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1. 发明授权

US09310337B2 Non-destructive inspection device for pressure containers using leakage-flux measurement 有权
标题翻译：使用漏磁测量的压力容器无损检测装置
公开(公告)号：US09310337B2
公开(公告)日：2016-04-12
申请号：US13977978
申请日：2012-01-05
申请人： Kwon Sang Ryu , Soo Young Park , Yun-Hee Lee , Seung Hoon Nahm , Un Bong Baek
发明人： Kwon Sang Ryu , Soo Young Park , Yun-Hee Lee , Seung Hoon Nahm , Un Bong Baek
IPC分类号： G01N29/14 , G01N29/28 , G01N27/82
CPC分类号： G01N27/82
摘要： Provided is a non-destructive inspection device for pressure containers using leakage-flux measurement, including: a coil winding mount disposed at one side on an outside of the pressure container to magnetize the pressure container; a sensor support provided with a plurality of magnetic field sensing sensors arranged at the other side on the outside of the pressure container; a yoke magnetizing the pressure container to generate a magnetic flux in a direction vertical to a direction of the magnetic flux generated by the coil winding mount; an endoscope attached with at least one magnetic field sensing sensor, and the like.
摘要翻译：本发明提供一种使用漏磁测量的压力容器的非破坏性检查装置，包括：设置在压力容器外侧的一侧的线圈绕组，用于使压力容器磁化; 传感器支撑件，其设置有设置在压力容器的外侧的另一侧的多个磁场感测传感器; 使所述压力容器磁化的磁轭，以在垂直于由所述线圈卷绕装置产生的磁通的方向的方向上产生磁通量; 附接有至少一个磁场感测传感器的内窥镜等。

2. 发明申请

US20140002068A1 NON-DESTRUCTIVE INSPECTION DEVICE FOR PRESSURE CONTAINERS USING LEAKAGE-FLUX MEASUREMENT 有权
标题翻译：使用泄漏测量的压力容器的非破坏性检查装置
公开(公告)号：US20140002068A1
公开(公告)日：2014-01-02
申请号：US13977978
申请日：2012-01-05
申请人： Kwon Sang Ryu , Soo Young Park , Yun-Hee Lee , Seung Hoon Nahm , Un Bong Baek
发明人： Kwon Sang Ryu , Soo Young Park , Yun-Hee Lee , Seung Hoon Nahm , Un Bong Baek
IPC分类号： G01N27/82
CPC分类号： G01N27/82
摘要： Provided is a non-destructive inspection device for pressure containers using leakage-flux measurement, including: a coil winding mount disposed at one side on an outside of the pressure container to magnetize the pressure container; a sensor support provided with a plurality of magnetic field sensing sensors arranged at the other side on the outside of the pressure container; a yoke magnetizing the pressure container to generate a magnetic flux in a direction vertical to a direction of the magnetic flux generated by the coil winding mount; an endoscope attached with at least one magnetic field sensing sensor, and the like.
摘要翻译：本发明提供一种使用漏磁测量的压力容器的非破坏性检查装置，包括：设置在压力容器外侧的一侧的线圈绕组，用于使压力容器磁化; 传感器支撑件，其设置有设置在压力容器的外侧的另一侧的多个磁场感测传感器; 使所述压力容器磁化的磁轭，以在垂直于由所述线圈卷绕装置产生的磁通的方向的方向上产生磁通量; 附接有至少一个磁场感测传感器的内窥镜等。

3. 发明申请

US20120227467A1 DEVICE FOR TESTING PRESSURE RESISTANCE OF VESSEL AND METHOD FOR TESTING PRESSURE RESISTANCE OF VESSEL BY USING THE DEVICE 审中-公开
标题翻译：用于测试船舶耐压力的装置和使用装置测试船舶耐压力的方法
公开(公告)号：US20120227467A1
公开(公告)日：2012-09-13
申请号：US13505010
申请日：2010-10-21
申请人： Un Bong Baek , Seung Hoon Nahm , Hae Moo Lee , Yun-Hee Lee
发明人： Un Bong Baek , Seung Hoon Nahm , Hae Moo Lee , Yun-Hee Lee
IPC分类号： G01M3/20
CPC分类号： G01N3/12
摘要： The present invention relates to a device for testing resist pressure of a vessel wherein gas is stored at a high compressed state, before the use of the vessel, and to a method for testing resist pressure of a vessel by using the testing device. The device includes: the vessel provided as an object to which a resist pressure test is carried out; an elastic tube placed in the interior of the vessel and adapted to fill a liquid into the interior thereof; a pressurizing means adapted to apply a predetermined pressure to the elastic tube to allow the elastic tube to be expanded; and a pressure gauge adapted to gauge the pressure in the interior of the vessel, wherein a gas is filled into the vessel to apply a predetermined pressure to the interior of the vessel by the expansion of the elastic tube.
摘要翻译：本发明涉及一种用于在使用容器之前以高压缩状态储存气体的容器的抗压力测试装置以及通过使用该测试装置测试容器的抗压力的方法。该装置包括：提供作为进行抗压力测试的物体的容器; 放置在容器内部并适于将液体填充到其内部的弹性管; 适于将预定压力施加到所述弹性管以允许所述弹性管膨胀的加压装置; 以及适于测量容器内部的压力的压力计，其中气体被填充到容器中，以通过弹性管的膨胀将预定的压力施加到容器的内部。

4. 发明申请

US20130167272A1 ELECTRICAL-MECHANICAL COMPLEX SENSOR FOR NANOMATERIALS 有权
标题翻译：机电复合传感器用于纳米材料
公开(公告)号：US20130167272A1
公开(公告)日：2013-06-27
申请号：US13821708
申请日：2011-01-10
申请人： Seung Hoon Nahm , Hoon Sik Jang , Sang Gu Jeon , Min Seok Kim
发明人： Seung Hoon Nahm , Hoon Sik Jang , Sang Gu Jeon , Min Seok Kim
IPC分类号： G01Q20/00 , B82Y15/00
CPC分类号： G01N3/08 , B82Y25/00 , G01L1/044 , G01L1/16 , G01N3/066 , G01N2203/0623 , G01R33/093 , G01R33/095
摘要： Disclosed is an electrical-mechanical complex sensor for nanomaterials, including: a detector having a piezoelectric film therein, for measuring a mechanical property of a nanomaterial when a bending or tensile load is applied to the nanomaterial; a first detection film formed at an end of the detector to measure the mechanical property and an electrical property of the nanomaterial) in real time at the same time, when the nanomaterial contacts the first detection film; and a support to which one end of the detector is integrally connected, for supporting the detector.
摘要翻译：公开了一种用于纳米材料的机电复合传感器，包括：其中具有压电膜的检测器，用于当对纳米材料施加弯曲或拉伸载荷时测量纳米材料的机械性能; 当纳米材料接触第一检测膜时，同时实时地形成在检测器的端部处的第一检测膜，以测量纳米材料的机械性能和电学性质）以及检测器的一端整体连接的支撑件，用于支撑检测器。

5. 发明申请

US20110175078A1 HYDROGEN PENETRATION BARRIER 有权
标题翻译：氢气穿透障碍物
公开(公告)号：US20110175078A1
公开(公告)日：2011-07-21
申请号：US13119308
申请日：2010-03-25
申请人： Yong Il Kim , In Jung Kim , Yun-Hee Lee , Kyoung Seok Lee , Seung Hoon Nahm
发明人： Yong Il Kim , In Jung Kim , Yun-Hee Lee , Kyoung Seok Lee , Seung Hoon Nahm
IPC分类号： H01L51/30 , H01L29/16
CPC分类号： C21D3/00 , C01B3/503 , C01B3/508
摘要： Provided is a hydrogen penetration barrier for preventing hydrogen from being diffused and discharged through a barrier and preventing hydrogen embrittlement of a material due to diffusion of hydrogen ions into a material. In detail, the hydrogen penetration barrier prevents penetration of hydrogen ions by using a built-in potential of a semiconductor layer doped with a p-type impurity and a semiconductor layer doped with an n-type impurity and a potential applied by a reverse biased voltage and includes an absorption layer absorbing the hydrogen molecules to primarily prevent the penetration of the hydrogen molecules and uses the absorption layer made of the conductive material as an application electrode of the reverse biased voltage and ionizes the hydrogen absorbed to the absorption layer to secondarily prevent the penetration of the hydrogen molecules and prevent the hydrogen embrittlement.
摘要翻译：提供了一种用于防止氢通过阻挡层扩散和排出的氢穿透阻挡层，并且防止由于氢离子扩散到材料中的材料的氢脆化。详细地说，氢穿透阻挡层通过使用掺杂有p型杂质的半导体层和掺杂有n型杂质的半导体层和通过反向偏置电压施加的电位的内置电位来防止氢离子渗透并且包括吸收氢分子以吸收氢分子的吸收层，并且使用由导电材料制成的吸收层作为反向偏置电压的施加电极，并将吸收到吸收层的氢电离并二次防止渗透氢分子并防止氢脆化。

6. 发明授权

US08481999B2 Hydrogen penetration barrier 有权
标题翻译：氢穿透屏障
公开(公告)号：US08481999B2
公开(公告)日：2013-07-09
申请号：US13119308
申请日：2009-09-15
申请人： Yong Il Kim , In Jung Kim , Yun-Hee Lee , Kyoung Seok Lee , Seung Hoon Nahm
发明人： Yong Il Kim , In Jung Kim , Yun-Hee Lee , Kyoung Seok Lee , Seung Hoon Nahm
IPC分类号： H01L51/00
CPC分类号： C21D3/00 , C01B3/503 , C01B3/508
摘要： Provided is a hydrogen penetration barrier for preventing hydrogen from being diffused and discharged through a barrier and preventing hydrogen embrittlement of a material due to diffusion of hydrogen ions into a material. In detail, the hydrogen penetration barrier prevents penetration of hydrogen ions by using a built-in potential of a semiconductor layer doped with a p-type impurity and a semiconductor layer doped with an n-type impurity and a potential applied by a reverse biased voltage and includes an absorption layer absorbing the hydrogen molecules to primarily prevent the penetration of the hydrogen molecules and uses the absorption layer made of the conductive material as an application electrode of the reverse biased voltage and ionizes the hydrogen absorbed to the absorption layer to secondarily prevent the penetration of the hydrogen molecules and prevent the hydrogen embrittlement.
摘要翻译：提供了一种用于防止氢通过阻挡层扩散和排出的氢穿透阻挡层，并且防止由于氢离子扩散到材料中的材料的氢脆化。详细地说，氢穿透阻挡层通过使用掺杂有p型杂质的半导体层和掺杂有n型杂质的半导体层和通过反向偏置电压施加的电位的内置电位来防止氢离子渗透并且包括吸收氢分子以吸收氢分子的吸收层，并且使用由导电材料制成的吸收层作为反向偏置电压的施加电极，并将吸收到吸收层的氢电离并二次防止渗透氢分子并防止氢脆化。

7. 发明授权

US09128009B2 Measurement device for minimizing external magnetic disturbance 有权
标题翻译：用于最小化外部磁力扰动的测量装置
公开(公告)号：US09128009B2
公开(公告)日：2015-09-08
申请号：US13514881
申请日：2010-11-03
申请人： Kwon Sang Ryu , Soo Young Park , Seung Hoon Nahm , Young Il Kim
发明人： Kwon Sang Ryu , Soo Young Park , Seung Hoon Nahm , Young Il Kim
IPC分类号： G01D18/00 , G01N3/00
CPC分类号： G01N3/00 , G01N2203/0075 , G01N2203/0635
摘要： Provided is a ΔE measuring device minimizing external magnetic disturbance, more particularly, a ΔE measuring device measuring a change (ΔE) in elastic modulus under a magnetic field by removing a bias effect by the earth's magnetic field and a magnetic tool and device and using a magneto acoustic resonance method. With the ΔE measuring device, a space minimizing external magnetic disturbance using three-axis Helmholtz coils is provided and the ΔE measuring device having a plurality of coil structures is inserted into the space, thereby making it possible to minimize external magnetic field disturbance.
摘要翻译：提供了一种减少外部磁场干扰的测量装置，更具体地说，一种测量磁场下弹性模量变化（＆Dgr; E）的测量装置，通过去除地球磁场和磁场的偏置效应工具和设备，并使用磁共振方法。使用＆Dgr。E测量装置，提供了使用三轴亥姆霍兹线圈来最小化外部磁扰动的空间，并且具有多个线圈结构的＆Dgr.E测量装置插入到该空间中，从而可以使外部磁场最小化骚乱。

8. 发明授权

US08621661B2 Electrical-mechanical complex sensor for nanomaterials 有权
标题翻译：纳米材料机电复合传感器
公开(公告)号：US08621661B2
公开(公告)日：2013-12-31
申请号：US13821708
申请日：2011-01-10
申请人： Seung Hoon Nahm , Hoon Sik Jang , Sang Gu Jeon , Min Seok Kim
发明人： Seung Hoon Nahm , Hoon Sik Jang , Sang Gu Jeon , Min Seok Kim
IPC分类号： G01N3/08 , B81B7/02 , G01R31/00
CPC分类号： G01N3/08 , B82Y25/00 , G01L1/044 , G01L1/16 , G01N3/066 , G01N2203/0623 , G01R33/093 , G01R33/095
摘要： Disclosed is an electrical-mechanical complex sensor for nanomaterials, including: a detector having a piezoelectric film therein, for measuring a mechanical property of a nanomaterial when a bending or tensile load is applied to the nanomaterial; a first detection film formed at an end of the detector to measure the mechanical property and an electrical property of the nanomaterial) in real time at the same time, when the nanomaterial contacts the first detection film; and a support to which one end of the detector is integrally connected, for supporting the detector.
摘要翻译：公开了一种用于纳米材料的机电复合传感器，包括：其中具有压电膜的检测器，用于当对纳米材料施加弯曲或拉伸载荷时测量纳米材料的机械性能; 当纳米材料接触第一检测膜时，同时实时地形成在检测器的端部处的第一检测膜，以测量纳米材料的机械性能和电学性质）以及检测器的一端整体连接的支撑件，用于支撑检测器。

9. 发明申请

US20120310581A1 MEASUREMENT DEVICE FOR MINIMIZING EXTERNAL MAGNETIC DISTURBANCE 有权
标题翻译：用于最小化外部磁性扰动的测量装置
公开(公告)号：US20120310581A1
公开(公告)日：2012-12-06
申请号：US13514881
申请日：2010-11-03
申请人： Kwon Sang Ryu , Soo Young Park , Seung Hoon Nahm , Young Il Kim
发明人： Kwon Sang Ryu , Soo Young Park , Seung Hoon Nahm , Young Il Kim
IPC分类号： G06F19/00
CPC分类号： G01N3/00 , G01N2203/0075 , G01N2203/0635
摘要： Provided is a ΔE measuring device minimizing external magnetic disturbance, more particularly, a ΔE measuring device measuring a change (ΔE) in elastic modulus under a magnetic field by removing a bias effect by the earth's magnetic field and a magnetic tool and device and using a magneto acoustic resonance method. With the ΔE measuring device, a space minimizing external magnetic disturbance using three-axis Helmholtz coils is provided and the ΔE measuring device having a plurality of coil structures is inserted into the space, thereby making it possible to minimize external magnetic field disturbance.
摘要翻译：提供了一种减少外部磁场干扰的测量装置，更具体地说，一种测量磁场下弹性模量变化（＆Dgr; E）的测量装置，通过去除地球磁场和磁场的偏置效应工具和设备，并使用磁共振方法。使用＆Dgr。E测量装置，提供了使用三轴亥姆霍兹线圈来最小化外部磁扰动的空间，并且具有多个线圈结构的＆Dgr.E测量装置插入到该空间中，从而可以使外部磁场最小化骚乱。

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