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1. 发明专利

JP2005270234A Gliding body with handle, skidding surface and rail 审中-公开
标题翻译：具有手柄，滑动表面和轨道的玻璃体
公开(公告)号：JP2005270234A
公开(公告)日：2005-10-06
申请号：JP2004085563
申请日：2004-03-23
申请人： Takeo Miura , 三浦武夫
发明人： MIURA TAKEO
IPC分类号： A63C5/06 , A63C5/00 , A63C5/044
摘要： PROBLEM TO BE SOLVED: To provide a gliding body which enables anybody to enjoy spiral slaloms and other various mobilities by increasing the safety and operability of the gliding bodies for skis, snowboards, sleighs and the like.
SOLUTION: The handle fixed on the front of the gliding body can stabilize the slope gliding and produces a strong turning power to improve the operability remarkably while reducing the tumbling. Regardless of the age, this enables the beginners and low-skilled persons to experience a high-level down-gliding technique and additionally, the skidding surface can reduce the resistance against the snow surface at the turning moment and so makes the spinning spiral slalom gliding possible with the rail having a curved surface as the center of rotation. Further possible are the midair rotary motion in jump and a new slalom racing using a spiral snowboard or a spiral sleigh and the toboggan racing with the spiral sleigh can be done with relative ease simply by building the side wall of snow or ice. Thus, this provides a gliding body with the handle, the skidding surface and the rail, enables anybody to enjoy the riding and moreover, can create diversified mobilities thereby contributing to the amusement, heath and economy in the snow countries.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：提供一种滑翔体，其能够通过增加用于滑雪板，滑雪板，雪橇等的滑动体的安全性和可操作性而使任何人享受螺旋回旋和其他各种移动性。
解决方案：固定在滑行体前部的手柄可以稳定斜坡滑行，产生强烈的转向力，从而在减少翻滚的同时显着提高操作性。无论年龄如何，这使得初学者和低技能人员能够体验到高水平的滑翔技术，此外，滑动面可以减少转弯时对雪面的抵抗力，从而使旋转螺旋回旋滑翔可能的是，轨道具有作为旋转中心的曲面。进一步可能的是跳跃中的空中旋转运动和使用螺旋滑雪板或螺旋雪橇的新的回旋赛，并且通过构建雪或冰的侧壁可以相对简单地进行具有螺旋雪橇的雪橇赛车。因此，这提供了一个具有手柄，打滑表面和轨道的滑翔体，使任何人都能享受骑马，而且可以创造多样化的动作，从而为雪国家的娱乐，健康和经济做出贡献。版权所有（C）2006，JPO＆NCIPI

2. 发明申请

US20070022346A1 Test apparatus and test method 失效
标题翻译：试验装置及试验方法
公开(公告)号：US20070022346A1
公开(公告)日：2007-01-25
申请号：US11495186
申请日：2006-07-28
申请人： Hiroaki Nishimine , Hirokatsu Niijima , Takeo Miura
发明人： Hiroaki Nishimine , Hirokatsu Niijima , Takeo Miura
IPC分类号： G01R31/28
CPC分类号： G01R31/31932 , G01R31/31924
摘要： A test apparatus for testing a device under test 15 is provided. The test apparatus includes a driver 122 for applying a test signal to the device under test, a comparator 128 for comparing a result signal outputted by the device under test 15 corresponding to the applied test signal with a predetermined reference voltage and a setting voltage output section 110 for setting the voltage of the test signal to a predetermined voltage value to cause the driver 122 to terminate the transmission path of the result signal when the test apparatus reads from the device under test 15.
摘要翻译：提供了一种用于测试被测设备15的测试装置。测试装置包括用于将测试信号施加到被测器件的驱动器122，用于将由被测器件15输出的结果信号与所施加的测试信号相对应的比较器128与预定参考电压进行比较;以及设定电压输出部分 110，用于将测试信号的电压设置为预定电压值，以使得当测试设备从被测器件15读取时，驱动器122终止结果信号的传输路径。

3. 发明授权

US3544833A Animatable picture-image representing system 失效
标题翻译：动画图像图像代表系统
公开(公告)号：US3544833A
公开(公告)日：1970-12-01
申请号：US3544833D
申请日：1967-06-22
申请人： TAKEO MIURA , JUNZO IWATA , JUNJI TSUDA
发明人： MIURA TAKEO , IWATA JUNZO , TSUDA JUNJI
IPC分类号： G06G7/22 , G06G7/26 , H01J29/70
CPC分类号： G06G7/26 , G06G7/22

4. 发明授权

US07409615B2 Test apparatus and test method 失效
标题翻译：试验装置及试验方法
公开(公告)号：US07409615B2
公开(公告)日：2008-08-05
申请号：US11495186
申请日：2006-07-28
申请人： Hiroaki Nishimine , Hirokatsu Niijima , Takeo Miura
发明人： Hiroaki Nishimine , Hirokatsu Niijima , Takeo Miura
IPC分类号： G01R31/28 , G06F11/00
CPC分类号： G01R31/31932 , G01R31/31924
摘要： A test apparatus for testing a device under test 15 is provided. The test apparatus includes a driver 122 for applying a test signal to the device under test, a comparator 128 for comparing a result signal outputted by the device under test 15 corresponding to the applied test signal with a predetermined reference voltage and a setting voltage output section 110 for setting the voltage of the test signal to a predetermined voltage value to cause the driver 122 to terminate the transmission path of the result signal when the test apparatus reads from the device under test 15.
摘要翻译：提供了一种用于测试被测设备15的测试装置。测试装置包括用于将测试信号施加到被测器件的驱动器122，用于将由被测器件15输出的结果信号与所施加的测试信号相对应的比较器128与预定参考电压进行比较;以及设定电压输出部分 110，用于将测试信号的电压设置为预定电压值，以使得当测试设备从被测器件15读取时，驱动器122终止结果信号的传输路径。

5. 发明授权

US06789224B2 Method and apparatus for testing semiconductor devices 有权
标题翻译：用于半导体器件测试的方法和装置
公开(公告)号：US06789224B2
公开(公告)日：2004-09-07
申请号：US09761199
申请日：2001-01-16
申请人： Takeo Miura
发明人： Takeo Miura
IPC分类号： G01R3128
CPC分类号： G01R31/31937
摘要： Data output from a semiconductor device under test and a reference clock output therefrom in synchronization with the data are sampled by slightly phased-apart multiphase strobe pulses. The phases of points of change of the output data and the reference clock are obtained from the sampled outputs, then the phase difference between them is measured, and a check is made to determine if the phase difference falls within a predetermined range, thereby evaluating the semiconductor device under test on a pass/fail basis.
摘要翻译：从被测半导体器件输出的数据和与数据同步输出的参考时钟通过稍微相位分开的多相选通脉冲进行采样。从采样输出获得输出数据和参考时钟的变化点的相位，然后测量它们之间的相位差，并进行检查以确定相位差是否在预定范围内，由此评估半导体器件在通过/失败的基础上进行测试。

6. 发明授权

US6016565A Semiconductor device testing apparatus 失效
标题翻译：半导体器件测试仪器
公开(公告)号：US6016565A
公开(公告)日：2000-01-18
申请号：US874669
申请日：1997-06-13
申请人： Takeo Miura
发明人： Takeo Miura
IPC分类号： G01R31/319 , G01R31/3193 , G01R31/28
CPC分类号： G01R31/31937 , G01R31/31922
摘要： A strobe generator includes four strobe pulse generators generating original strobe pulses having the same frequency, respectively, and correspondingly, four logical comparator circuits, the number of which is identical to that of the strobe pulse generators. Further, a mode selection circuit is provided which can set any one of mode 1, mode 2 and mode 3. In mode 1, an output signal V from a level comparator is latched by a new high speed strobe signal having a frequency four times the frequency of the original strobe pulse, and the latched signals are sequentially compared with expected value data signals. In mode 2, an output signal V from the level comparator is latched by two new high speed strobe signals having a frequency two times the frequency of the original strobe pulse, and the latched signals are sequentially compared with the expected value data signals. In mode 3, an output signal V from the level comparator is latched by four new strobe signals having the same frequency as the frequency of the original strobe pulse and different phases from one another, and the latched signals are sequentially compared with the expected value data signals.
摘要翻译：选通发生器包括四个选通脉冲发生器，分别产生具有相同频率的原始选通脉冲，相应地，四个逻辑比较器电路的数量与选通脉冲发生器的数量相同。此外，提供了可以设置模式1，模式2和模式3中的任何一个的模式选择电路。在模式1中，来自电平比较器的输出信号V被新的高速选通信号锁存，频率为频率的四倍原始选通脉冲的频率和锁存信号与期望值数据信号顺序地比较。在模式2中，来自电平比较器的输出信号V被两个具有原始选通脉冲的频率的两倍的新的高速选通信号锁存，并且锁存的信号被顺序地与预期值数据信号进行比较。在模式3中，来自电平比较器的输出信号V被四个具有与原始选通脉冲的频率相同的频率和不同相位的新的选通信号锁存，并且锁存的信号被顺序地与预期值数据进行比较信号。

7. 发明授权

US5044646A Scooter type vehicle 失效
标题翻译：滑板车型
公开(公告)号：US5044646A
公开(公告)日：1991-09-03
申请号：US296881
申请日：1989-01-12
申请人： Tsuyoshi Iiga , Yasuji Kitasei , Junji Kikuno , Nobuo Yamaguchi , Yoshio Nakagomi , Takeo Miura
发明人： Tsuyoshi Iiga , Yasuji Kitasei , Junji Kikuno , Nobuo Yamaguchi , Yoshio Nakagomi , Takeo Miura
IPC分类号： B62J1/12 , B62J1/18 , B62K19/46 , B62M7/06 , B62M7/08
CPC分类号： B62J1/18 , B62J1/12 , B62K19/46 , B62M7/06 , B62M7/08
摘要： A motor scooter with an enlarged storage compartment that decreases the overall bulk and weight of the vehicle. The storage compartment is effectively sealed to prevent water or spilled fuel from leaking therein, yet provides easy access to the engine located beneath it for purposes of maintenance and inspection. The contents of the storage compartment are protected from the heat generated by the engine which is in close proximity by an insulating wall construction.
摘要翻译：具有放大储藏室的摩托车减少车辆的整体体积和重量。储存室被有效地密封以防止水或溢出的燃料泄漏在其中，但是为了维护和检查的目的，提供了容易地进入位于其下方的发动机。储存室的内容物被保护免受由绝缘壁结构紧邻的发动机产生的热量。

8. 外观设计

USD290824S Motorcycle 失效
公开(公告)号：USD290824S
公开(公告)日：1987-07-14
申请号：US677721
申请日：1984-12-04
申请人： Takeo Miura , Junji Kikuchi
设计人： Takeo Miura , Junji Kikuchi

9. 发明授权

US4536005A Front leg shield for a motor scooter 失效
标题翻译：用于摩托车的前腿护罩
公开(公告)号：US4536005A
公开(公告)日：1985-08-20
申请号：US473136
申请日：1983-03-07
申请人： Norio Tanaka , Takeo Miura , Jiro Miyata
发明人： Norio Tanaka , Takeo Miura , Jiro Miyata
IPC分类号： B62J17/00 , B62J17/06
CPC分类号： B62J17/06 , Y10T16/54028 , Y10T16/54038
摘要： A shield for a motor scooter to protect the front legs of the operator. The shield includes extension panels pivotally mounted about hinges to the upper front panel. The extension panels may be oriented to assume multiple positions which can selectively remove the panels from the windstream, direct additional air toward the rider and provide additional shielding against air flow. Hinge mechanisms including oblong hinge pins are employed to provide various stable positions for the extension panels.
摘要翻译：用于摩托车的护罩，用于保护操作者的前腿。护罩包括围绕铰链枢转地安装到上前面板的延伸面板。延伸面板可以被定向成呈现多个位置，其可以从风流中选择性地移除面板，将额外的空气引导到骑手并且提供额外的防止气流的屏蔽。使用包括长方形铰链销的铰链机构为延伸板提供各种稳定的位置。

10. 发明授权

US07283920B2 Apparatus and method for testing semiconductor device 有权
标题翻译：半导体器件测试装置及方法
公开(公告)号：US07283920B2
公开(公告)日：2007-10-16
申请号：US10732763
申请日：2003-12-10
申请人： Masaru Doi , Takeo Miura
发明人： Masaru Doi , Takeo Miura
IPC分类号： G01M19/00
CPC分类号： G01R31/31725 , G01R31/02 , G01R31/31937
摘要： A phase difference between a timing of rising or falling of the data read from a semiconductor device to be test and a timing of rising or falling of a reference clock outputted synchronized with the data is measured by operating sampling with strobe pulses configured with multi-phase pulses given the phase difference by a small amount in regard to the timing of the data and the timing of the reference clock. In addition, a glitch of the data is detected, and the quality of the semiconductor device to be tested is judged based on the phase difference and/or the glitch.
摘要翻译：从被测半导体器件读出的数据的上升或下降定时与数据同步输出的基准时钟的上升或下降时间之间的相位差通过以多相配置的选通脉冲进行采样来测量相对于数据的定时和参考时钟的定时，给予相位差少的脉冲。此外，检测数据的毛刺，并且基于相位差和/或毛刺来判断要测试的半导体器件的质量。

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