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1. 发明授权

US09484273B2 Apparatus for measuring impurities on wafer and method of measuring impurities on wafer 有权
标题翻译：用于测量晶片上的杂质的装置和测量晶片上的杂质的方法
公开(公告)号：US09484273B2
公开(公告)日：2016-11-01
申请号：US13425677
申请日：2012-03-21
申请人： Seung Wook Lee
发明人： Seung Wook Lee
IPC分类号： H01L21/66 , H01L21/67 , G01N1/32 , G01N35/00 , G01N1/38 , G01N1/40
CPC分类号： H01L21/67288 , G01N1/32 , G01N1/34 , G01N1/4044 , G01N35/0099 , G01N2001/383 , H01J49/0036 , H01L21/67 , H01L21/67051 , H01L21/6708 , H01L22/12
摘要： Provided are an apparatus for measuring impurities on a wafer and a method of measuring impurities on a wafer. The apparatus includes: a wafer aligning device for aligning a wafer; a loading robot for moving and loading the aligned wafer; a rotation stage for rotating the loaded wafer; a scan robot for holding a natural oxide layer etching solution for the wafer and a metallic impurity recovery solution; and a container for receiving a predetermined etching solution and a recovery solution, wherein the scan robot removes an oxide layer on an edge region of the wafer.
摘要翻译：提供了一种用于测量晶片上的杂质的装置和测量晶片上的杂质的方法。该装置包括：用于对准晶片的晶片对准装置; 用于移动和加载对准的晶片的装载机器人; 用于旋转加载的晶片的旋转台; 用于保持用于晶片的天然氧化物层蚀刻溶液的扫描机器人和金属杂质回收溶液; 以及用于接收预定蚀刻溶液和回收溶液的容器，其中所述扫描机器人去除所述晶片的边缘区域上的氧化物层。

2. 发明授权

US08229028B2 Apparatus for measuring IQ imbalance 有权
标题翻译： IQ不平衡测量装置
公开(公告)号：US08229028B2
公开(公告)日：2012-07-24
申请号：US12034627
申请日：2008-02-20
申请人： Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
发明人： Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
IPC分类号： H04K1/02
CPC分类号： H04L27/3863 , H04L27/364
摘要： The present invention relates to an apparatus and a method for measuring an in phase and quadrature (IQ) imbalance. One embodiment according to the present general inventive concept can provide a method for measuring a Tx IQ imbalance generated in an IQ up-conversion mixer and an Rx IQ imbalance generated in an IQ down-conversion mixer, that includes measuring a first IQ imbalance corresponding to a first combination of the Rx IQ imbalance with the Tx IQ imbalance, measuring a second IQ imbalance corresponding to a second combination of the Rx IQ imbalance with the Tx IQ imbalance and obtaining the Tx IQ imbalance and the Rx IQ imbalance from the first IQ imbalance and the second IQ imbalance.
摘要翻译：本发明涉及用于测量同相和正交（IQ）不平衡的装置和方法。根据本发明总体构思的一个实施例可以提供一种用于测量在IQ上变频混频器中产生的Tx IQ不平衡和在IQ下变频混频器中产生的Rx IQ不平衡的方法，其包括测量对应于 Rx IQ不平衡与Tx IQ不平衡的第一组合，测量对应于Rx IQ不平衡与Tx IQ不平衡的第二组合的第二IQ不平衡，并且从第一IQ不平衡获得Tx IQ不平衡和Rx IQ不平衡和第二个智商不平衡。

3. 发明申请

US20120079498A1 METHOD AND APPARATUS FOR DYNAMIC RESOURCE ALLOCATION OF PROCESSING UNITS 有权
标题翻译：加工单位动态资源分配的方法与装置
公开(公告)号：US20120079498A1
公开(公告)日：2012-03-29
申请号：US13246323
申请日：2011-09-27
申请人： Kyoung Hoon Kim , In Choon Yeo , Seung Wook Lee , Joong Baik Kim , Il Ho Lee , Jeong Ig Song
发明人： Kyoung Hoon Kim , In Choon Yeo , Seung Wook Lee , Joong Baik Kim , Il Ho Lee , Jeong Ig Song
IPC分类号： G06F9/50
CPC分类号： G06F9/5066 , G06F2209/5017
摘要： A method and apparatus for dynamic resource allocation in a system having at least one processing unit are disclosed. The method of dynamic resource allocation includes receiving information on a task to which resources are allocated and partitioning the task into one or more task parallel units; converting the task into a task block having a polygonal shape according to expected execution times of the task parallel units and dependency between the task parallel units; allocating resources to the task block by placing the task block on a resource allocation plane having a horizontal axis of time and a vertical axis of processing units; and executing the task according to the resource allocation information. Hence, CPU resources and GPU resources in the system can be used in parallel at the same time, increasing overall system efficiency.
摘要翻译：公开了一种具有至少一个处理单元的系统中用于动态资源分配的方法和装置。动态资源分配方法包括接收资源被分配的任务的信息，并将该任务划分为一个或多个任务并行单元; 根据任务并行单元的预期执行时间和任务并行单元之间的依赖性将任务转换为具有多边形形状的任务块; 通过将任务块放置在具有水平时间轴和处理单元的垂直轴的资源分配平面上来将资源分配给任务块; 并根据资源分配信息执行该任务。因此，系统中的CPU资源和GPU资源可以同时并行使用，从而提高整体系统的效率。

4. 发明申请

US20120060168A1 VIRTUALIZATION SYSTEM AND RESOURCE ALLOCATION METHOD THEREOF 有权
标题翻译：虚拟化系统及资源分配方法
公开(公告)号：US20120060168A1
公开(公告)日：2012-03-08
申请号：US13225727
申请日：2011-09-06
申请人： Il Ho LEE , In Choon YEO , Joong Baik KIM , Seung Wook LEE , Kyoung Hoon KIM , Jeong Ig SONG
发明人： Il Ho LEE , In Choon YEO , Joong Baik KIM , Seung Wook LEE , Kyoung Hoon KIM , Jeong Ig SONG
IPC分类号： G06F9/50
CPC分类号： G06F9/45533 , G06F9/4887 , G06F9/5077 , Y02D10/22 , Y02D10/24 , Y02D10/26 , Y02D10/28 , Y02D10/36
摘要： A virtualization system for supporting at least two operating systems and resource allocation method of the virtualization system are provided. The method includes allocating resources to the operating systems, calculating, when one of the operating systems is running, workloads for each operating system, and adjusting resources allocated to the operating systems according to the calculated workloads. The present invention determines the workloads of a plurality of operating systems running in the virtualization system and allocates time resources dynamically according to the variation of the workloads.
摘要翻译：提供了用于支持虚拟化系统的至少两个操作系统和资源分配方法的虚拟化系统。该方法包括向操作系统分配资源，计算当其中一个操作系统正在运行时，针对每个操作系统的工作负载，以及根据所计算的工作负载调整分配给操作系统的资源。本发明确定在虚拟化系统中运行的多个操作系统的工作负荷，并且根据工作负载的变化动态分配时间资源。

5. 发明申请

US20120060007A1 TRAFFIC CONTROL METHOD AND APPARATUS OF MULTIPROCESSOR SYSTEM 有权
标题翻译：多处理器系统的交通控制方法和装置
公开(公告)号：US20120060007A1
公开(公告)日：2012-03-08
申请号：US13224668
申请日：2011-09-02
申请人： Min Seung BAIK , Joong Baik KIM , Seung Wook LEE , Soon Wan KWON
发明人： Min Seung BAIK , Joong Baik KIM , Seung Wook LEE , Soon Wan KWON
IPC分类号： G06F15/76 , G06F12/14 , G06F9/06
CPC分类号： G06F15/17325
摘要： A method and apparatus for controlling traffic of multiprocessor system or multi-core system is provided. The traffic control apparatus of a multiprocessor system according to the present invention includes a request handler for processing a traffic request of a first processor, and a Quality of Service (QoS) manager for receiving a QoS guaranty start instruction for a second processor from the multiprocessor system, and for transmitting, when traffic of the second processor is detected, a traffic adjustment signal to the request handler. The request handler adjusts the traffic of the first processor according to the received traffic adjustment signal. The traffic control method and apparatus of the present invention is capable of adjusting the required bandwidths of individual technologies and guaranteeing the real-timeness in the multiprocessor system or multi-core system.
摘要翻译：提供了一种用于控制多处理器系统或多核系统的流量的方法和装置。根据本发明的多处理器系统的流量控制装置包括用于处理第一处理器的业务请求的请求处理器和用于从多处理器接收第二处理器的QoS保证开始指令的服务质量（QoS）管理器系统，并且当检测到第二处理器的业务时，发送到请求处理器的业务调整信号。请求处理器根据接收到的流量调整信号调整第一处理器的流量。本发明的交通控制方法和装置能够调整各种技术所需的带宽，并保证多处理器系统或多核系统的实时性。

6. 发明授权

US08018990B2 Apparatus for measuring in-phase and quadrature (IQ) imbalance 有权
标题翻译：用于测量同相和正交（IQ）不平衡的装置
公开(公告)号：US08018990B2
公开(公告)日：2011-09-13
申请号：US12027742
申请日：2008-02-07
申请人： Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
发明人： Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
IPC分类号： H04B3/46
CPC分类号： H04L27/364 , H04L27/3863
摘要： The present general inventive concept relates to apparatuses and/or methods for measuring an in-phase and quadrature (IQ) imbalance. In one embodiment, a detector can measure an error caused by an IQ imbalance using a first IQ signal including a desired signal and a corresponding image signal by the IQ imbalance. The detector can include a derotator to derotate the first IQ signal by a first angular frequency to obtain a second IQ signal and derotate the first IQ signal by a second angular frequency to obtain a third IQ signal, a DC estimator to obtain a fourth IQ signal corresponding to a DC component of the second IQ signal and a fifth IQ signal corresponding to a DC component of the third IQ signal and a controller can determine a gain error or a phase error from the fourth IQ signal and the fifth IQ signal.
摘要翻译：本总体发明构思涉及用于测量同相和正交（IQ）不平衡的装置和/或方法。在一个实施例中，检测器可以通过IQ不平衡来使用包括期望信号和对应图像信号的第一IQ信号来测量由IQ不平衡引起的误差。检测器可以包括解旋器，以将第一IQ信号扭转第一角度频率以获得第二IQ信号并且将第一IQ信号解旋第二角频率以获得第三IQ信号，DC估计器以获得第四IQ信号对应于第二IQ信号的DC分量和对应于第三IQ信号的DC分量的第五IQ信号，并且控制器可以从第四IQ信号和第五IQ信号确定增益误差或相位误差。

7. 发明申请

US20110149074A1 PORTABLE MULTI-VIEW IMAGE ACQUISITION SYSTEM AND MULTI-VIEW IMAGE PREPROCESSING METHOD 审中-公开
标题翻译：便携式多视图图像采集系统和多视图图像预处理方法
公开(公告)号：US20110149074A1
公开(公告)日：2011-06-23
申请号：US12971727
申请日：2010-12-17
申请人： Seung Wook LEE , Ho Won KIM , Chang Woo CHU , Bon Ki KOO
发明人： Seung Wook LEE , Ho Won KIM , Chang Woo CHU , Bon Ki KOO
IPC分类号： H04N7/18
CPC分类号： H04N7/181
摘要： Provided are a portable multi-view image acquisition system and a multi-view image preprocessing method. The portable multi-view image acquisition system may include: a portable studio including a plurality of cameras movable up, down, left and right; and a preprocessor performing a preprocessing including a subject separation from a multi-view image that is photographed by the plurality of cameras.
摘要翻译：提供了便携式多视图图像采集系统和多视图图像预处理方法。便携式多视点图像采集系统可以包括：便携式演播室，包括可上下移动，左右移动的多个相机; 以及预处理器，其执行包括由多个摄像机拍摄的多视点图像的对象分离的预处理。

8. 发明授权

US07920977B2 Noncontact measurement method of currents on superconductive wires connected in parallel 有权
标题翻译：并联连接的超导线上的电流非接触式测量方法
公开(公告)号：US07920977B2
公开(公告)日：2011-04-05
申请号：US12043802
申请日：2008-03-06
申请人： Kyeong Dal Choi , Ji Kwang Lee , Seung Wook Lee , Chan Park , Woo Seok Kim
发明人： Kyeong Dal Choi , Ji Kwang Lee , Seung Wook Lee , Chan Park , Woo Seok Kim
IPC分类号： G01R19/00 , H01L39/24 , G01R27/00
CPC分类号： G01R15/202 , G01R19/0092
摘要： A noncontact method for measuring currents flowing through superconductive wires connected in parallel is provided. The method includes arranging hall sensors for measuring voltage levels based on magnetic fields generated around the superconductive wires, setting a matrix relation between the measured voltage values, values of currents flowing through the superconductive wires, and a variable matrix having variables defining relations between the voltage values and the current values, applying predetermined current levels to the superconductive wires a number of times and measuring voltage values through the hall sensors, substituting the predetermined current values and the measured voltage values into the matrix relation to calculate the variables of the variable matrix, and substituting the calculated variable matrix and unknown voltage values, measured by the hall sensors when unknown currents flow through the superconductive wires, into the matrix relation to calculate values of the unknown currents flowing through the superconductive wires.
摘要翻译：提供了用于测量流过并联连接的超导线的电流的非接触方法。该方法包括：布置霍尔传感器，用于基于在超导线周围产生的磁场测量电压电平，设定测得的电压值之间的矩阵关系，流过超导导线的电流值，以及具有变量的可变矩阵，该变量定义了电压值和电流值，将预定电流电平施加到超导线数次，并通过霍尔传感器测量电压值，将预定电流值和测量电压值代入矩阵关系中，以计算可变矩阵的变量，并且将未知电流通过超导线流过霍尔传感器测量的计算的可变矩阵和未知电压值代入矩阵关系，以计算流过超导线的未知电流的值。

9. 发明授权

US07901132B2 Method of identifying crystal defect region in monocrystalline silicon using metal contamination and heat treatment 有权
标题翻译：使用金属污染和热处理识别单晶硅中的晶体缺陷区域的方法
公开(公告)号：US07901132B2
公开(公告)日：2011-03-08
申请号：US11858313
申请日：2007-09-20
申请人： Sang-Wook Wee , Seung-Wook Lee , Ki-Man Bae , Kwang-Salk Kim
发明人： Sang-Wook Wee , Seung-Wook Lee , Ki-Man Bae , Kwang-Salk Kim
IPC分类号： G01N25/72
CPC分类号： G01N21/9501 , H01L22/24
摘要： Provided is a method of identifying crystal defect regions of monocrystalline silicon using metal contamination and heat treatment. In the method, a sample in the shape of a silicon wafer or a slice of monocrystalline silicon ingot is prepared. At least one side of the sample is contaminated with metal at a contamination concentration of about 1×1014 to 5×1016 atoms/cm2. The contaminated sample is heat-treated. The contaminated side or the opposite side of the heat-treated sample is observed to identify a crystal defect region. The crystal defect region can be analyzed accurately, easily and quickly without the use of an additional check device, without depending on the concentration of oxygen in the monocrystalline silicon.
摘要翻译：提供了使用金属污染和热处理来识别单晶硅的晶体缺陷区域的方法。在该方法中，制备硅晶片或单晶硅锭切片形状的样品。样品的至少一侧被污染浓度为1×1014至5×1016原子/ cm2的金属污染。污染的样品经过热处理。观察热处理样品的污染侧或相反侧以识别晶体缺陷区域。晶体缺陷区域可以在不依赖于单晶硅中的氧浓度的情况下，而不需要额外的检查装置，可以准确，容易和快速地分析。

10. 发明申请

US20090141021A1 METHOD AND SYSTEM FOR PROVIDING EXPERIENTIAL KNOWLEDGE ASSOCIATED WITH SPATIAL AND TEMPORAL INFORMATION 审中-公开
标题翻译：提供与空间和时间信息相关的经验知识的方法和系统
公开(公告)号：US20090141021A1
公开(公告)日：2009-06-04
申请号：US12275760
申请日：2008-11-21
申请人： Manjai LEE , Seung Wook Lee , Bon Ki Koo , Kwang Ho Yang , Ji Hyung Lee , Heung-Nam Kim
发明人： Manjai LEE , Seung Wook Lee , Bon Ki Koo , Kwang Ho Yang , Ji Hyung Lee , Heung-Nam Kim
IPC分类号： G06T15/00
CPC分类号： G06T19/00 , G09B29/001 , H04L67/38
摘要： A method for providing knowledge includes creating a three-dimensional virtual space, generating temporal and spatial information including knowledge and space information concerning the three-dimensional virtual space at a specific time point, and associating the temporal and spatial information with the three-dimensional virtual space to be stored in a memory. The creating the three-dimensional virtual space may be created based on a map or a two-dimensional image.
摘要翻译：提供知识的方法包括创建三维虚拟空间，在特定时间点产生包括与三维虚拟空间有关的知识和空间信息的时间和空间信息，以及将时间和空间信息与三维虚拟空间相关联要存储在存储器中的空间。可以基于地图或二维图像来创建三维虚拟空间的创建。

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