专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US09015444B2 Access apparatus and available storage space calculation method 有权
标题翻译：访问装置和可用的存储空间计算方法
公开(公告)号：US09015444B2
公开(公告)日：2015-04-21
申请号：US12672373
申请日：2009-06-05
申请人： Takuji Maeda , Tsutomu Mori , Masafumi Nosaka , Takeshi Umemoto
发明人： Takuji Maeda , Tsutomu Mori , Masafumi Nosaka , Takeshi Umemoto
IPC分类号： G06F12/00 , G06F3/06 , G06F17/30
CPC分类号： G06F3/0644 , G06F3/0611 , G06F3/0643 , G06F3/0679 , G06F17/30091 , G06F17/30138
摘要： A method used in an access module that uses a file system to manage a nonvolatile memory of an information recording module enables an available storage space to be calculated in a short time before file data is recorded, and shortens the time required from initialization of the file system to recording. An access module (1) manages information about area management of the file system configured in an information recording module in units of fixed-length blocks. A divisional available storage space calculation unit (103) performs an available storage space calculation process in units of the fixed-length blocks, and completes preparations for recording when detecting a minimum required storage space for recording file data and enables recording of the file data. This shortens the time required from initialization of the file system to recording.
摘要翻译：在使用文件系统管理信息记录模块的非易失性存储器的访问模块中使用的方法使得能够在文件数据被记录之前的短时间内计算可用存储空间，并且缩短文件初始化所需的时间系统录音。访问模块（1）以固定长度块为单位管理在信息记录模块中配置的文件系统的区域管理的信息。分割可用存储空间计算单元（103）以固定长度块为单位执行可用存储空间计算处理，并且在检测用于记录文件数据的最小所需存储空间并完成文件数据的记录时，完成记录准备。这缩短了从文件系统初始化到录制所需的时间。

2. 发明申请

US20080156988A1 Scanning Probe Microscope and Scanning Method 有权
标题翻译：扫描探针显微镜和扫描方法
公开(公告)号：US20080156988A1
公开(公告)日：2008-07-03
申请号：US11961847
申请日：2007-12-20
申请人： Takeshi Umemoto , Norio Ookubo
发明人： Takeshi Umemoto , Norio Ookubo
IPC分类号： G01N23/00
CPC分类号： G01Q10/06
摘要： To realize to adapt to a shape of a surface, shorten a measurement time period and promote a measurement accuracy by setting a sampling interval in accordance with a slope of the shape of the surface and controlling a stylus in accordance with the interval, there is provided a scanning probe microscope, in which in scanning the stylus, an observation data immediately therebefore is stored as a history, the sampling interval in X or Y direction is set at each time based on a shape of the observation data, and the stylus is scanned to a successive sampling position.
摘要翻译：为了实现适应于表面的形状，缩短测量时间并且通过根据表面的形状的斜率设置采样间隔并根据间隔来控制触笔来提高测量精度，扫描探针显微镜，其中扫描探针时，将之前立即存在的观测数据作为历史存储，基于观察数据的形状，每次设置X或Y方向上的采样间隔，并且对扫描仪进行扫描到连续取样位置。

3. 发明申请

US20060203230A1 Manufacturing inspection/analysis system analyzing device, analyzing device control program, storage medium storing analyzing device control program, and method for manufacturing inspection and analysis 有权
标题翻译：制造检验/分析系统分析装置，分析装置控制程序，存储分析装置控制程序的存储介质以及制造检验和分析的方法
公开(公告)号：US20060203230A1
公开(公告)日：2006-09-14
申请号：US11369934
申请日：2006-03-08
申请人： Nobuyuki Ohminami , Masaru Tanaka , Takeshi Umemoto
发明人： Nobuyuki Ohminami , Masaru Tanaka , Takeshi Umemoto
IPC分类号： G01N21/88
CPC分类号： G01N21/956 , G01N21/94 , G01N21/9501
摘要： A position change section of a processing device changes the position of a treatment object, at the time of performing a process by a process section, to correspond to a predetermined position in conformity to the treatment object. An inspection device inspects the occurrence of a defect on the treatment object having been subjected to processes by a plurality of processing devices. Then an analyzing process for specifying in which processing device the defect occurred is carried out based on (i) positional information of the treatment object, in each of the processing devices, and (ii) defect information defected by the inspection device. With this arrangement, during the process of manufacture of treatment objects, it is possible to precisely specify which processing device or processing device group caused the defect, without performing processes such as attaching, to the treatment object, information regarding processing devices which have conducted processes.
摘要翻译：处理装置的位置改变部分在执行处理部分的处理时改变处理对象的位置，以对应于与处理对象一致的预定位置。检查装置检查已经经过多个处理装置的处理的处理对象的缺陷的发生。然后，根据（i）处理对象的位置信息，每个处理装置，以及（ii）检测装置所缺陷的缺陷信息，进行用于指定哪个处理装置发生缺陷的分析处理。通过这种布置，在处理对象的制造过程中，可以精确地指定哪个处理装置或处理装置组造成缺陷，而不进行诸如将处理对象附加到已经进行处理的处理装置的信息的处理。

4. 发明授权

US06765283B2 Semiconductor device with multi-layer interlayer dielectric film 失效
标题翻译：具有多层层间绝缘膜的半导体器件
公开(公告)号：US06765283B2
公开(公告)日：2004-07-20
申请号：US10201646
申请日：2002-07-24
申请人： Takeshi Umemoto
发明人： Takeshi Umemoto
IPC分类号： H01L2358
CPC分类号： H01L21/76834 , H01L21/76808 , H01L21/76829 , H01L23/53295 , H01L2924/0002 , H01L2924/00
摘要： A semiconductor device comprising: an underlayer interconnect layer; an interlayer dielectric film formed with a connection hole reaching the underlayer interconnect layer; and an upper interconnect layer buried in the connection hole, wherein the interlayer dielectric film includes an insulating film containing an impurity for detecting a first etching end point, a first insulating film, an insulating film containing an impurity for detecting a second etching end point and a second insulating film, these four films being laminated in this order.
摘要翻译：一种半导体器件，包括：下层互连层; 形成有到达下层互连层的连接孔的层间绝缘膜; 以及埋入所述连接孔中的上互连层，其中所述层间电介质膜包括含有用于检测第一蚀刻终点的杂质的绝缘膜，第一绝缘膜，含有用于检测第二蚀刻终点的杂质的绝缘膜，第二绝缘膜，这四个膜依次层压。

5. 发明授权

US6165818A Method of manufacturing a semiconductor device with a pair of radiating terminals and a plurality of lead terminals formed from a single lead frame 失效
标题翻译：制造具有一对辐射端子的半导体器件和由单个引线框形成的多个引线端子的方法
公开(公告)号：US6165818A
公开(公告)日：2000-12-26
申请号：US74120
申请日：1998-05-07
申请人： Seiji Ichikawa , Takeshi Umemoto , Toshiaki Nishibe , Kazunari Sato , Kunihiko Tsubota , Masato Suga , Yoshikazu Nishimura , Keita Okahira , Tatsuya Miya , Toru Kitakoga , Kazuhiro Tahara
发明人： Seiji Ichikawa , Takeshi Umemoto , Toshiaki Nishibe , Kazunari Sato , Kunihiko Tsubota , Masato Suga , Yoshikazu Nishimura , Keita Okahira , Tatsuya Miya , Toru Kitakoga , Kazuhiro Tahara
IPC分类号： H01L23/50 , H01L23/495 , H01L21/44 , H01L21/495
CPC分类号： H01L23/49568 , H01L2924/0002 , H01L2924/00
摘要： A semiconductor device is disclosed wherein a pair of radiating terminals and a plurality of lead terminals are formed from a single lead frame. A hole or holes in each radiating terminal are formed with an equal width and in an equal pitch to those of gaps between the lead terminals, and the opposite sides of each hole of the radiating terminal are connected to each other by a support element. The support elements of the radiating terminals and support elements which interconnect the lead terminals are formed with an equal length and in an equal pitch to allow the support elements to be cut away by a plurality of punches which are arranged in an equal pitch and have an equal width.
摘要翻译：公开了一种半导体器件，其中一对辐射端子和多个引线端子由单个引线框形成。每个辐射端子中的孔或孔以与引线端子之间的间隙相等的间距形成，并且辐射端子的每个孔的相对侧通过支撑元件彼此连接。互连引线端子的辐射端子和支撑元件的支撑元件形成为具有相同的长度和相等的间距，以允许支撑元件被以相等间距排列的多个冲头切除，并具有宽度相等

6. 发明申请

US20110083007A1 RECORDING DEVICE AND METHOD FOR ACTIVATING THE SAME 审中-公开
标题翻译：记录装置及其活化方法
公开(公告)号：US20110083007A1
公开(公告)日：2011-04-07
申请号：US12997348
申请日：2009-06-08
申请人： Tsutomu Mori , Masafumi Nosaka , Takeshi Hasegawa , Takeshi Umemoto
发明人： Tsutomu Mori , Masafumi Nosaka , Takeshi Hasegawa , Takeshi Umemoto
IPC分类号： G06F9/24
CPC分类号： H04N5/772 , G11B20/10 , G11B2020/10768 , G11B2220/61 , H04N5/907 , H04N9/8042
摘要： A recording device (101) can record data to a recording medium (164) that executes initialization operation when the recording medium (164) receives an initialization command, and the recording device (101) includes controller (160) for controlling operation of the recording device (101) and storage unit (190) for storing an operating system (5) which is executed by the controller (160) after a start-up of the recording device (101) is completed, and provides a predetermined function. The controller (160) performs start-up control so that the controller provides an instruction for initializing the recording medium when the recording device (101) is powered on, and, in parallel with the initialization of the recording medium (164), the controller (160) executes initialization of the operating system (5).
摘要翻译：记录装置（101）可以在记录介质（164）接收到初始化命令时将数据记录到执行初始化操作的记录介质（164），并且记录装置（101）包括用于控制记录操作的控制器（160）完成了在记录装置（101）启动之后由控制器（160）执行的用于存储操作系统（5）的装置（101）和存储单元（190），并提供预定的功能。控制器（160）执行启动控制，使得当记录装置（101）通电时，控制器提供用于初始化记录介质的指令，并且与记录介质（164）的初始化并行，控制器（160）执行操作系统（5）的初始化。

7. 发明申请

US20090000365A1 AFM Tweezers, Method for Producing AFM Tweezers, and Scanning Probe Microscope 有权
标题翻译： AFM镊子，生产AFM镊子的方法和扫描探针显微镜
公开(公告)号：US20090000365A1
公开(公告)日：2009-01-01
申请号：US12143410
申请日：2008-06-20
申请人： Tatsuya KOBAYASHI , Masato SUZUKI , Masatoshi YASUTAKE , Takeshi UMEMOTO
发明人： Tatsuya KOBAYASHI , Masato SUZUKI , Masatoshi YASUTAKE , Takeshi UMEMOTO
IPC分类号： G12B21/08
CPC分类号： G01Q60/38 , G01Q80/00 , Y10S977/962
摘要： AFM tweezers includes: a first probe that comprises a triangular prism member having a ridge, a tip of which is usable as a probe tip in a scanning probe microscope; a second probe that comprises a triangular prism member provided so as to open/close with respect to the first probe. The first probe and the second probe are juxtaposed such that a predetermined peripheral surface of the triangular prism member of the first probe and a predetermined peripheral surface of the triangular prism member of the second probe face substantially in parallel to each other, and the first probe formed of a notch that prevents interference with a sample when the sample is scanned by the tip of the ridge.
摘要翻译： AFM镊子包括：第一探针，其包括具有脊的三角形棱镜构件，其尖端可用作扫描探针显微镜中的探针尖端; 第二探针，包括设置成相对于第一探针打开/关闭的三角形棱镜部件。第一探针和第二探针并置，使得第一探针的三角形棱镜构件的预定外周表面和第二探针的三角形棱镜构件的预定外周表面基本上彼此平行，并且第一探针形成为当样品被脊的尖端扫描时防止样品干扰的凹口。

8. 发明授权

US06242797B1 Semiconductor device having pellet mounted on radiating plate thereof 失效
标题翻译：具有安装在其散热板上的颗粒的半导体器件
公开(公告)号：US06242797B1
公开(公告)日：2001-06-05
申请号：US09059324
申请日：1998-04-13
申请人： Seiji Ichikawa , Takeshi Umemoto , Toshiaki Nishibe , Kazunari Sato , Kunihiko Tsubota , Masato Suga , Yoshikazu Nishimura , Keita Okahira , Tatsuya Miya , Toru Kitakoga , Kazuhiro Tahara
发明人： Seiji Ichikawa , Takeshi Umemoto , Toshiaki Nishibe , Kazunari Sato , Kunihiko Tsubota , Masato Suga , Yoshikazu Nishimura , Keita Okahira , Tatsuya Miya , Toru Kitakoga , Kazuhiro Tahara
IPC分类号： H01L2348
CPC分类号： H01L23/49568 , H01L24/48 , H01L24/49 , H01L2224/48091 , H01L2224/48247 , H01L2224/49171 , H01L2924/00014 , H01L2924/01079 , H01L2924/13055 , H01L2924/14 , H01L2924/181 , H01L2924/00 , H01L2224/45015 , H01L2924/207 , H01L2924/00012 , H01L2224/45099 , H01L2224/05599 , H01L2224/85399
摘要： A semiconductor device having a pellet mounted on a radiating plate thereof is disclosed. The radiating plate is formed in such a shape that a central portion thereof is positioned higher than both end portions thereof. A pellet is mounted on a lower face of the central portion of the radiating plate, and an upper face of the central portion of the radiating plate is exposed to the top of a resin member. Since the upper face of the central portion of the radiating plate which has the pellet mounted on the lower face thereof is exposed from the resin member, heat generated by the pellet can be radiated efficiently.
摘要翻译：公开了一种具有安装在其散热板上的颗粒的半导体器件。散热板形成为使其中央部位高于其两端部的形状。在散热板的中央部的下表面安装有颗粒，并且散热板的中央部的上表面暴露于树脂部件的顶部。由于具有安装在其下表面的颗粒的散热板的中心部分的上表面从树脂构件露出，所以可以有效地辐射由颗粒产生的热量。

9. 发明授权

US06242736B1 Scanning probe microscope 失效
标题翻译：扫描探头显微镜
公开(公告)号：US06242736B1
公开(公告)日：2001-06-05
申请号：US09116319
申请日：1998-07-15
申请人： Akihiko Honma , Takeshi Umemoto , Akira Inoue
发明人： Akihiko Honma , Takeshi Umemoto , Akira Inoue
IPC分类号： G01N1312
CPC分类号： G01Q30/04 , Y10S977/85
摘要： A scanning probe microscope for scanning a probe needle in proximity to a surface of a sample in XY-axis directions while moving at least one of the probe and the sample in a Z-axis direction has a plurality of band-pass filters for passing a plurality of band-pass signals by extracting predetermined frequency bands different one another from a surface geometry signal output by a probe. An image memory stores the respective band-pass signals and corresponding positions on the sample surface, and a color image outputting device outputs a color image by treating each of the respective band-pass signals stored as image data in the image memory as different color data and combining the data. The plurality of band-pass signals includes a first band-pass signal having a first frequency range set to include only abrupt transitions in the sample surface and a second band-pass signal having a second frequency range set to include frequencies slightly outside the first frequency range so that abrupt transitions in geometry on the sample surface are represented by a first color in response to the first band-pass signal and areas directly adjacent the abrupt transitions on the sample surface are represented by a second color different from the first color.
摘要翻译：扫描探针显微镜，用于在沿Z轴方向移动探头和样本中的至少一个的同时沿XY轴方向扫描样品表面附近的探针，具有多个带通滤波器，用于使通过从由探针输出的表面几何信号中提取彼此不同的预定频带，来产生多个带通信号。图像存储器将各个带通信号和相应的位置存储在样本表面上，并且彩色图像输出装置通过将作为图像数据存储的各个带通信号中的每一个作为不同的颜色数据进行处理来输出彩色图像并组合数据。多个带通信号包括具有第一频率范围的第一带通信号，其中第一频率范围被设置为仅包括采样表面中的突变，以及具有第二频率范围的第二带通信号，第二频带设置为包括稍微在第一频率之外的频率范围，使得样品表面上的几何形状的突变过渡由第一颜色响应于第一带通信号表示，并且与样品表面上的突然跃迁直接相邻的区域由不同于第一颜色的第二颜色表示。

10. 发明授权

US06104086A Semiconductor device having lead terminals bent in J-shape 失效
标题翻译：具有弯曲成J形的引线端子的半导体器件
公开(公告)号：US06104086A
公开(公告)日：2000-08-15
申请号：US59316
申请日：1998-04-13
申请人： Seiji Ichikawa , Takeshi Umemoto , Toshiaki Nishibe , Kazunari Sato , Kunihiko Tsubota , Masato Suga , Yoshikazu Nishimura , Keita Okahira , Tatsuya Miya , Toru Kitakoga , Kazuhiro Tahara
发明人： Seiji Ichikawa , Takeshi Umemoto , Toshiaki Nishibe , Kazunari Sato , Kunihiko Tsubota , Masato Suga , Yoshikazu Nishimura , Keita Okahira , Tatsuya Miya , Toru Kitakoga , Kazuhiro Tahara
IPC分类号： H01L21/56 , H01L21/48 , H01L23/31 , H01L23/433 , H01L23/50 , H01L23/48
CPC分类号： H01L21/4842 , H01L23/3107 , H01L23/4334 , H01L2224/48247 , H01L24/48 , H01L2924/00014 , H01L2924/14 , H01L2924/181
摘要： A semiconductor device having lead terminals bent in a J-shape is disclosed. A radiating plate having a recess formed on an outer peripheral portion thereof is exposed to a lower face of a resin member and free ends of outer portions of the lead terminals are positioned in the recess of the radiating plate. The free ends of the outer portions of the lead terminals and the recess of the radiating plate are isolated from each other by projections of the resin member. Since the radiating plate is exposed to the lower face of the resin member, the heat radiating property is high whereas the radiating plate and the lead terminals are not short-circuited to each other at all.
摘要翻译：公开了一种具有弯曲成J形的引线端子的半导体器件。具有形成在其外周部上的凹部的散热板暴露于树脂构件的下表面，引线端子的外部的自由端位于散热板的凹部中。引线端子的外部部分和辐射板的凹部的自由端通过树脂部件的突起彼此隔离。由于辐射板暴露于树脂构件的下表面，所以散热性高，而辐射板和引线端子根本不相互短路。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式