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    • 1. 发明授权
    • Radiation detection apparatus and radiation imaging system
    • 辐射检测仪和放射成像系统
    • US08653463B2
    • 2014-02-18
    • US13110132
    • 2011-05-18
    • Satoru SawadaMasato InoueNoriaki OguriShinichi TakedaMasayoshi AkiyamaTaiki Takei
    • Satoru SawadaMasato InoueNoriaki OguriShinichi TakedaMasayoshi AkiyamaTaiki Takei
    • G01T1/20H01L27/00
    • A61B6/4208A61B6/563G01T1/2018H01L27/14663H01L31/0203H01L31/115
    • A radiation detection apparatus comprising semiconductor substrates each having a first surface on which a photoelectric conversion portion is formed and a second surface opposite to the first surface; a scintillator layer, placed over the first surfaces of the semiconductor substrates, for converting radiation into light; and an elastic member, placed between a base and the second surfaces, for supporting the second surfaces of the semiconductor substrates such that the first surfaces of the semiconductor substrates are flush with each other is provided. In measurement of the elastic member as a single body, an amount of stretch of a cubic specimen in a direction parallel to the first surface when being compressed in a direction perpendicular to the first surface is smaller than an amount of stretch of the specimen in the direction perpendicular to the first surface when being compressed in the direction parallel to the first surface.
    • 一种辐射检测装置,包括各自具有形成有光电转换部的第一表面和与该第一表面相对的第二表面的半导体衬底; 闪烁体层,放置在半导体衬底的第一表面上,用于将辐射转换成光; 以及放置在基座和第二表面之间的弹性构件,用于支撑半导体衬底的第二表面,使得半导体衬底的第一表面彼此齐平。 在作为单体的弹性构件的测量中,当在与第一表面垂直的方向上被压缩时,在与第一表面平行的方向上的立方体样本的拉伸量小于在第一表面垂直的方向上的样本的拉伸量 当在平行于第一表面的方向上被压缩时垂直于第一表面的方向。