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    • 3. 发明授权
    • Device and method for leak location
    • 泄漏位置的设备和方法
    • US4583394A
    • 1986-04-22
    • US638421
    • 1984-08-07
    • Yoshio MurakamiKenjiroh ObaraTetsuya AbeYasuo ShimomuraTakemasa Shibata
    • Yoshio MurakamiKenjiroh ObaraTetsuya AbeYasuo ShimomuraTakemasa Shibata
    • G01M3/20G01M3/22
    • G01M3/202
    • A method and apparatus are disclosed for detecting the presence of very fine leaks through the walls of an enclosure which include a sniffer nozzle (1) open to the atmosphere, a vessel (5) having molecular sieves (4) therein for adsorbing substantially all gaseous products which have entered the sniffer nozzle (1) with the exception of the probe gas which has been pressurized within the enclosure being tested, a pump system (8, 9) for creating vacuum conditions within the system, a mass spectrometer (12) for detecting the presence of the probe gas, and a capillary tube (2) interconnecting the nozzle sniffer (1) and the molecular sieve assembly whereby the probe gas draw rate, and sensitivity of the apparatus of the present invention, are significantly increased.
    • 公开了一种用于检测通过外壳的壁的非常细小的泄漏的存在的方法和装置,其包括向大气开放的嗅探喷嘴(1),在其中具有分子筛(4)的容器(5),用于吸收基本上所有的气体 已经进入嗅探喷嘴(1)的产品除了被测试的外壳内被加压的探针气体外,用于在系统内产生真空条件的泵系统(8,9),质谱仪(12),用于 检测探针气体的存在,以及将喷嘴嗅探器(1)和分子筛组件相互连接的毛细管(2),从而显着提高本发明装置的探针气体抽出速率和灵敏度。