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    • 1. 发明授权
    • Concentration measuring method and fluorescent X-ray spectrometer
    • 浓度测定法和荧光X射线光谱仪
    • US08582717B2
    • 2013-11-12
    • US12940223
    • 2010-11-05
    • Sumito Ohzawa
    • Sumito Ohzawa
    • G01N23/223G01T1/28G01J3/443
    • G01N23/223G01N2223/076
    • In the present invention, a fluorescent X-ray analysis is made for a sample such as a liquid fuel including an object component such as sulfur. A background related to scattered X-rays and a system peak is subtracted from a fluorescent X-ray intensity of the object component, which is obtained from a spectrum acquired by the fluorescent X-ray analysis. A correction corresponding to the composition of the sample is performed for the fluorescent X-ray intensity obtained by subtracting the background. A calibration curve representing the relation between a value, which is obtained after performing the correction for the fluorescent X-ray intensity obtained by subtracting the background, and a concentration of the object component is preset. The concentration of the object component in the sample is calculated on the basis of the calibration curve.
    • 在本发明中,对含有硫成分的液体燃料等样品进行荧光X射线分析。 从通过荧光X射线分析获得的光谱获得的目标成分的荧光X射线强度中减去与散射X射线和系统峰相关的背景。 对于通过减去背景获得的荧光X射线强度进行与样品组成相对应的校正。 表示在对通过减去背景获得的荧光X射线强度进行校正后获得的值与对象成分的浓度之间的关系的校准曲线。 基于校准曲线计算样品中的对象成分的浓度。
    • 3. 发明授权
    • X-ray analysis apparatus and method
    • X射线分析装置及方法
    • US06965663B2
    • 2005-11-15
    • US10396847
    • 2003-03-25
    • Sumito Ohzawa
    • Sumito Ohzawa
    • G01N23/223G21K1/02G21K1/06
    • G01N23/223G01N2223/076
    • This invention provides an X-ray analysis apparatus and method capable of simply and accurately determining the position of analysis in a sample from an optical image of it without lowering the sensitivity and/or the spatial resolution in light element analysis. The X-ray analysis apparatus of the present invention irradiates a sample with X-rays narrowed down by means of an X-ray guide member from above the sample in which said sample is directly irradiated with X-rays from said X-ray guide member and an optical image of said sample is obtained in the direction coaxial with said X-ray guide member.
    • 本发明提供一种X射线分析装置和方法,其能够简单且准确地确定来自其光学图像的样品中分析的位置,而不降低光元件分析中的灵敏度和/或空间分辨率。 本发明的X射线分析装置利用X射线引导部件从X射线引导部件的X射线直接照射样品的上方照射X射线X射线衍射的样品 并且在与所述X射线引导构件同轴的方向上获得所述样品的光学图像。
    • 4. 发明申请
    • CONCENTRATION MEASURING METHOD AND FLUORESCENT X-RAY SPECTROMETER
    • 浓度测量方法和荧光X射线光谱仪
    • US20110103547A1
    • 2011-05-05
    • US12940223
    • 2010-11-05
    • Sumito OHZAWA
    • Sumito OHZAWA
    • G01N23/223
    • G01N23/223G01N2223/076
    • In the present invention, a fluorescent X-ray analysis is made for a sample such as a liquid fuel including an object component such as sulfur. A background related to scattered X-rays and a system peak is subtracted from a fluorescent X-ray intensity of the object component, which is obtained from a spectrum acquired by the fluorescent X-ray analysis. A correction corresponding to the composition of the sample is performed for the fluorescent X-ray intensity obtained by subtracting the background. A calibration curve representing the relation between a value, which is obtained after performing the correction for the fluorescent X-ray intensity obtained by subtracting the background, and a concentration of the object component is preset. The concentration of the object component in the sample is calculated on the basis of the calibration curve.
    • 在本发明中,对含有硫成分的液体燃料等样品进行荧光X射线分析。 从通过荧光X射线分析获得的光谱获得的目标成分的荧光X射线强度中减去与散射X射线和系统峰相关的背景。 对于通过减去背景获得的荧光X射线强度进行与样品组成相对应的校正。 表示在对通过减去背景获得的荧光X射线强度进行校正后获得的值与对象成分的浓度之间的关系的校准曲线。 基于校准曲线计算样品中的对象成分的浓度。
    • 6. 发明授权
    • X-ray convergence element and X-ray irradiation device
    • X射线会聚元件和X射线照射装置
    • US08416921B2
    • 2013-04-09
    • US12280136
    • 2007-02-08
    • Hiromoto NakazawaHideki YoshikawaAurel-Mihai VlaicuKenichi OboriShintaro KomataniSumito Ohzawa
    • Hiromoto NakazawaHideki YoshikawaAurel-Mihai VlaicuKenichi OboriShintaro KomataniSumito Ohzawa
    • G21K1/06
    • G21K1/06G21K2201/064
    • An X-ray convergence element and an X-ray irradiation device including the X-ray convergence element are provided. The X-ray convergence element can extend a working distance from an exit-side opening end thereof to a specimen, and can perform analysis of the specimen with rough surface, a fluorescent X-ray analysis, and a X-ray diffraction analysis, regardless of a size of the specimen. An X-ray blocking member 23 is provided with three supporting members 233 for supporting the X-ray blocking member 23, which extend from an annular member 232 having approximately the same diameter as a diameter of an entrance-side opening end (outer diameter of a capillary 20) toward the center of the X-ray blocking member 23 to fix the annular member 232 to the capillary 20. The annular member 232, the supporting members 233, and the X-ray blocking member 23 are integrally formed of a metal that shields X-rays, such as tantalum, tungsten, or molybdenum. A dimension of the X-ray blocking member 23 in the axial direction (thickness) is set to be sufficient for blocking X-rays.
    • 提供了包括X射线会聚元件的X射线会聚元件和X射线照射装置。 X射线会聚元件可以将其出口侧开口端的工作距离延伸到试样,并且可以进行具有粗糙表面,荧光X射线分析和X射线衍射分析的样品的分析 的样本大小。 X射线阻挡构件23设置有用于支撑X射线阻挡构件23的三个支撑构件233,其从具有与入口侧开口端的直径大致相同直径的环形构件232延伸(外径 毛细管20)朝向X射线阻挡构件23的中心,以将环形构件232固定到毛细管20.环形构件232,支撑构件233和X射线阻挡构件23由金属 屏蔽X射线,如钽,钨或钼。 X射线阻挡构件23的轴向(厚度)的尺寸被设定为足以阻挡X射线。
    • 7. 发明申请
    • X-RAY CONVERGENCE ELEMENT AND X-RAY IRRADIATION DEVICE
    • X射线融合元件和X射线辐照器件
    • US20100226477A1
    • 2010-09-09
    • US12280136
    • 2007-02-08
    • Hiromoto NakazawaHideki YoshikawaAurel-Mihai VlaicuKenichi OboriShintaro KomataniSumito Ohzawa
    • Hiromoto NakazawaHideki YoshikawaAurel-Mihai VlaicuKenichi OboriShintaro KomataniSumito Ohzawa
    • G21K5/00G21K1/02
    • G21K1/06G21K2201/064
    • An X-ray convergence element and an X-ray irradiation device including the X-ray convergence element are provided. The X-ray convergence element can extend a working distance from an exit-side opening end thereof to a specimen, and can perform analysis of the specimen with rough surface, a fluorescent X-ray analysis, and a X-ray diffraction analysis, regardless of a size of the specimen. An X-ray blocking member 23 is provided with three supporting members 233 for supporting the X-ray blocking member 23, which extend from an annular member 232 having approximately the same diameter as a diameter of an entrance-side opening end (outer diameter of a capillary 20) toward the center of the X-ray blocking member 23 to fix the annular member 232 to the capillary 20. The annular member 232, the supporting members 233, and the X-ray blocking member 23 are integrally formed of a metal that shields X-rays, such as tantalum, tungsten, or molybdenum. A dimension of the X-ray blocking member 23 in the axial direction (thickness) is set to be sufficient for blocking X-rays.
    • 提供了包括X射线会聚元件的X射线会聚元件和X射线照射装置。 X射线会聚元件可以将其出口侧开口端的工作距离延伸到试样,并且可以进行具有粗糙表面,荧光X射线分析和X射线衍射分析的样品的分析 的样本大小。 X射线阻挡构件23设置有用于支撑X射线阻挡构件23的三个支撑构件233,其从具有与入口侧开口端的直径大致相同直径的环形构件232延伸(外径 毛细管20)朝向X射线阻挡构件23的中心,以将环形构件232固定到毛细管20.环形构件232,支撑构件233和X射线阻挡构件23由金属 屏蔽X射线,如钽,钨或钼。 X射线阻挡构件23的轴向(厚度)的尺寸被设定为足以阻挡X射线。