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    • 6. 发明公开
    • Method and apparatus for accelerating flying bodies
    • Verfahren und Vorrichtung zur Beschleunigung vonFlugkörpern。
    • EP0666463A1
    • 1995-08-09
    • EP95100691.5
    • 1995-01-19
    • Tanaka, KoichiMORITA AND COMPANY CO., LTD.
    • Tanaka, Koichi
    • F41B6/00
    • F41B6/00
    • Disclosed is a method and an apparatus for accelerating and shooting a flying body at superhigh speed, consisting of a capacitor (24) in which a high-pressure electric charge can be stored; a primary coil (20) connected to the capacitor (24) via a switching means (22); a conductive cylindrical liner (26) disposed in the primary coil (20); an opening (28) defined on a cylindrical wall of the cylindrical liner (26); and a flying body (30) interposed in the opening (28) and assuming electrical continuity with the liner (26); wherein a high-pressure electric charge stored in the capacitor (24) is momentarily applied to the primary coil (20) so as to compress abruptly the cylindrical liner (26) radially inward and to shoot the flying body (30) interposed in the opening (28) toward the axis of the liner (26).
    • 公开了一种用于以超高速度加速和拍摄飞行体的方法和装置,包括可以存储高压电荷的电容器(24); 经由开关装置(22)连接到电容器(24)的初级线圈(20); 设置在初级线圈(20)中的导电圆柱形衬套(26); 限定在所述圆柱形衬套(26)的圆柱形壁上的开口(28); 以及插入在所述开口(28)中并假设与所述衬套(26)电连通的飞行体(30)。 其中存储在所述电容器(24)中的高压电荷被暂时地施加到所述初级线圈(20),以便径向向内压缩所述圆柱形衬套(26)并且将所述飞行体(30)插入所述开口 (28)朝向衬套(26)的轴线。
    • 7. 发明申请
    • STEREOSCOPIC IMAGE PROCESSING DEVICE, METHOD, RECORDING MEDIUM AND STEREOSCOPIC IMAGING APPARATUS
    • 立体图像处理装置,方法,记录介质和立体成像装置
    • WO2010061956A1
    • 2010-06-03
    • PCT/JP2009/070207
    • 2009-11-25
    • FUJIFILM CorporationTANAKA, Koichi
    • TANAKA, Koichi
    • G06T1/00H04N13/02
    • G06T7/33G06T2207/10012G06T2207/30196H04N13/10H04N13/243H04N13/246
    • An apparatus (10) includes a device for acquiring a plurality of images of an identical subject taken from a plurality of viewpoints; a device for selecting a prescribed image as a reference image, selecting an image other than the reference image as a target image from among the images, and detecting feature points from the reference image and corresponding points from the target image to generate pairs of the feature point and corresponding point, wherein feature of the feature point and the corresponding point in the same pair are substantially identical; a device for estimating geometrical transformation parameters for geometrically-transforming the target image such that y-coordinate values of the feature point and the corresponding point included in the same pair are substantially identical, wherein y-direction is orthogonal to a parallax direction of the viewpoints; and a device for geometrically-transforming the target image based on the parameters.
    • 一种装置(10)包括从多个视点获取相同对象的多个图像的装置; 用于选择规定图像作为参考图像的装置,从图像中选择除了参考图像之外的图像作为目标图像,以及从参考图像和来自目标图像的对应点检测特征点,以生成特征对 点和对应点,其中特征点和相同对中的对应点的特征基本相同; 用于估计用于几何变换目标图像的几何变换参数的装置,使得包括在同一对中的特征点和对应点的y坐标值基本相同,其中y方向与视点的视差方向正交 ; 以及用于基于参数对目标图像进行几何变换的装置。
    • 9. 发明申请
    • METHOD AND APPARATUS FOR AUTOMATIC INSPECTION OF SEMICONDUCTOR DEVICE
    • 自动检测半导体器件的方法和装置
    • WO1996009556A1
    • 1996-03-28
    • PCT/JP1995001751
    • 1995-09-04
    • ADVANTEST CORPORATIONONISHI, TakeshiKAINUMA, TadashiKOJIMA, KatsumiBANNAI, KuniakiTANAKA, KoichiYAMADA, Naruhito
    • ADVANTEST CORPORATION
    • G01R31/26
    • G01R31/043G01R31/04G01R31/2893
    • An automatic inspection apparatus and method capable of automatically and efficiently inspecting contact characteristics of sockets of a test portion of a semiconductor tester disposed at a test portion of a conveyor, prior to testing semiconductor devices. A testing device, which has known electrical characteristics and the same shape as that of the semiconductor devices to be tested, is mounted on a test tray, and is conveyed from a loader to a test portion. Contact characteristics are then measured by connecting the testing device to a socket. After this measurement is completed, the testing device is transferred from the test tray to a customer tray in an unloader, is temporarily stored in a tray storage portion, is conveyed to the loader, is transferred from the customer tray to the test tray, and is again conveyed from the loader to the test portion. In this way, the contact characteristics of all the sockets at the test portion are automatically and repeatedly measured.
    • 在测试半导体器件之前,能够自动且有效地检查设置在输送机的测试部分的半导体测试器的测试部分的插座的接触特性的自动检查设备和方法。 具有已知的电特性和与要测试的半导体器件相同的形状的测试装置安装在测试托盘上,并从装载器传送到测试部分。 然后通过将测试设备连接到插座来测量接触特性。 测量完成后,将测试装置从卸载机转移到客户托盘中,临时存放在托盘存放部分中,传送到装载机,从客户托盘传送到测试托盘,以及 再次从装载器传送到测试部分。 以这种方式,自动重复地测量测试部分处的所有插座的接触特性。