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    • 1. 发明授权
    • Method of making multiple lead voltage probe
    • 制造多个引线电压探头的方法
    • US5940965A
    • 1999-08-24
    • US846983
    • 1997-04-30
    • Thomas F. UhlingDavid J. DascherKeith C. Griggs
    • Thomas F. UhlingDavid J. DascherKeith C. Griggs
    • G01R1/073G01R13/28G01R31/28H01R9/00
    • G01R31/2886G01R1/073G01R31/2844Y10T29/49004Y10T29/49147
    • A probe head includes analog amplifier inputs, a ground plane, and hundreds of probe leads between the inputs and the pins of a circuit under test. The customer defines the grounded pins of the circuit under test. Non-active probe leads, i.e. leads corresponding to the grounded pins are connected to the ground plane, maximizing the connections between the grounds of the probe and the circuit under test and minimizing unequal ground potentials. The probe circuit is on a probe circuit board, while the connections between the ground plane and the leads are fusible elements on a separate ground personality board. The probe is placed on a simulated circuit under test, the grounded pins on the circuit under test are protected by an insulating cap, and a voltage is placed on the remainder of the pins to fuse the elements corresponding the active probe leads.
    • 探头包括模拟放大器输入,接地层以及输入端和被测电路引脚之间的数百个探针。 客户定义被测电路的接地引脚。 无源探头引线,即对应于接地引脚的引线连接到接地平面,使探头接地和被测电路之间的连接最大化,并使不等的接地电位最小化。 探头电路位于探针电路板上,而接地平面和引线之间的连接是独立接地人格板上的可熔元件。 将探头放置在被测电路上,被测电路上的接地引脚由绝缘盖保护,并且其余引脚上的电压被放置在与激活的探头引线对应的元件上。
    • 2. 发明授权
    • Multiple lead voltage probe and method of making same
    • 多引线电压探头及其制作方法
    • US5654647A
    • 1997-08-05
    • US518408
    • 1995-08-23
    • Thomas F. UhlingDavid J. DascherKeith C. Griggs
    • Thomas F. UhlingDavid J. DascherKeith C. Griggs
    • G01R1/073G01R13/28G01R31/28G01R31/02
    • G01R31/2886G01R1/073G01R31/2844Y10T29/49004Y10T29/49147
    • A probe head includes analog amplifier inputs, a ground plane, and hundreds of probe leads between the inputs and the pins of a circuit under test. The customer defines the grounded pins of the circuit under test. Non-active probe leads, i.e. leads corresponding to the grounded pins are connected to the ground plane, maximizing the connections between the grounds of the probe and the circuit under test and minimizing unequal ground potentials. The probe circuit is on a probe circuit board, while the connections between the ground plane and the leads are fusible elements on a separate ground personality board. The probe is placed on a simulated circuit under test, the grounded pins on the circuit under test are protected by an insulating cap, and a voltage is placed on the remainder of the pins to fuse the elements corresponding the active probe leads.
    • 探头包括模拟放大器输入,接地层以及输入端和被测电路引脚之间的数百个探针。 客户定义被测电路的接地引脚。 无源探头引线,即对应于接地引脚的引线连接到接地平面,使探头接地和被测电路之间的连接最大化,并使不等的接地电位最小化。 探头电路位于探针电路板上,而接地平面和引线之间的连接是独立接地人格板上的可熔元件。 将探头放置在被测电路上,被测电路上的接地引脚由绝缘盖保护,并且其余引脚上的电压放置在与激活的探头引线对应的元件上。
    • 6. 发明授权
    • Detector for use in a printing device having print media with
fluorescent marks
    • 用于具有带荧光标记的打印介质的打印装置中的检测器
    • US6028320A
    • 2000-02-22
    • US9800
    • 1998-01-20
    • Thomas F Uhling
    • Thomas F Uhling
    • B41J11/00G01N21/86
    • B41J11/009G01N21/86
    • A detector for use in detecting at least one mark on a sheet of print media used in a printing device, the mark indicating at least one characteristic of the sheet of print media, is disclosed. The detector includes a source, a sensor, and a bandstop filter. The source generates a first light signal that is directed at the mark on the sheet of print media, the first light signal having a first predetermined wavelength. The sensor is configured to detect a second light signal from the mark on the sheet of print media, the second light signal arising in response to the first light signal and having a second predetermined wavelength. The bandstop filter is positioned between the sensor and the mark on the sheet of print media and is configured to block from the sensor the first predetermined wavelength of the first light signal generated by the source and transmit to the sensor other wavelengths of light, including the second predetermined wavelength of the second light signal. A printing device including the detector is also disclosed. A method of detecting a characteristic of a sheet of print media used in a printing device through the use of a detector is also disclosed. Further characteristics and features of the detector and printing device are described herein. Further characteristics and steps of the method are also described herein.
    • 公开了一种用于检测在打印装置中使用的一张打印介质上的至少一个标记的检测器,该标记指示该打印介质片的至少一个特性。 检测器包括源,传感器和带阻滤波器。 源产生针对打印介质片上的标记的第一光信号,第一光信号具有第一预定波长。 传感器被配置为从打印介质片上的标记检测第二光信号,第二光信号响应于第一光信号而产生并且具有第二预定波长。 带阻滤波器位于传感器和打印介质片之间的标记之间,并被配置为从传感器阻挡由源产生的第一光信号的第一预定波长并向传感器传输其它波长的光,包括 第二光信号的第二预定波长。 还公开了一种包括检测器的打印装置。 还公开了一种通过使用检测器来检测在打印装置中使用的打印介质的特性的方法。 本文描述了检测器和打印装置的其它特征和特征。 本文还描述了该方法的其它特征和步骤。
    • 7. 发明授权
    • Method of trimming an electronic circuit
    • 修剪电子电路的方法
    • US5446260A
    • 1995-08-29
    • US182926
    • 1994-01-18
    • Thomas F. UhlingPhilip J. YearsleyDale L. PittockMark E. Mathews
    • Thomas F. UhlingPhilip J. YearsleyDale L. PittockMark E. Mathews
    • G01R1/067G01R35/00B23K26/02
    • G01R1/06772G01R35/005Y10T29/49004Y10T29/49082Y10T29/49099
    • An electronic probe circuit having ac and dc amplifiers and an input compensation subcircuit is enclosed within a trim housing that replicates the electrical effect of the probe housing. The circuit is laser trimmed through ports in the trim housing. The difference between the voltage at 80 nsec and 1.4 .mu.sec points on a step voltage provides a first calibration factor while the difference between the 3 nsec voltage and the 80 nsec voltage provides a second calibration factor. A resistor in the DC amplifier is trimmed to an absolute voltage with a step scan laser cut. A resistor in the AC amplifier is trimmed with a laser L-cut until the difference between the 80 nsec and 1.4 .mu.sec points of the step voltage equals the first calibration factor. A capacitor in the input compensation subcircuit is trimmed until the voltage difference between the 3 nsec and 80 nsec points equals the second calibration factor.
    • 具有交流和直流放大器和输入补偿子电路的电子探针电路被封装在复制壳体内的复合壳体中,该装置复制探针壳体的电效应。 电路通过装饰外壳中的端口进行激光修整。 在步进电压80ns和1.4μs之间的电压之间的差异提供了第一校准因子,而3nsec电压和80nsec电压之间的差提供了第二校准因子。 直流放大器中的电阻器通过步进扫描激光切割被修整为绝对电压。 AC放大器中的电阻器用激光L切割器修整,直到步进电压的80ns和1.4μs的差值等于第一校准因子。 输入补偿子电路中的电容器被修整,直到3 ns和80 ns之间的电压差等于第二个校准因子。
    • 8. 发明授权
    • Capacitively-coupled amplifier with improved low frequency response
    • 具有改善的低频响应的电容耦合放大器
    • US5392001A
    • 1995-02-21
    • US202329
    • 1994-02-28
    • Thomas F. UhlingJohn M. HeumannRonald J. Peiffer
    • Thomas F. UhlingJohn M. HeumannRonald J. Peiffer
    • G01R1/067G01R1/30H03F1/08H03F1/48H03F1/38
    • H03F1/48G01R1/06766G01R1/30H03F1/083
    • A capacitively-coupled amplifier circuit includes an amplifier for receiving an input signal via a coupling capacitance and for amplifying the input signal to produce an output signal. A resistor provides a bias voltage to the amplifier. The resistor is bootstrapped using positive feedback with a loop gain of slightly less than one. The bootstrapping causes an increase in the value of the resistor to lower the cut-in (pole) frequency of the amplifier. The bootstrapping or feedback circuit includes a roll-off (pole) at a frequency below the roll-off (pole) frequency of the amplifier. This prevents phase shift in the feedback loop from adversely effecting the high frequency response of the amplifier. The resulting amplifier circuit exhibits a wide passband and excellent low frequency response despite having a capacitively coupled input signal.
    • 电容耦合放大器电路包括用于经由耦合电容接收输入信号并用于放大输入信号以产生输出信号的放大器。 电阻器为放大器提供偏置电压。 电阻器使用正反馈自举,循环增益略小于1。 自举引起电阻值的增加,以降低放大器的截止(极)频率。 自举或反馈电路包括频率低于放大器的滚降(极)频率的滚降(极)。 这样可以防止反馈回路中的相移不利地影响放大器的高频响应。 尽管具有电容耦合的输入信号,但是所得到的放大器电路具有宽的通带和优异的低频响应。
    • 9. 发明授权
    • Multiple lead voltage probe and method of making same
    • 多引线电压探头及其制作方法
    • US5898312A
    • 1999-04-27
    • US846814
    • 1997-04-30
    • Thomas F. UhlingDavid J. DascherKeith C. Griggs
    • Thomas F. UhlingDavid J. DascherKeith C. Griggs
    • G01R1/073G01R13/28G01R31/28G01R31/02
    • G01R31/2886G01R1/073G01R31/2844Y10T29/49004Y10T29/49147
    • A probe head includes analog amplifier inputs, a ground plane, and hundreds of probe leads between the inputs and the pins of a circuit under test. The customer defines the grounded pins of the circuit under test. Non-active probe leads, i.e. leads corresponding to the grounded pins are connected to the ground plane, maximizing the connections between the grounds of the probe and the circuit under test and minimizing unequal ground potentials. The probe circuit is on a probe circuit board, while the connections between the ground plane and the leads are fusible elements on a separate ground personality board. The probe is placed on a simulated circuit under test, the grounded pins on the circuit under test are protected by an insulating cap, and a voltage is placed on the remainder of the pins to fuse the elements corresponding the active probe leads.
    • 探头包括模拟放大器输入,接地层以及输入端和被测电路引脚之间的数百个探针。 客户定义被测电路的接地引脚。 无源探头引线,即对应于接地引脚的引线连接到接地平面,使探头接地和被测电路之间的连接最大化,并使不等的接地电位最小化。 探头电路位于探针电路板上,而接地平面和引线之间的连接是独立接地人格板上的可熔元件。 将探头放置在被测电路上,被测电路上的接地引脚由绝缘盖保护,并且其余引脚上的电压被放置在与激活的探头引线对应的元件上。
    • 10. 发明授权
    • Active trim method and apparatus
    • 主动装饰方法和装置
    • US5602483A
    • 1997-02-11
    • US394855
    • 1995-02-27
    • Thomas F. UhlingPhilip J. YearsleyDale L. PittockMark E. Mathews
    • Thomas F. UhlingPhilip J. YearsleyDale L. PittockMark E. Mathews
    • G01R1/067G01R35/00
    • G01R1/06772G01R35/005Y10T29/49004Y10T29/49082Y10T29/49099
    • An electronic probe circuit having ac and dc amplifiers and an input compensation subcircuit is enclosed within a trim housing that replicates the electrical effect of the probe housing. The circuit is laser trimmed through ports in the trim housing. The difference between the voltage at 80 nsec and 1.4 .mu.sec points on a step voltage provides a first calibration factor while the difference between the 3 nsec voltage and the 80 nsec voltage provides a second calibration factor. A resistor in the DC amplifier is trimmed to an absolute voltage with a step scan laser cut. A resistor in the AC amplifier is trimmed with a laser L-cut until the difference between the 80 nsec and 1.4 .mu.sec points of the step voltage equals the first calibration factor. A capacitor in the input compensation subcircuit is trimmed until the voltage difference between the 3 nsec and 80 nsec points equals the second calibration factor.
    • 具有交流和直流放大器和输入补偿子电路的电子探针电路被封装在复制壳体内的复合壳体中,该装置复制探针壳体的电效应。 电路通过装饰外壳中的端口进行激光修整。 在步进电压80ns和1.4μs之间的电压之间的差异提供了第一校准因子,而3nsec电压和80nsec电压之间的差提供了第二校准因子。 直流放大器中的电阻器通过步进扫描激光切割被修整为绝对电压。 AC放大器中的电阻器用激光L切割器修整,直到步进电压的80ns和1.4μs的差值等于第一校准因子。 输入补偿子电路中的电容器被修整,直到3 ns和80 ns之间的电压差等于第二个校准因子。