals at levels Vss and Vdd to levels Vss and Vpp and for applying it directly to the word lines whereby an above Vdd voltage level word line is achieved without the use of double boot-strap circuits.
    • 准确地将字线(传输晶体管栅极)驱动电压控制到电压的电路,该电压被控制并且不显着大于驱动字线所需的电压。 该电路消除了双引导电路的需要,并确保没有电压超过完全打开存储单元存取晶体管所需的电压。 避免超过降低可靠性的电压,并获得精确的驱动电压。 DRAM包括字线,具有连接到字线的使能输入的存储器单元,栅极接收字线以第一逻辑电平Vss和Vdd选择信号,以及用于提供电平Vss和Vdd的选择信号,高电压源Vpp 其电压高于Vdd,用于将电平Vss和Vdd的选择信号转换为电平Vss和Vpp并用于将其直接应用于字线的电路,从而实现上述Vdd电压电平字线而不使用双引导 - 电路。
    • 3. 发明申请
    • PRE-CHARGE VOLTAGE GENERATION AND POWER SAVING MODES
    • 预充电电压和节电模式
    • US20110122719A1
    • 2011-05-26
    • US13019100
    • 2011-02-01
    • Valerie L. LinesHakJune Oh
    • Valerie L. LinesHakJune Oh
    • G11C5/14
    • G11C5/148G11C5/147G11C7/1048G11C7/1078G11C7/1096G11C8/08G11C2207/2227
    • A system includes a voltage generator to produce a pre-charge voltage signal for pre-charging one or more signals in a memory circuit. The one or more signals can be data bus lines used to access memory. The voltage generator can include an input indicating whether the memory circuit is set to a power-saving mode. According to one embodiment, the input adjusts a magnitude of the pre-charge voltage signal produced by the voltage generator. Such an embodiment is useful over conventional methods because adjusting the pre-charge voltage can result in power savings. As an example, when in the power-saving mode, the voltage generator circuit can adjust the pre-charge voltage to a value that reduces an amount of leakage current associated with a pre-charge voltage. Reducing the leakage with respect to the pre-charge voltage means that the saved power can be used for other useful purposes.
    • 系统包括电压发生器,以产生用于对存储器电路中的一个或多个信号进行预充电的预充电电压信号。 一个或多个信号可以是用于访问存储器的数据总线。 电压发生器可以包括指示存储器电路是否被设置为省电模式的输入。 根据一个实施例,输入调节由电压发生器产生的预充电电压信号的幅度。 这种实施例对于常规方法是有用的,因为调节预充电电压可导致功率节省。 例如,在省电模式下,电压发生器电路可以将预充电电压调整为减小与预充电电压相关联的漏电流量的值。 减少相对于预充电电压的泄漏意味着所节省的功率可以用于其他有用的目的。
    • 5. 发明授权
    • Dynamic memory word line driver scheme
    • US6061277A
    • 2000-05-09
    • US123112
    • 1998-07-27
    • Valerie L. Lines
    • Valerie L. Lines
    • G11C11/407G11C8/08G11C11/408G11C16/04
    • G11C11/4085G11C8/08
    • A circuit which accurately controls the word line (pass transistor gate) driving voltage to a voltage which is both controlled and is not significantly greater than is needed to drive the word line. The elements of the present invention eliminate the need for a double-boot-strapping circuit, and ensure that no voltages exceed that necessary to fully turn on a memory cell access transistor. Accordingly, voltages in excess of that which would reduce reliability are avoided, and accurate driving voltages are obtained. A DRAM is comprised of word lines, memory cells having enable inputs connected to the word lines, apparatus for receiving word line selecting signals at first logic levels V.sub.ss and V.sub.dd, and for providing a select signal at levels V.sub.ss and V.sub.dd, a high voltage supply source V.sub.pp which is higher in voltage than V.sub.dd, a circuit for translating the select signals at levels V.sub.ss and V.sub.dd to levels V.sub.ss and V.sub.pp and for applying it directly to the word lines for application to the enable inputs whereby an above V.sub.dd voltage level word line is achieved without the use of double boot-strap circuits.