会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Sensor assemblies used to detect the proximity of a material to a microwave element
    • 用于检测材料与微波元件的接近度的传感器组件
    • US08674707B2
    • 2014-03-18
    • US13164835
    • 2011-06-21
    • Boris Leonid SheikmanSherrie Ann ClarkSusan Lee Roush
    • Boris Leonid SheikmanSherrie Ann ClarkSusan Lee Roush
    • G01R27/04G01R27/06
    • G01S13/04G01S13/08
    • Sensor assemblies used to detect the proximity of a material to a microwave element are disclosed. One example sensor assembly includes a signal generator configured to generate at least one microwave signal, a coupler connected to the signal generator, a microwave element coupled to the coupler, and a processing module connected to the coupler. The microwave element is configured to generate an electromagnetic field as a function of said at least one microwave signal. The microwave element is structured to reflect a loading signal to said coupler when a material interacts with the electromagnetic field. The processing module is configured to process the loading signal with a reference signal to generate a data signal representative of the proximity of the material to the microwave element. The data signal defines a sub-microwave frequency.
    • 公开了用于检测材料与微波元件的接近度的传感器组件。 一个示例传感器组件包括被配置为产生至少一个微波信号的信号发生器,连接到信号发生器的耦合器,耦合到耦合器的微波元件以及连接到耦合器的处理模块。 微波元件被配置为产生作为所述至少一个微波信号的函数的电磁场。 当材料与电磁场相互作用时,微波元件构造成将加载信号反映到所述耦合器。 处理模块被配置为用参考信号处理加载信号以产生表示材料与微波元件的接近度的数据信号。 数据信号定义了一个亚微波频率。
    • 8. 发明申请
    • SENSOR ASSEMBLIES USED TO DETECT THE PROXIMITY OF A MATERIAL TO A MICROWAVE ELEMENT
    • 用于将材料的接近度检测到微波元件的传感器组件
    • US20120326731A1
    • 2012-12-27
    • US13164835
    • 2011-06-21
    • Boris Leonid SheikmanSherrie Ann ClarkSusan Lee Roush
    • Boris Leonid SheikmanSherrie Ann ClarkSusan Lee Roush
    • G01R27/32
    • G01S13/04G01S13/08
    • Sensor assemblies used to detect the proximity of a material to a microwave element are disclosed. One example sensor assembly includes a signal generator configured to generate at least one microwave signal, a coupler connected to the signal generator, a microwave element coupled to the coupler, and a processing module connected to the coupler. The microwave element is configured to generate an electromagnetic field as a function of said at least one microwave signal. The microwave element is structured to reflect a loading signal to said coupler when a material interacts with the electromagnetic field. The processing module is configured to process the loading signal with a reference signal to generate a data signal representative of the proximity of the material to the microwave element. The data signal defines a sub-microwave frequency.
    • 公开了用于检测材料与微波元件的接近度的传感器组件。 一个示例传感器组件包括被配置为产生至少一个微波信号的信号发生器,连接到信号发生器的耦合器,耦合到耦合器的微波元件以及连接到耦合器的处理模块。 微波元件被配置为产生作为所述至少一个微波信号的函数的电磁场。 当材料与电磁场相互作用时,微波元件构造成将加载信号反映到所述耦合器。 处理模块被配置为用参考信号处理加载信号以产生表示材料与微波元件的接近度的数据信号。 数据信号定义了一个亚微波频率。