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    • 1. 发明授权
    • Semiconductor laser based sensing device
    • 半导体激光传感器
    • US6115111A
    • 2000-09-05
    • US166287
    • 1998-10-05
    • John K. KorahKristina M. JohnsonValentin MorozovChong Chang Mao
    • John K. KorahKristina M. JohnsonValentin MorozovChong Chang Mao
    • G01C3/08G01D5/26G01S17/08G01B11/02G01B11/14
    • G01S17/08G01C3/08G01D5/26G01S7/4916
    • A system for determining a distance to a target object or a displacement of a target object monitors electrical characteristics of a semiconductor laser aimed at the object. Light emitted from the laser is reflected from a surface of the object back into the laser. The amount of reflected light reaching the laser affects electrical characteristics of the laser. Because the amount of reflected light reaching the laser depends on the distance to the target object, the electrical characteristics of the semiconductor laser provide an indication of the distance to the target object. Also, a change in the electrical characteristics can be used to determine an amount of displacement of a target object. A system embodying the invention could also include an optical detector array which can be focused on a target object by monitoring electrical characteristics of one or more semiconductor lasers. A plurality of semiconductor lasers could be arranged in a two dimensional or a three dimensional array such that the semiconductor lasers are located at different distances from a target surface. By monitoring the electrical characteristics of the plurality of semiconductor lasers, one can determine both an amount and a direction of a displacement of a target object relative to the semiconductor laser array.
    • 用于确定到目标​​对象的距离或目标对象的位移的系统监视针对对象的半导体激光器的电特性。 从激光发出的光从物体的表面反射回激光。 到达激光的反射光的量影响激光的电特性。 因为到达激光的反射光的量取决于到目标物体的距离,所以半导体激光器的电特性提供到目标物体的距离的指示。 此外,可以使用电特性的变化来确定目标物体的位移量。 体现本发明的系统还可以包括可以通过监测一个或多个半导体激光器的电特性来聚焦在目标物体上的光学检测器阵列。 可以以二维或三维阵列布置多个半导体激光器,使得半导体激光器位于距离目标表面不同的距离处。 通过监视多个半导体激光器的电特性,可以确定目标物体相对于半导体激光器阵列的位移的量和方向。