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    • 5. 发明授权
    • Propagation measuring apparatus and a propagation measuring method
    • 传播测量装置和传播测量方法
    • US06873405B2
    • 2005-03-29
    • US10740999
    • 2003-12-19
    • Takashi KidoShoji Niki
    • Takashi KidoShoji Niki
    • G01N21/35G01N21/17G01N21/3581G01J1/00
    • G01N21/17G01N21/3581
    • A propagation measuring apparatus for measuring propagation characteristics of an object to be measured includes a first light source for outputting a first optical signal of a first frequency, a second light source for outputting a second optical signal of a second frequency, a terahertz light outputting unit for generating terahertz light of a frequency, which is equal to a difference between the first and second frequencies, by using the first and second optical signals and radiating the terahertz light to the object to be measured, a first detecting unit for detecting the terahertz light passing through the object to be measured and a measuring unit for measuring the propagation characteristics of the object to be measured based on the terahertz light detected by the first detecting unit.
    • 用于测量被测量物体的传播特性的传播测量装置包括用于输出第一频率的第一光信号的第一光源,用于输出第二频率的第二光信号的第二光源,太赫兹光输出单元 用于通过使用第一和第二光学信号并将太赫兹光照射到被测量物体来产生等于第一和第二频率之间的差的太赫兹光,用于检测太赫兹光的第一检测单元 通过被测量物体和测量单元,用于测量基于由第一检测单元检测到的太赫兹光的待测物体的传播特性。
    • 6. 发明授权
    • Program development support system
    • 程序开发支持系统
    • US5878262A
    • 1999-03-02
    • US790297
    • 1997-01-31
    • Tsutomu ShoumuraHiroshi SuganumaTsutomu FunadaSeiji OzawaTakeshi NiiTakashi KidoNaofumi MitsuhashiToshikazu Hirano
    • Tsutomu ShoumuraHiroshi SuganumaTsutomu FunadaSeiji OzawaTakeshi NiiTakashi KidoNaofumi MitsuhashiToshikazu Hirano
    • G06F9/06G06F9/44G06F13/00
    • G06F8/20G06Q10/0631Y10S707/99931Y10S707/99945Y10S707/99953
    • Disclosed is a program development support system so adapted as to integrally manage a variety of information necessary for the development of a program by creating necessary links between information such as source programs to be employed for the development of the program, program parts, tools, specifications, handling persons and so on, by managing such information as resource information and by retaining attribute information of the links. The program development support system has a store means for storing program development information on the development of a program; a create means for creating attribute information on an attribute of the program development information and link information between each of the program development information; a management means for managing the program development information, the attribute information created by the create means and the link information created thereby each as one resource for the development of the program by providing the resource with a unique number; and a system-structuring element creating means for creating a system-structuring element from the resource by using the link information.
    • 公开了一种程序开发支持系统,该系统适用于通过在诸如用于开发程序,程序部件,工具,规格的源程序之类的信息之间建立必要的链接,整体地管理开发程序所需的各种信息 ,处理人员等,通过管理资源信息等信息,并保留链接的属性信息。 程序开发支持系统具有用于存储关于程序开发的程序开发信息的存储装置; 创建用于创建关于所述程序开发信息的属性和每个所述程序开发信息之间的链接信息的属性信息的装置; 管理装置,用于通过向资源提供唯一的号码来管理程序开发信息,由创建装置创建的属性信息和由此创建的链接信息作为开发程序的一个资源; 以及用于通过使用所述链接信息从所述资源创建系统结构化元素的系统结构元素创建装置。
    • 8. 发明授权
    • Optical network analyzer
    • 光网络分析仪
    • US07079231B2
    • 2006-07-18
    • US11273693
    • 2005-11-14
    • Takashi KidoShoji Niki
    • Takashi KidoShoji Niki
    • G01N21/00
    • G01M11/338
    • An optical network analyzer for measuring an optical characteristic of an object to be measured, including: a first multiplexer for multiplexing a first optical signal which has transmitted the object to be measured, and a second optical signal having a frequency different from the first optical signal, and for outputting a third optical signal; a first photoelectrical converter for converting the third optical signal into a first electric signal; and a phase measurement block for comparing phases of the first electric signal and a first reference signal.
    • 一种用于测量待测物体的光学特性的光网络分析仪,包括:第一多路复用器,用于复用已发送被测物体的第一光信号和具有与第一光信号不同的频率的第二光信号 并且用于输出第三光信号; 第一光电转换器,用于将第三光信号转换成第一电信号; 以及用于比较第一电信号和第一参考信号的相位的相位测量块。
    • 9. 发明授权
    • Apparatus, method, and program for measuring optical characteristic using quantum interference, and recording medium for recording the program
    • 用于使用量子干涉测量光学特性的装置,方法和程序,以及用于记录该程序的记录介质
    • US07046366B2
    • 2006-05-16
    • US10643907
    • 2003-08-20
    • Takeshi OzekiTakashi Kido
    • Takeshi OzekiTakashi Kido
    • G01B9/02
    • G01M11/338G01M11/331
    • To enable measuring optical characteristics of a device under test by overcoming a limit of detection sensitivity caused by detecting light as “wave”. Of an entangled photon pair generated by entangled photon pair generating means 20, signal light transmits through a device under test (DUT) 10, and idler light transmits through a variable delay line 30. The signal light after transmitting through the device under test (DUT) 10, and the idler light after transmitting through the variable delay line 30 are supplied for a semi-transparent mirror 40 to generate quantum interference. Then, if the timing when photon of the first multiplexed light is detected by a first photon detector 50a, and the timing when photon of the second multiplexed light is detected by a second photon detector 50b match, a multiplier 62 supplies a pulse, and a counter 64 counts the pulse. Based on the count, characteristic measuring means 70 obtains match detection probability, thereby measuring optical parameters of the device under test. Since the measurement uses the quantum interference, it is possible to measure the optical characteristics of the device under test at a high accuracy, and in a wide dynamic range.
    • 通过克服由“检测”光引起的检测灵敏度极限,能够测试被测器件的光学特性。 在由纠缠的光子对产生装置20产生的纠缠的光子对中,信号光通过被测器件(DUT)10传输,并且惰轮通过可变延迟线30传输。 通过被测器件(DUT)10发送后的信号光以及通过可变延迟线30发送后的空载光被提供给半透明反射镜40以产生量子干涉。 然后,如果由第一光子检测器50a检测到第一多路复用光的光子的定时,并且通过第二光子检测器50b检测到第二多路复用光的光子的定时匹配,则乘法器62将脉冲, 并且计数器64对脉冲进行计数。 基于该计数,特性测量装置70获得匹配检测概率,由此测量被测设备的光学参数。 由于测量使用量子干涉,因此可以以高精度和宽动态范围测量被测器件的光学特性。